JPS5898975A - Vertical gate thin film transistor and manufacture thereof - Google Patents

Vertical gate thin film transistor and manufacture thereof

Info

Publication number
JPS5898975A
JPS5898975A JP19912381A JP19912381A JPS5898975A JP S5898975 A JPS5898975 A JP S5898975A JP 19912381 A JP19912381 A JP 19912381A JP 19912381 A JP19912381 A JP 19912381A JP S5898975 A JPS5898975 A JP S5898975A
Authority
JP
Japan
Prior art keywords
layer
metal film
semiconductor
electrode
conductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19912381A
Other languages
Japanese (ja)
Inventor
Seishiro Yoshioka
吉岡 征四郎
Takao Yonehara
隆夫 米原
Yoshio Sakuma
佐久間 純郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP19912381A priority Critical patent/JPS5898975A/en
Publication of JPS5898975A publication Critical patent/JPS5898975A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/786Thin film transistors, i.e. transistors with a channel being at least partly a thin film
    • H01L29/78642Vertical transistors

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Thin Film Transistor (AREA)

Abstract

PURPOSE:To readily control the saturating characteristic of a drain current against a drain voltage by compsoing a mesa structure of the first metal electrode, an ohmic layer, a semiconductor active layer, the second ohmic layer and metal electrode on an insulating substrate. CONSTITUTION:Molybdenum is deposited as a drain electrode 17 on an insulating substrate 15 of non-crystal or the like, and a semiconductor ohmic layer 11 is grown as polycrystal. Then, the electrode 17 and the layer 11 are etched. Subsequently, a semiconductor active layer 12 is grown. Then, an N type impurity- added layer is grown as a semiconductor ohmic layer 13. Thereafter, molybdenum is vacuum deposited as a source electrode 18. At this time the layers 12, 13 and the electrode 18 are etched and removed at the unnecessary parts with the gate and the source electrode remaining. Then, the entire surface is covered with an insulating layer 14, and molybdenum is further deposited. Then, the electrode 16 is allowed to remain, and the molybdenum is removed.

Description

【発明の詳細な説明】 本角明は罵界効釆トランジスタvclkり、j!に詳し
くは電圧ma籍性のm5tt谷易Vこする―直タート薄
編トランジスタO#1道及びその−1ゲート薄農ト2ン
ジスタO顧這方法Vこ関する。
DETAILED DESCRIPTION OF THE INVENTION Akira Honkaku is an expert in the field effect transistor vclk, j! The details are related to the voltage ma characteristic m5tt valley easy V rubbing - direct start thin knitted transistor O #1 way and its -1 gate thin knitted transistor O how to follow V.

亀!#効果トランジスタ(以下FETと称す)等OIA
子を亀子&!21路に使用する礪會、用途に1ってJI
4なった電圧4訛脅性を持つji’ETが責累爲れる。
turtle! #OIA such as effect transistor (hereinafter referred to as FET)
Kameko &! JI is the one used for the 21st road, and the purpose is 1.
ji'ET, who has a 4 accent threat, is to blame.

そこで、値米Oji’NTri電圧蝋tIt骨性、臀に
ドレイン電圧に対するドレイン蔦toJII和臀性が、
各々所ji10I?#性となるように設計されていた。
Therefore, the value of Oji'NTri voltage is Oji'NTri, and the drain voltage to JII is as follows:
Each place ji10I? # It was designed to be sexual.

しかし飽和骨性の1!累が貧化した1酋、FET0&針
七見直さなければならず、それに伴って、ブレーナ形F
h、Tではji1造する1曾に7オトマスク等から作り
直す必責がめつ九。又、幽直グ−ト雌緘トンンジスタ(
以下1/−TFTと称す)0礪合t−娼1図1C示す。
But saturated bone 1! Due to the poor performance, I had to review the FET0 and needles, and along with that, I changed the Brenna type F.
In h and T, the 1st to make the 1st and the 7th mask to be remade from the 7th mask, etc. are required. In addition, Yucho Guto Metan Tonjisuta (
(hereinafter referred to as 1/-TFT) 0 t-t-t 1 shown in FIG. 1C.

図中1はドレイン執域、2はベース前域、3はソース電
域、4は絶縁層、Dは結縁性基板、6はゲート電憔を示
す0この↓うなV−’l″Tに於いては、絶縁層4、ド
レイン愉域lなどO犀さを変えゲート−礁6とベース@
11R2tD相刈的な位置を変化させることによって、
図中iQcで示すチャネルの鋳起される状−が叢わって
、ドレイン電流の飽和特性が変化することがわかった。
In the figure, 1 is the drain area, 2 is the base area, 3 is the source area, 4 is the insulating layer, D is the connecting substrate, and 6 is the gate voltage. In this case, the insulation layer 4, drain area 1, etc. are changed and the gate-reef 6 and base@
By changing the position of 11R2tD,
It was found that the saturation characteristics of the drain current change as the channel shapes indicated by iQc in the figure are clustered together.

しかし、杷嫌虐4、ドレイン誠域1等の厚さは一〇嵩子
機総上f限足さJts  ドレイン−titO胞釉籍注
を画一で癌る輻鴫4h惚めて狭い一〇でめった。
However, the thickness of loquat 4 and drain sincerity area 1 is 10,000 yen. I failed.

本竜−の目的はドレイン電圧に対するドレイン載置の飽
和特性を広範囲に且つて容易に副−L14V−TaFT
titfi−する拳でるる。
The purpose of the present dragon is to easily measure the saturation characteristics of the drain mounting with respect to the drain voltage over a wide range of sub-L14V-TaFT.
Ruru makes a titfi- fist.

不発明は杷鉱譲板上に蕃lの金属電離、縞lQ牛尋棒オ
ーミック層、半都体枯性層、嬉20オーミック虐、42
の金属11こ工9メサ形O−通体t4戚し、こOメを杉
の傅通体及び基板上Kjll!1m4 t *yli 
L、ctpemmt”介t、てメy#l造体lll1聞
にゲ ト鴫惚倉設け、V−TFTを形成することWC↓
って上妃目的倉適するも0で弗る。m’b本発明0V−
TFTに於いて1よ、浮名の変化の1由直が大きい@1
0蓋J14蔦也の浮名によって、ドレイン11IL流の
飽和特性を広範囲に制御するもので番る。
Non-invention is the metal ionization of the loquat on the loquat plate, the ohmic layer of the striped lQ cowhin bar, the semi-drying layer, the 20 ohmic deterioration, 42
Metal 11 This work 9 Mesa type O-through body t4 is connected, and this O is on the cedar fu through body and the board Kjll! 1m4t *yli
WC↓
The story goes to the upper princess, but it ends with 0. m'b present invention 0V-
In TFT, 1, the change of Ukina is very straightforward @1
Depending on the name of the 0 cover J14 Tsutaya, the saturation characteristics of the drain 11IL flow can be controlled over a wide range.

以下本発明を1圓を用いて説明する。The present invention will be explained below using one circle.

第2図四−+CIは本発明O系10実施拘tボした%O
で、(a+は正向#圓凶、(−は平岡園、−1は貴方断
函凶でるる。図中11 、 l 3ri半4棒オーミツ
ク虐、12ri半尋体′#i性j−114t1杷緻層、
15は杷嶽性i板、16はケート電憔、17はドレイン
鴫礁、1Bはソース蝋礁、IQm。
Figure 2 4-+CI is the %O that was applied to the implementation of O system 10 of the present invention.
So, (a+ is positive #enkyo, (- is Hiraokaen, -1 is you dankankyo. In the figure, 11, l 3ri half 4 sticks, 12ri half fat body'#i sex j-114t1 loquat layer,
15 is the loquat i plate, 16 is the kate electric, 17 is the drain lily, 1B is the source lily, IQm.

19bは各々ドレイン電離及びノース蔦憾Oコンタクト
ホールでるる。ここで17tドレイン電礁、18をソー
ス#L憾としたか、逆O儒威tとって、↓7,18t−
4々ソース域礁、ドレイン電憔とすることもできる。こ
仁で感zmtatoように絶縁層14401嶺上の岸さ
t dm、ドレイン4憔17及び牛4淳オーミック層1
10厚さを酋わせたものtdlとするとa、>ct、(
D関係となっている。又、本実mnに於いて、ドレイン
屯他17θJ41纒倉滓くした不発明の第2の夾論肖t
4j図ycボす。第3凶は第2図1−]と同嫌に本発明
のV−’1’i+”TOf向断面図τがし、対応部分y
c會よ門−付Mkllttしてi#−説明は省略する。
Reference numerals 19b are a drain ionization hole and a north ion contact hole, respectively. Here, we set the 17t drain electrode and 18 as the source #L, or take the reverse O t, ↓7,18t-
It is also possible to have four source and drain regions. In this case, the insulating layer 14401, the drain 4 17 and the ohmic layer 1 on the insulating layer 14401
If the thickness is tdl, then a, > ct, (
It is related to D. Also, in this book, the second theory of non-invention written by Dorain et al.
4j figure yc board. The third problem is as shown in FIG.
I'll omit the explanation.

ここごVよドレ1ンwL礁17i浮く形成したことによ
っでd、<d、となっている。このように不発980V
 −’1’ F ’i’に於いては、ドレイン域−の廖
遜を自山虻ご灰化dせることが出来る。
Due to the floating formation of V, drain, and wL reef, d, < d. 980V unexploded like this
-'1'F'i', it is possible to ash the drain area.

久VC本舛曲tQV−1’i=“T(D−圧蝋臨峙性を
第4凶1aj lbl yヒポす。入にソース滅地に於
けるドレイン1圧vg <横軸に、ドレイン4憔苑ID
を縦軸Vことったtので、”11 vG! l ”lj
@は谷々の電圧にゲート4比に^化させた嗜のV、 −
1,特性を孕す。
Kyu VC main body music tQV-1'i = "T (D- Pressure wax pressure 4th 1aj lbl y hippo. First, drain 1 pressure vg in source extinction area < horizontal axis, drain 4 Kaenen ID
Since the vertical axis V is t, "11 vG! l "lj
@ is the V that changes the voltage of the valley to the gate 4 ratio, −
1. Contains characteristics.

ここで第4凶(Jl)は第2凶神目bl TCIり第l
の夾施ガvc yF −j d@ 、> d@ t″m
建するようにドレイン鴫憔17rap < jEp戟L
*しfl) VL) −1D臀e ’tyy L、、鉋
81軸社O民い5憔重嫌O狩江となる。又、第4図1k
lは第3図O↓うにa、<d、O関係をとりでドレイン
4憔17is<形成した礪曾0Vp−1p%性で、I&
!相特性の−い3惚賃体0符注を不す0こOようWC+
宛9141) V−TFT t!、ドレイ744817
Q*さtt化嘔ゼることICよってドレイン鴫!110
結相特性を広義tBwc且つて−一し祷るものである。
Here, the 4th evil (Jl) is the 2nd evil god bl TCI ri 1
of yF −j d@ , > d@ t″m
Drain 戟戔17rap < jEp 戟L
*Shi fl) VL) -1D buttocks e 'tyy L,, plane 81 axis company O people 5 挔heavy O Karie. Also, Fig. 4 1k
l is 0Vp-1p% of the drain formed by taking the relationship O↓a,<d,O in Figure 3, and I&
! WC+
Address: 9141) V-TFT t! , Dray744817
Q*Satt is vomiting and drains due to IC! 110
The phase coupling characteristic is broadly defined as tBwc.

゛ 本m1jljlJV−TF?)JIm力mQlnk−麟
2図てモリブデンi Ll、 3ミクロン惑虜し、次に
jk&諷度j!を轟板軟化緘直以下VC律ら、半場捧オ
ーミック層11tJILさ200オングストロ一ムNm
不純智(1m、アンナ七ン、ヒ系等)τルツボで1発さ
せながら7リコン倉嵐子就で^空志看することにより多
鮎晶属長dぜる0ここでドレ1ン#IL礁17と半導体
オーミンク層11に一離2凶ICIのようVCエツチン
グす4o久いて千場棒清注虐12としてシリコンOみt
*姑五ミクロンA空蔗膚することVこより多紬蟲戚量d
ぜる0威いはこθ千尋捧16恢J111112tよP−
不軸物(アルミ。
゛Book m1jljlJV-TF? ) JIm force mQlnk-Rin 2 figure molybdenum i Ll, 3 micron captivated, then jk & humorous j! The todoroki plate is softened by VC, and the ohmic layer is 11tJIL, which is 200 angstroms Nm.
Impure wisdom (1m, Anna 7, Hi-type, etc.) τ While firing one shot in the crucible, 7 recon warehouse Arashiko Nari ^ By watching the sky, Tayu Akira Gencho d Zel 0 Here, Drain 1 #IL Reef 17 and the semiconductor Ohmink layer 11 are etched with VC like Ichiri 2 ICI.
*Mother five microns
Zeru 0 power is here θ Chihiro dedication 16 恢J111112tyoP-
Shaft (aluminum).

ガリウム)t−ルツボでJk妬させながら/リコンに一
子杖で^全急庸することによって作成して4よい。丹び
牛尋体オーミック層12と1WI−にN麺季#14i智
龜加層を廖さ200オ/ゲストΩ−ムjA垣dゼて牛尋
俸オーミック虐13とする。久いCソース−憔五8とし
てモリブデン全0.2ミクーンA仝#1層する。ここで
牛尋体)fi 12 、13及び飯1g4憔1tit鴫
2凶(C10如くゲート部、ソース4憾鄭を跣して不聚
郁倉工ツナング隷去す心0久いで)゛ンズマCVL)’
@gcLp盆面を輩ILンリコ/、Si偽等O杷結縁−
14で厚さ0.15ミクロン41L蝋し、更にモリブデ
ンを辱さtl、2ミクロンA仝急看する。そしてケート
′4礁16の−か(炊して小狭部Qモリ7′デン膚倉エ
ッチ/グ減云する。m飲vC杷緘)Vla 14 WC
コンタクトホール19M、ムsb 1エツナングにL9
開ける。本%閃iこ沃いて虻よ、上述0ドレイン亀憔1
7倉蒸膚了る赤yC癲腐時閣彎のI!i13mKJ:、
pドレイン域値17J辱dt蘭半Vこ跋んゐことがでさ
、ドレインI4c流の飽和置注を金品Vこ鯛−でさる。
Gallium) Created by making Jk jealous in the T-crucible/by using the Ichigo staff on Rickon to make it 4 times. Add the ohmic layer 12 and 1wi- to the ohmic layer 12 and 1wi- and add 200 layers to the ohmic layer 13. Long C source - 58 molybdenum total 0.2 microns A #1 layer. Here, the beef body) fi 12, 13 and rice 1g4 1tit 2 evil (C10 like gate part, sauce 4 traversing the agony and killing the unlucky warehouse worker Tsunang for a long time)゛Zuma CVL) '
@gcLp Bonmen wo IL Nrico/, Si false etc. O loquat connection-
14 to 0.15 micron thickness 41L, and further molybdenum tl, 2 micron A to urgent care. And Kate '4 Reef 16 - (cooking and Kosabe Q Mori 7' Den Harakura Etch/G decrease. m drinking vC loquat) Vla 14 WC
Contact hole 19M, L9 in Musb 1 etsunang
Open. I'm so angry, the above 0 drain turtles 1
7 warehouses vaporized red yC 癲 rotting time kakaki I! i13mKJ:,
P drain threshold value 17J humiliation dt Ranhan V is not widespread, drain I4c style saturation positioning is done with gold pin V this sea bream.

以上−明したようVC本銘明はV−’l’FT&Il:
於いて、ドレイ/*tito飽81籍性の鯛−を容易に
する1iJiA倉令”する0
As stated above, VC's main name is V-'l'FT&Il:
In this case, 1iJiA warehouse to make it easy for Drey /

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来IQV−’1’l=”T倉ボす正面賄閣凶
、s2図−11bl IcIは不鈍明O第lの実施例を
がし、否々(4は正向#llr圓図、tbtμ平閣図、
IcIは貴方哨国−虻η(: T o  第 j 凶t
よ季う色間の第 20夾1自ν1虻不す止鴎町閣凶、第
4凶t41blは奇々本強曲0V−Tk’TO鴫圧鴫苑
籍注tボナ凶6 11.13・・牛尋捧オーミンク79912・・・午尋
俸清性膚 14・・・結縁4i5 杷−注益嶺16・・
ゲート電憾 17・・ドレ1ン嵐惚 18・・・ソース
*Iik  lsj’a 、 19b・・・コンタクト
小−ル出繊人 キャノン体式賃社
Figure 1 shows the conventional IQV-'1'l = "T warehouse front facing bribery, s2 figure-11bl IcI peels off the first embodiment of the dull light, and is negative (4 is the front facing #llr Enzu, tbtμ Heikakuzu,
IcI is your country - 虻η(: T o th j
Yokiu Iroma No. 20 Kyo 1 Self ν 1 No Susutome Ochomachi Kaku, No. 4 Kyo t41 bl is a strange book strong song 0V-Tk'TO 鴫厫鴫譫训書 t Bonakyo 6 11.13... Nyujin offering Ohmink 79912...Gojin Pei Ching Seihada 14...Join 4i5 Loquat-Zhuyiling 16...
Gate Denki 17...Dre 1 Arashi Love 18...Source *Iik lsj'a, 19b...Contact Small Businessman Canon Taishiki Hiresha

Claims (1)

【特許請求の範囲】 性 11)  #!翼、チ鯖晶、或いは単ti蟲杷鰍神板上
Vこメサ形に顔に積み皿ねられた第lO金Is鴫−1第
1tQ#p4捧オーゼツク層、半導体油性層、嬉20千
尋体オーミック層、扇2の*JII電礁V電離paw、
さnたメサ形の4造体と、献メチ形04這棒戊び蕪値上
に被層された絶縁層と、販メナル04埴俸のli1聞に
鈑杷鰍層tプiして設けられたゲート鑞憾とρ・ら戚る
!1ゲニト薄編トランジスタ。 性 (2)非晶貢、多鮎晶或いは率餉晶杷略蕪板上に、金属
膜を1看し、該金属膜O上に鵜に薦10半4S+オーミ
ック層、半導体ga tm 、蕗2の半導体オーミツク
ツdt杉或するように多結1牛導体に成員させ、東に販
多絨晶半尋体上に再び金属膜を謔庸する工程と、該貧属
−及び販多幀晶牛番体tエツチングしてメを形O#1通
体を形成する1福と、販メサ杉の構造体及び絶縁基板上
に絶縁層を被層し、賦絶縁層を介して販メを形の構造体
l1llll向にゲート電離を設ける1癲より成る―直
タート薄膜トランジスタをRmする方k。
[Claims] Gender 11) #! Wings, mackerel crystals, or monoti loquats and gills on the plate V-shaped mesa-shaped piled on the face 1st 1st tQ#p4 Oszetsuk layer, semiconducting oily layer, happy 20 chihiro body Ohmic layer, *JII electric reef V ionization paw of fan 2,
4 mesa-shaped structures, an insulating layer coated on the mesa-shaped 04 crawling rods, and a loquat layer t layered on the 1st floor of the sales menal 04 clay layer. The gate that was released is related to Rho! 1genit thin-knit transistor. (2) A metal film is placed on the amorphous, polyacrylic, or semi-crystalline substrate, and a 10 and a half 4 S + ohmic layer, a semiconductor GA TM , and a 2-layer metal film are placed on the metal film O. The process of forming a multi-connected conductor into a multi-connected conductor as shown in the semiconductor Ohmics dt cedar, and applying a metal film again on the semi-conductor body, and the process of forming a metal film on the semi-conductor and the semiconductor conductor. The body is etched to form a body in the shape of O#1, and an insulating layer is layered on the cedar structure and the insulating substrate, and a structure in the shape of a body is formed through the insulating layer. It consists of one wire with gate ionization in the l1lllll direction - the direction of Rm of a direct-start thin film transistor.
JP19912381A 1981-12-09 1981-12-09 Vertical gate thin film transistor and manufacture thereof Pending JPS5898975A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19912381A JPS5898975A (en) 1981-12-09 1981-12-09 Vertical gate thin film transistor and manufacture thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19912381A JPS5898975A (en) 1981-12-09 1981-12-09 Vertical gate thin film transistor and manufacture thereof

Publications (1)

Publication Number Publication Date
JPS5898975A true JPS5898975A (en) 1983-06-13

Family

ID=16402516

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19912381A Pending JPS5898975A (en) 1981-12-09 1981-12-09 Vertical gate thin film transistor and manufacture thereof

Country Status (1)

Country Link
JP (1) JPS5898975A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6144422A (en) * 1996-12-28 2000-11-07 Hyundai Electronics Industries Co., Ltd. Thin film transistor having a vertical structure and a method of manufacturing the same

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS567481A (en) * 1979-06-29 1981-01-26 Ibm Field effect type transistor
JPS56135968A (en) * 1980-03-27 1981-10-23 Canon Inc Amorphous silicon thin film transistor and manufacture thereof
JPS5874067A (en) * 1981-10-29 1983-05-04 Semiconductor Energy Lab Co Ltd Semiconductor device

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