JPS5896745A - 電子部品テスタ用オ−トハンドラにおけるテスト治具交換機構 - Google Patents
電子部品テスタ用オ−トハンドラにおけるテスト治具交換機構Info
- Publication number
- JPS5896745A JPS5896745A JP56194912A JP19491281A JPS5896745A JP S5896745 A JPS5896745 A JP S5896745A JP 56194912 A JP56194912 A JP 56194912A JP 19491281 A JP19491281 A JP 19491281A JP S5896745 A JPS5896745 A JP S5896745A
- Authority
- JP
- Japan
- Prior art keywords
- jig
- test jig
- component
- section
- guide rail
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56194912A JPS5896745A (ja) | 1981-12-03 | 1981-12-03 | 電子部品テスタ用オ−トハンドラにおけるテスト治具交換機構 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56194912A JPS5896745A (ja) | 1981-12-03 | 1981-12-03 | 電子部品テスタ用オ−トハンドラにおけるテスト治具交換機構 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5896745A true JPS5896745A (ja) | 1983-06-08 |
| JPH0147895B2 JPH0147895B2 (enExample) | 1989-10-17 |
Family
ID=16332400
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56194912A Granted JPS5896745A (ja) | 1981-12-03 | 1981-12-03 | 電子部品テスタ用オ−トハンドラにおけるテスト治具交換機構 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5896745A (enExample) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5812334A (ja) * | 1981-07-16 | 1983-01-24 | Seiko Epson Corp | オ−トハンドラ− |
-
1981
- 1981-12-03 JP JP56194912A patent/JPS5896745A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5812334A (ja) * | 1981-07-16 | 1983-01-24 | Seiko Epson Corp | オ−トハンドラ− |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0147895B2 (enExample) | 1989-10-17 |
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