JPS5892872A - 集積回路の試験方式 - Google Patents

集積回路の試験方式

Info

Publication number
JPS5892872A
JPS5892872A JP56189310A JP18931081A JPS5892872A JP S5892872 A JPS5892872 A JP S5892872A JP 56189310 A JP56189310 A JP 56189310A JP 18931081 A JP18931081 A JP 18931081A JP S5892872 A JPS5892872 A JP S5892872A
Authority
JP
Japan
Prior art keywords
terminal
output
input
data
lsi
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56189310A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0341793B2 (enExample
Inventor
Koichi Ikeda
池田　公一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP56189310A priority Critical patent/JPS5892872A/ja
Publication of JPS5892872A publication Critical patent/JPS5892872A/ja
Publication of JPH0341793B2 publication Critical patent/JPH0341793B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP56189310A 1981-11-27 1981-11-27 集積回路の試験方式 Granted JPS5892872A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56189310A JPS5892872A (ja) 1981-11-27 1981-11-27 集積回路の試験方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56189310A JPS5892872A (ja) 1981-11-27 1981-11-27 集積回路の試験方式

Publications (2)

Publication Number Publication Date
JPS5892872A true JPS5892872A (ja) 1983-06-02
JPH0341793B2 JPH0341793B2 (enExample) 1991-06-25

Family

ID=16239201

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56189310A Granted JPS5892872A (ja) 1981-11-27 1981-11-27 集積回路の試験方式

Country Status (1)

Country Link
JP (1) JPS5892872A (enExample)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55114968A (en) * 1979-02-28 1980-09-04 Hitachi Ltd Propagation delay time measuring method of semiconductor integrated circuit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55114968A (en) * 1979-02-28 1980-09-04 Hitachi Ltd Propagation delay time measuring method of semiconductor integrated circuit

Also Published As

Publication number Publication date
JPH0341793B2 (enExample) 1991-06-25

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