JPS5910364A - Rotary coating device - Google Patents

Rotary coating device

Info

Publication number
JPS5910364A
JPS5910364A JP11943982A JP11943982A JPS5910364A JP S5910364 A JPS5910364 A JP S5910364A JP 11943982 A JP11943982 A JP 11943982A JP 11943982 A JP11943982 A JP 11943982A JP S5910364 A JPS5910364 A JP S5910364A
Authority
JP
Japan
Prior art keywords
nozzle
processing liquid
valve
vessel
liquid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11943982A
Other languages
Japanese (ja)
Inventor
Yoshihiko Hirai
義彦 平井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP11943982A priority Critical patent/JPS5910364A/en
Publication of JPS5910364A publication Critical patent/JPS5910364A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To enable uniform and clean dropping, by controlling the treatment liquid which drops by gravity from a vessel by means of a valve. CONSTITUTION:A vessel 21 is made directly connectable to the inlet of a valve 22, and has the construction to enable the simple attaching and detaching to and from the valve 22. The vessel 21 is formed to a tray shape having a large bottom area in order to decrease the change in the dropping pressure that arises with a change in the level of treatment liquid 20. Said vessel is manufactured of a hydrophobic material in order to prevent sticking and solidifying of the liquid 20 on the inside wall thereof. The valve 22 blocks the treatment liquid trying to flow out from the vessel 21 and prevents the leakage of the treatment liquid from a nozzle 23. The opening and closing of the valve 22 are controlled by an electric signal, pneumatic pressure or the like, and the flows of the control liquid is controlled by the closing or opening time. A nozzle 24 is made of a hydrophobic material like the vessel 21, and the inside diameter d1 in the forward end part thereof is made small to increase the wall thickness so that liquid drops do not spread on the outside wall surface of the nozzle.

Description

【発明の詳細な説明】 本発明は、半導体の製造とくに不純物拡散剤及び保護膜
形成剤等の処理液を回転塗布する為の処理液滴下装置を
もつ回転塗布装置に関するもので2ページ ある。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a spin coating apparatus having a processing liquid dropping device for manufacturing semiconductors, particularly for spin coating processing liquids such as impurity diffusing agents and protective film forming agents, and has two pages.

半導体の製造において、不純物拡散剤として用いられる
シリカフィルム等の処理液を回転塗布する装置において
、上記処理液を回転塗布する装置の従来の例を第1図に
示す。第1図に示す様に、従来の方法では処理液1は処
理液を入れる容器2からポンプ3で吸入され、弁4を通
ってノズル5から押し出されて塗布物6aに滴下される
。塗布物6aは回転装置6bに装着されて、滴下された
処理液が回転塗布される。容器1からノズル5に至る処
理液の経路はパイプ7で接続されている。
2. Description of the Related Art FIG. 1 shows a conventional example of an apparatus for spin-coating a processing liquid such as a silica film used as an impurity diffusing agent in the manufacture of semiconductors. As shown in FIG. 1, in the conventional method, a treatment liquid 1 is sucked in by a pump 3 from a container 2 containing the treatment liquid, passed through a valve 4, forced out from a nozzle 5, and dripped onto an object to be coated 6a. The coating material 6a is mounted on a rotating device 6b, and the dropped treatment liquid is applied by rotation. The processing liquid path from the container 1 to the nozzle 5 is connected by a pipe 7.

従来の装置では、第1図に示すポンプ3や弁4、パイプ
7の中に多量の処理液が残留する。したがって処理液1
が常温中では不安定で常に新鮮な状態で塗布しなければ
ならない場合には、装置の使用毎に上記ポンプ3、弁4
、パイプ7を有機溶剤を用いて洗浄し、装置の使用前に
は新しい処理液で上記有機溶剤を置換しなければいけな
い欠点がある。又処理液1の種類を変えたい場合も同様
に装置全体を洗浄する必要があり、多量の処理液が3べ
−Sノ が洗浄及び置換のために使用される欠点がある。
In the conventional apparatus, a large amount of processing liquid remains in the pump 3, valve 4, and pipe 7 shown in FIG. Therefore, processing liquid 1
If the liquid is unstable at room temperature and must be applied fresh, the pump 3 and valve 4 mentioned above should be replaced each time the device is used.
However, there is a drawback that the pipe 7 must be cleaned using an organic solvent and the organic solvent must be replaced with a new treatment liquid before using the apparatus. Furthermore, when it is desired to change the type of processing liquid 1, it is necessary to similarly clean the entire apparatus, and there is a disadvantage that a large amount of processing liquid is used for cleaning and replacement.

又従来の装置では処理液は、ポンプ3からの押し出し圧
扁やノズル6の形状によって、ノズル6から漏出する場
合がある。処理液の漏出を防止する為に、処理液を滴下
直後に処理液を小量′吸引する吸引機構がポンプ3や7
r4に設けられている。
Further, in the conventional apparatus, the processing liquid may leak out from the nozzle 6 depending on the extrusion from the pump 3 or the shape of the nozzle 6. In order to prevent leakage of the processing liquid, pumps 3 and 7 are equipped with a suction mechanism that sucks a small amount of the processing liquid immediately after dropping the processing liquid.
It is provided in r4.

第2図1d、−,1一記吸引機構がない場合にノズル5
から処理液が漏出する様子を示したノズル部分の断面図
である。処理液1はノズル5中に留まらずにノズルの先
端部8に漏出したり、処理液の滴9となって落下する。
Fig. 2 1d, -, 1 Nozzle 5 when there is no suction mechanism
FIG. 3 is a cross-sectional view of the nozzle portion showing how the processing liquid leaks from the nozzle. The processing liquid 1 does not remain in the nozzle 5 but leaks to the tip 8 of the nozzle or falls as droplets 9 of the processing liquid.

第3図は、上記吸引機構を伺けた場合の従来の装置のノ
ズル部分の様子の断面図である。上記吸引機構によって
処理液1を滴下直後にノズルδ中に吸引すると同時にノ
ズル6中に気泡10を作る。
FIG. 3 is a sectional view of the nozzle portion of the conventional device when the above-mentioned suction mechanism can be seen. The above-mentioned suction mechanism sucks the processing liquid 1 into the nozzle δ immediately after dropping, and at the same time creates bubbles 10 in the nozzle 6.

気泡10の存在によって、処理液が滴下される場合、処
理液が霧状に飛散して滴下され、塗布面に一様に滴下さ
れず、回転塗布後に極部的な処理液の膜の乱れを生じる
。又、ノズルの形状が第3図に示す様に先端で鋭くなっ
ている場合には、処理液がノズル先端の外壁にまわり込
む。処理液が有機溶剤を溶媒とする場合には、空気中で
溶剤が蒸発し処理液が凝固してノズル先端部で処理液の
凝固物11が付着する。上記凝固物が処理液と共に塗布
面に落下し、塗布面に広範囲に渡る乱れを生じさせる原
因となる。
Due to the presence of air bubbles 10, when the processing liquid is dropped, the processing liquid is scattered in the form of a mist and is not uniformly dropped on the coated surface, resulting in local disturbance of the processing liquid film after spin coating. arise. Further, if the shape of the nozzle is sharp at the tip as shown in FIG. 3, the processing liquid wraps around the outer wall of the nozzle tip. When the processing liquid uses an organic solvent as a solvent, the solvent evaporates in the air, the processing liquid solidifies, and a coagulated product 11 of the processing liquid adheres at the tip of the nozzle. The coagulated material falls onto the coating surface together with the processing liquid, causing extensive disturbances on the coating surface.

第4図に、上記気泡1oが出来た場合に処理液て塗布物
6aに滴下される様子を示す。塗布物には極部的に塗布
膜12ができることになる。
FIG. 4 shows how the treatment liquid is dropped onto the coating material 6a when the bubbles 1o are formed. A coating film 12 is formed on the coated material in very localized areas.

第5図に上記凝固物11による塗布物の回転塗布後の塗
布面の様子を示す0第5図ムに上面図を第5図Bに断面
図を示す。処理液を滴下後、塗布物を高速回転させる事
によって滴下によって作られた塗布膜が塗布面上に均一
に広がりごく薄い皮膜13を作ろうとするが、上記凝固
物11の存在によって回転塗布後に放射状に膜の乱れ1
4が生じる欠点がある。
FIG. 5 shows the state of the coated surface after spin coating of the coagulated material 11. FIG. 5M shows a top view, and FIG. 5B shows a sectional view. After dropping the treatment liquid, the coated material is rotated at high speed so that the coating film created by the dropping spreads uniformly over the coated surface to form a very thin film 13, but due to the presence of the coagulated material 11, the coated material is rotated radially after the spin coating. Membrane disturbance 1
There is a drawback that 4 occurs.

本発明は、以上の様な従来の回転塗布における処理液の
滴下方法の欠点を除き、特に粘度が低く常温で不安定な
処理液を、ノズルの形状及び材質5ページ を考慮してノズルからの自然落下を利用して均一で清浄
な滴下を可能とし、あわせて装置の洗浄の容易化をはか
る事を可能とするものである。
The present invention eliminates the above-mentioned drawbacks of the conventional method of dropping a processing liquid in spin coating, and removes the processing liquid from the nozzle by taking into account the shape and material of the nozzle (page 5). This allows for uniform and clean dripping by utilizing natural fall, and also makes it easier to clean the device.

本発明の処理液滴下装置は、容器から自然落下する処理
液を弁によって制御し、ノズルから滴下する構造をもつ
。ノズルの形状は処理液が漏出しない様に処理液の粘度
、ノズルとの鼻面張力とで定まる大きさとし、ノズルの
先端を細めしかも肉厚を厚くしてノズル先端部で処理液
が漏出したり、空気と解れるのを防ぐ構造とする。上記
ノズルの直下に回転装置がある構造とする。
The processing liquid dropping device of the present invention has a structure in which the processing liquid that naturally falls from a container is controlled by a valve and drips from a nozzle. The shape of the nozzle is determined by the viscosity of the processing liquid and the tension on the nozzle's nose to prevent the processing liquid from leaking.The nozzle tip is made narrower and thicker to prevent the processing liquid from leaking at the nozzle tip. It has a structure that prevents it from disintegrating with air. The structure has a rotating device directly below the nozzle.

本発明の一実施例の回転塗布装置を第6図を用いて説明
する。第6図において、21は処理液を入れる容器、2
2は弁、23はノズルである。
A spin coating apparatus according to an embodiment of the present invention will be explained with reference to FIG. In FIG. 6, 21 is a container for storing the processing liquid;
2 is a valve, and 23 is a nozzle.

容器21は底面が弁22の入口と直接接続可能なものと
し、弁22とは簡単に脱着可能な構造を有する。容器2
1は処理液2oの液面が変化する事によって起こる部下
圧力の変化を小さく抑えるために、底面積の大きい皿形
の構造をもつ。又容器21は処理液が内壁に付着し凝固
するのを防ぐ6ページ ために疎水性の材質を使用するのが良い。
The container 21 has a bottom surface that can be directly connected to the inlet of the valve 22, and has a structure that can be easily attached to and removed from the valve 22. container 2
1 has a dish-shaped structure with a large bottom area in order to suppress changes in the lower pressure caused by changes in the liquid level of the processing liquid 2o. Further, it is preferable to use a hydrophobic material for the container 21 in order to prevent the processing liquid from adhering to the inner wall and solidifying.

弁22は容器21から流出しようとする処理液を制止し
、ノズル23から処理液が漏出するのを止める役目を果
たす。弁22の開閉は電気信号や空気圧等によって制御
され、開閉時間によって滴下液量を制御する。
The valve 22 serves to stop the processing liquid from flowing out from the container 21 and to stop the processing liquid from leaking out from the nozzle 23. The opening and closing of the valve 22 is controlled by electrical signals, air pressure, etc., and the amount of liquid dripped is controlled by the opening and closing time.

ノズル23は容器21と同様に処理液の付着を防止する
ためにテフロン、ポリエステルなどの疎水性の材質とす
る。ノズル23は、ノズルの先端の内径d1 を、ノズ
ル23と弁22との接続部の内径d2よりも小さくする
。これは処理液がノズル23の内壁面の一部を伝って流
れ落ち、ノズル23の先端から乱流となって飛散するの
を防ぐために、ノズル23の先端部では内径を小さくし
て処理液がノズル内部に満たされた状態を作るための構
造である。ノズル23の先端の内径d1は、処理液が弁
22を閉じた状態で漏出しない様に処液が飛散せずに滴
下される大きさを選ぶ。ノズル7ページ 23の先端が鋭く肉厚が薄く又材質が疎水性の弱い金属
の場合には、処理液がノズル先端部の外壁面にまわり込
み、凝固して付着し、滴下の際に処理液と共に塗布面に
落ちる。これを防ぐためにノズル23の先端部の肉厚を
厚くして処理液の滴がノズルの外壁面に広がらない様に
できる。
Like the container 21, the nozzle 23 is made of a hydrophobic material such as Teflon or polyester in order to prevent the processing liquid from adhering to the nozzle 23. The nozzle 23 has an inner diameter d1 at its tip smaller than an inner diameter d2 at the connecting portion between the nozzle 23 and the valve 22. In order to prevent the processing liquid from flowing down a part of the inner wall surface of the nozzle 23 and becoming turbulent and scattering from the tip of the nozzle 23, the inner diameter is made small at the tip of the nozzle 23 so that the processing liquid flows through the nozzle. It is a structure that creates a state of fulfillment inside. The inner diameter d1 of the tip of the nozzle 23 is selected to a size that allows the treatment liquid to drip without scattering so that the treatment liquid does not leak out when the valve 22 is closed. If the tip of the nozzle (page 7, page 23) is sharp and the wall thickness is thin, or if the material is made of a metal with weak hydrophobicity, the processing liquid will wrap around the outer wall surface of the nozzle tip, solidify and adhere, and the processing liquid will drop when dripping. It also falls onto the coated surface. To prevent this, the thickness of the tip of the nozzle 23 can be increased to prevent the droplets of the processing liquid from spreading on the outer wall surface of the nozzle.

第6図に示す様にノズル23と半導体材料26との距離
7!3は、処理液が飛散しない距離とする。
As shown in FIG. 6, the distance 7!3 between the nozzle 23 and the semiconductor material 26 is set so that the processing liquid does not scatter.

ノズル23から滴下された処理液は、回転台24上に装
着された半導体材料25上に滴下され、回転台を高速回
転させて処理液を半導体拐料−ヒに回転塗布する。
The processing liquid dripped from the nozzle 23 is dropped onto the semiconductor material 25 mounted on the rotating table 24, and the rotating table is rotated at high speed to apply the processing liquid onto the semiconductor material.

以上のように第6図に示す装置の構造によシ、処理液の
漏出がなく、処理液を飛散させず、処理液の凝固物をノ
ズルに付着させなくすることができる0又第6図の装置
では容器21、弁22、ノズル23はそれぞれ取りはず
しか容易であり、装処理液との置換も容易である。又処
理液Ω粘度や性質に合わせてノズルを作る事も容易で、
処理液の種類によってノズルを交換することもできる。
As described above, the structure of the apparatus shown in FIG. 6 makes it possible to prevent the processing liquid from leaking, to prevent the processing liquid from scattering, and to prevent the coagulation of the processing liquid from adhering to the nozzle. In this apparatus, the container 21, valve 22, and nozzle 23 can be easily removed and replaced with the processing liquid. It is also easy to create a nozzle to match the viscosity and properties of the treatment liquid.
The nozzle can also be replaced depending on the type of processing liquid.

たとえば、本発明を用いて、シリコン基板上にムSを拡
散する工程において、処理液としてエチルアルコールを
溶媒としケイ素化合物5.9%を主成分とし砒素を不純
物として0.5%含む不純物拡散剤を用い、シリコン基
板上に上記処理液を滴下し回転塗布を行った場合、処理
液の漏出や凝固物の付着がなく飛散せずに塗布できた。
For example, in the process of diffusing MuS onto a silicon substrate using the present invention, an impurity diffusion agent containing 5.9% of a silicon compound as a main component and 0.5% of arsenic as an impurity using ethyl alcohol as a processing liquid as a solvent. When the above-mentioned treatment liquid was dropped onto a silicon substrate and spin coating was carried out using a , the treatment liquid could be coated without leakage or adhesion of coagulum, and without scattering.

上記の処理液の場合、第6図におけるノズル23の形状
は、内径d1が3111m、内径d2が4rrr!n、
ノズルの先端部の肉厚が3111111で、材質をデフ
ロンとし、ノズル23の長さ7!1を50調、装置の全
長/!2を200順、ノズル23から塗布面1での長さ
713を1511111とし、弁22を約0.2秒開く
事によって約0.5ccの処理液が滴下できる。上記処
理液を直径75111mのシリコン基板26上に滴下し
、4000 r 、p、Hlで2.0秒間回転塗布して
形成した塗布膜26は従−来の方法と比べて塗布面の異
物が約見に減少し、第5図に示す塗布面の乱れが無くな
った。
In the case of the above treatment liquid, the shape of the nozzle 23 in FIG. 6 has an inner diameter d1 of 3111 m and an inner diameter d2 of 4 rrr! n,
The wall thickness of the tip of the nozzle is 3111111, the material is deflon, the length of the nozzle 23 is 7!1 is 50, the total length of the device is /! 2 in the order of 200, the length 713 from the nozzle 23 to the coating surface 1 is 1511111, and by opening the valve 22 for about 0.2 seconds, about 0.5 cc of processing liquid can be dripped. The coating film 26 formed by dropping the above treatment liquid onto a silicon substrate 26 with a diameter of 75111 m and spinning coating at 4000 r, p, Hl for 2.0 seconds has approximately 100% of foreign matter on the coated surface compared to the conventional method. 5, and the disturbance on the coated surface as shown in FIG. 5 disappeared.

9ページ 以上のように、本発明による処理液滴下装置をもつ回転
塗布装置kを月1いると、塗布膜に乱れを生じさせずに
回転塗布がri(能となり、処理液の交換と装置の洗a
1が容易になった。これにより半導体製造における歩と
1りの向上と能率向上が得られた。
As shown on page 9 and above, if the spin coating device k equipped with the processing liquid dripping device according to the present invention is used once a month, spin coating will be possible without causing any disturbance to the coating film, and it will be possible to replace the processing liquid and operate the device. Wash a
1 has become easier. This has resulted in step-by-step improvements in semiconductor manufacturing and improved efficiency.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、従来の回転塗布装置の概略構成図、第2図、
第3図及び第4図は従来の処理液滴下装置のノズル部分
の構造断面図及び滴下状態を示す図、第6図(A) 、
 (B)は従来の処理液滴下装置を用いた場合の回転塗
布後の塗布面の平面図、塗布基板の断面図、第6図は本
発明の一実施例にかかる回転塗布装置の構造断面図であ
る。 20・・・・・・処理液、21・・・・・・容器、22
・・・・・・弁、23・・・・・・ノズル、24・・・
・・・回転台、26・・・・・・半導体材料、26・・
・・・・塗布膜。 代理人の氏名 弁理士 中 尾 敏 男 ほか1名実 
IFgJ 第4図 4b /6も 第5図 (/’l)                    
                    (B)第6
Figure 1 is a schematic configuration diagram of a conventional spin coating device, Figure 2 is
3 and 4 are structural cross-sectional views of the nozzle portion of a conventional processing liquid dripping device and diagrams showing the dripping state, and FIG. 6(A),
(B) is a plan view of the coated surface after spin coating when a conventional treatment liquid dropping device is used, and a sectional view of the coated substrate, and FIG. 6 is a structural sectional view of the spin coating device according to an embodiment of the present invention. It is. 20... Processing liquid, 21... Container, 22
...Valve, 23...Nozzle, 24...
...Rotating table, 26...Semiconductor material, 26...
...Coating film. Name of agent: Patent attorney Toshio Nakao and one other person
IFgJ Figure 4 4b /6 also Figure 5 (/'l)
(B) Sixth
figure

Claims (3)

【特許請求の範囲】[Claims] (1)半導体製造用の処理液を入れる容器と前記処理液
を滴下するノズルとの間に弁を設け、上記容器からノズ
ルを通って自然落下する処理液の滴下量を、上記弁によ
って制御する処理液滴下構造を有する回転塗布装置。
(1) A valve is provided between a container that holds a processing liquid for semiconductor manufacturing and a nozzle that drips the processing liquid, and the amount of the processing liquid that naturally falls from the container through the nozzle is controlled by the valve. A rotary coating device with a treatment liquid dripping structure.
(2)、容器、弁及びノズルを脱着可能にしたことを特
徴とする特許請求の範囲第1項に記載の回転塗布装置。
(2) The spin coating device according to claim 1, wherein the container, valve, and nozzle are removable.
(3)ノズルの内径がノズル先端部で細く、前記ノズル
先端部の肉厚が他の部分の肉厚よりも厚いことを特徴と
する特許請求の範囲第1項に記載の回転塗布装置。
(3) The spin coating device according to claim 1, wherein the inner diameter of the nozzle is narrow at the tip of the nozzle, and the thickness of the tip of the nozzle is thicker than that of other parts.
JP11943982A 1982-07-08 1982-07-08 Rotary coating device Pending JPS5910364A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11943982A JPS5910364A (en) 1982-07-08 1982-07-08 Rotary coating device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11943982A JPS5910364A (en) 1982-07-08 1982-07-08 Rotary coating device

Publications (1)

Publication Number Publication Date
JPS5910364A true JPS5910364A (en) 1984-01-19

Family

ID=14761439

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11943982A Pending JPS5910364A (en) 1982-07-08 1982-07-08 Rotary coating device

Country Status (1)

Country Link
JP (1) JPS5910364A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011204948A (en) * 2010-03-26 2011-10-13 Dainippon Screen Mfg Co Ltd Treatment liquid supply device and treatment liquid supply method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011204948A (en) * 2010-03-26 2011-10-13 Dainippon Screen Mfg Co Ltd Treatment liquid supply device and treatment liquid supply method

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