JPS5873877A - Sampling method for repeated waveform - Google Patents

Sampling method for repeated waveform

Info

Publication number
JPS5873877A
JPS5873877A JP17264281A JP17264281A JPS5873877A JP S5873877 A JPS5873877 A JP S5873877A JP 17264281 A JP17264281 A JP 17264281A JP 17264281 A JP17264281 A JP 17264281A JP S5873877 A JPS5873877 A JP S5873877A
Authority
JP
Japan
Prior art keywords
output
waveform
time
pulse generator
frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17264281A
Other languages
Japanese (ja)
Inventor
Tokuyasu Oki
沖 十九康
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ando Electric Co Ltd
Original Assignee
Ando Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ando Electric Co Ltd filed Critical Ando Electric Co Ltd
Priority to JP17264281A priority Critical patent/JPS5873877A/en
Publication of JPS5873877A publication Critical patent/JPS5873877A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00Arrangements for displaying electric variables or waveforms
    • G01R13/20Cathode-ray oscilloscopes
    • G01R13/22Circuits therefor
    • G01R13/34Circuits for representing a single waveform by sampling, e.g. for very high frequencies

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

PURPOSE:To obtain a sampling method having an excellent linearity and requiring little time for conversion, by using two frequency dividers with constant mutual relations. CONSTITUTION:The period of a pulse generator 11 is T, and frequency dividers 12 and 13 divides the frequency of the output of the generator and deliver outputs having periods of NT and MT respectively. In this connection, a resolution determining to what extent a repeated waveform is resolved is denoted by T, while the number of all data of the waveform to be found finally is denoted by N. A time MT of repeated operation of a sample hold circuit 6 is limited by the velocity of operation of an A/D converter, and the formulaIis set between M and N. When the resolution T=0.1mus and N=4095, for instance, M>= 50 on condition that MT>=5mus, and thus M=2<6>=64. Accordingly, a time for conversion turns to be very short, i.e. MNT=26ms. At the same time, since a repetition period and a sampling period are obtained from the output of frequency devision, an error in the time interval of sampling is decided by the stability of a reference frequency employed by the pulse generator 11, and thus it can be made not more than 0.01% by using a conventional quartz oscillator.

Description

【発明の詳細な説明】 111  発明の技術分野 この発明は、繰シ返り、波形を時間軸上で細かく分解し
てサンプリングしていく方法についてのものである。
DETAILED DESCRIPTION OF THE INVENTION 111 Technical Field of the Invention The present invention relates to a method in which a waveform is repeatedly broken down into small pieces on the time axis and sampled.

(2)従来技術 従来方法の構成図を第1図に示す。図で1はパルス発生
器、2はのこぎり波発生器、3は階段波発生器、4はの
こき゛シ波発生器2の出力と階段波発生器5の出力を比
較する電圧比較器、5は被測定回路、6はサンプルホー
ルド回路でする。
(2) Prior Art A block diagram of the conventional method is shown in FIG. In the figure, 1 is a pulse generator, 2 is a sawtooth wave generator, 3 is a staircase wave generator, 4 is a voltage comparator that compares the output of sawtooth wave generator 2 and the output of staircase wave generator 5, and 5 is a voltage comparator that compares the output of sawtooth wave generator 2 with the output of staircase wave generator 5. The circuit under test, 6, is a sample and hold circuit.

次に、第1図による波形例を第2図にホす。図のT1は
繰り返し波形W1の周期であり、Plは最初のサンプリ
ング点、Plは次の波形W2のサンプリング点を表わす
。いま、周期Tt=409.5μsとし、点P1と点P
2の時間間隔T2を409、6μsにする。以下、同様
にして点P2と点P3の時間間隔T5も4096μSの
ようにしていけば、波形Wを409.6 us−409
,5ps=α1μsの分解能でサンプリングしていくこ
とができる。
Next, an example of the waveform shown in FIG. 1 is shown in FIG. 2. In the figure, T1 is the period of the repetitive waveform W1, Pl represents the first sampling point, and Pl represents the sampling point of the next waveform W2. Now, the period Tt = 409.5 μs, and the points P1 and P
The time interval T2 of 2 is set to 409.6 μs. Similarly, if the time interval T5 between points P2 and P3 is set to 4096 μS, the waveform W becomes 409.6 us-409
, 5ps=α1μs resolution.

第1図は第2図の波形W1.W2−・・・・・から点P
I、Pl、・・・・・をサンプリングしていくための構
成図で、被測定回路5の出力が第2図の波形W + 、
W 2、になる。
FIG. 1 shows the waveform W1. of FIG. 2. W2-... to point P
This is a configuration diagram for sampling I, Pl, . . . , and the output of the circuit under test 5 has the waveform W + in FIG.
It becomes W 2.

パルス発生器1の出力のうち、1つは被測定回路5を通
ってサンプルホールド回路6に入り、他の1つはのこぎ
り波発生器2に、もう1つは階段波発生器5に入る。
Among the outputs of the pulse generator 1, one passes through the circuit under test 5 and enters the sample-and-hold circuit 6, the other one enters the sawtooth wave generator 2, and the other one enters the staircase wave generator 5.

のこぎ9波発生器2はパルス発生器1に同期し、周期T
1ののこぎり波を発生する、また1階段波発生器5もパ
ルス発生器1に同期した階段波を発生する。電圧比較器
4はのこぎり波発生器2と階段波発生器5の出力を比較
し、ステップ状に変化する階段波出力によりのこぎり波
出力から第2図の点P1、F2=、・・・・・・を側法
サンプルホールド回路6に送り出していく。
The sawtooth 9-wave generator 2 is synchronized with the pulse generator 1 and has a period T
The step wave generator 5 also generates a step wave synchronized with the pulse generator 1. The voltage comparator 4 compares the outputs of the sawtooth wave generator 2 and the staircase wave generator 5, and converts the sawtooth wave output to points P1, F2=, . . . in FIG.・ is sent to the side sample hold circuit 6.

ランプルホールド回路61d被測定回路5のレスポンス
を点P1、P2、−・・の1@にサンプリングする。
The ramp hold circuit 61d samples the response of the circuit under test 5 at points P1, P2, . . . 1@.

そして、サンプルホールド回路6の出力は図示を省略し
たAL)変!1f!器からCRTなどに表示さnる。
The output of the sample and hold circuit 6 is AL) (not shown). 1f! from the device to a CRT, etc.

(61従来技術の問題点 第2図の点P1、P2、・・・・・・などに対する時間
間隔の正確さは、のこぎり波の直線性で決まる。しかし
1通常の回路で直−性の誤差がα1%以下ののこぎり波
を得ることは難しく、サンプリング誤差になる。
(61 Problems with the Prior Art) The accuracy of the time intervals for points P1, P2, etc. in Figure 2 is determined by the linearity of the sawtooth wave. It is difficult to obtain a sawtooth wave with α1% or less, resulting in a sampling error.

また、第1図、第2図のサンプル方法では変換時間が長
いという問題がある。例えば、第2図のように波形の繰
り返し周期T+=409.5μs、分解能α1μsとす
扛ば、全データ数は4095になり、変換時間は409
5 X 409.5μS=1、68 gになる。
Furthermore, the sample methods shown in FIGS. 1 and 2 have a problem in that the conversion time is long. For example, if the waveform repetition period T+ = 409.5 μs and the resolution α1 μs as shown in Figure 2, the total number of data will be 4095, and the conversion time will be 409.
5 x 409.5 μS = 1,68 g.

(4)発明の目的 この発明は、相互に一定の関係をもつ2つの分周器を使
うことにより、直線性がよく、かつ変換時間の短いサン
プル方法を提供するものである。
(4) Purpose of the Invention The present invention provides a sampling method with good linearity and short conversion time by using two frequency dividers that have a certain relationship with each other.

(51発明の実施例 この発明による実施例の構成図を第5図に示す。(Examples of 51 inventions A block diagram of an embodiment according to the present invention is shown in FIG.

図で11は繰り、洛し周期Tのパルスを出すパルス発生
器、12はパルス発生器11の出力を分局し、繰り返し
周期NTの出力を出す分局器、15はパルス発生器11
の出力を分周し、サンプル周期MTの出力を出す分周器
である。
In the figure, 11 is a pulse generator that outputs pulses with a repetition period T, 12 is a branching unit that divides the output of the pulse generator 11 and outputs an output with a repetition period NT, and 15 is a pulse generator 11.
This is a frequency divider that divides the output of MT and outputs an output with a sampling period MT.

ここで、Tは繰シ返し波形をどこまで分解するかをきめ
る分解能であシ、Nは最終的に求める波形の全データ数
である。へとTは・あらかじめ条件として与えられる。
Here, T is the resolution that determines how far to decompose the repetitive waveform, and N is the total number of data of the waveform to be finally obtained. HetoT is given as a condition in advance.

また、MTはサンプルホールド回路6の繰シ返し動作時
間であり、通常はサンプルホールド回路6の後にAD変
換器を接続するので、MTの値はこのAD変換器の動作
速度で制限を受ける。
Further, MT is the repetitive operation time of the sample and hold circuit 6, and since an AD converter is normally connected after the sample and hold circuit 6, the value of MT is limited by the operation speed of this AD converter.

MとNの間には次の関係を設定する。The following relationship is set between M and N.

N=MxK−A・・・・・・・・・・・・・・・・・・
・・・・・・・・・(岨ここにA、に、M、Nはそれぞ
れ整数でA≧1、K=定数であり、かつN7Mが整数に
ならないようにMとNの値を設定する。式(alからN
>Mである。
N=MxK-A・・・・・・・・・・・・・・・・・・
・・・・・・・・・(Here, A, M, and N are integers, A≧1, K=constant, and set the values of M and N so that N7M is not an integer. .Formula (al to N
>M.

次に、第5図による波形例を第4図に示す。図の波形W
u 、W+2は被測定回路5の出力波形で1、/″ 繰り返し周期はNTである。Pllは最初のサンプリン
グ点、Pllは次のサンプリング点で、点PHと点PI
2の時間間隔はM Tになる。すなわち、第4図はパル
ス発生器11の出力を分周器12で分用して波形W++
 、W+2、・・・・・・の繰り返し周期NTをつくり
、またMとNを式1alの関係になるようにパルス発生
器11の出力を分周してサンプル周期MTをつくる。そ
して、点P++、Pll、・・・・・で波形W++をサ
ンプリングしていき、さらに次の波形W12をサンプリ
ングしていく。この場合、波形WI2の最初のサンプリ
ング点P 101  は波形W + 1の点PMから式
1alのAxTだけず扛た位置になる。
Next, an example of the waveform shown in FIG. 5 is shown in FIG. Waveform W in the figure
u, W+2 are the output waveforms of the circuit under test 5 and the repetition period is NT. Pll is the first sampling point, Pll is the next sampling point, and the points PH and PI
The time interval of 2 becomes M T. That is, in FIG. 4, the output of the pulse generator 11 is divided by the frequency divider 12 to form a waveform W++.
, W+2, . Then, the waveform W++ is sampled at points P++, Pll, . . . , and the next waveform W12 is further sampled. In this case, the first sampling point P 101 of the waveform WI2 is located at a position not only AxT in equation 1al but also from the point PM of the waveform W + 1.

これはN7Mが整数にならないようにしであるので、繰
シ返し周期NTをサンプリング周期MTでサンプリング
していくとATだけはみ出すからで、波形W+tと波形
W + 2のサンプリング点かずnていく。
This is because N7M is not an integer, so if the repetition period NT is sampled at the sampling period MT, only AT will protrude, and the sampling points of waveform W+t and waveform W+2 will be n.

なお、通常は式1alのA=1であるが、A〉1で使用
してもよい。
Note that although A=1 in formula 1al is usually used, A>1 may also be used.

次に、第5図の数値例を示す。第1図、第2図の場合と
条件を同じにするため、分解能T=α1ps、N=40
95とする。
Next, a numerical example of FIG. 5 will be shown. In order to keep the conditions the same as those in Figures 1 and 2, resolution T = α1 ps, N = 40
95.

MTの値は前述のとおり、後続のAD変換器の変換時間
で制限を受け、通常MT≧5μsである。
As described above, the value of MT is limited by the conversion time of the subsequent AD converter, and is usually MT≧5 μs.

T=[L 1μsなので、M≧50になる。Mは分周比
なので、M= 26=64にする。
Since T=[L 1 μs, M≧50. Since M is the frequency division ratio, set M=26=64.

式(atを変形すると。Transforming the formula (at).

K=(N+A)7M・・・・・・・・・・・ ・・・+
b1式(blにN=4095%A=1、M=64を入れ
ると、K=2’=64になる。
K=(N+A)7M・・・・・・・・・・・・+
b1 formula (If you put N=4095%A=1 and M=64 into bl, then K=2'=64.

第3図、第4図による変換時間はMxNxTで与えられ
る。したがって、M=6a、N=4095゜T=α1μ
sなので変換時間はこれらの積で26m5となり、第1
図、第2図の場合の変換時間1、68 sに比べて非常
に短くなる。
The conversion time according to FIGS. 3 and 4 is given by MxNxT. Therefore, M=6a, N=4095°T=α1μ
s, the conversion time is the product of these, 26m5, and the first
The conversion time is much shorter than the conversion time of 1.68 seconds in the case of FIG.

+61  発明の効果 この発明によれば、従来方法に比べて変換時間が短くな
るとともに、繰り返し周期とサンプル周期全分周出力か
ら得ているので、サンプリングの時間間隔誤差はパルス
発生器1.1で用いる基準周波の安定度で決まり、通常
の水晶発振器を用いることで0.014以下にするこ生
ができる。
+61 Effects of the Invention According to the present invention, the conversion time is shorter than that of the conventional method, and the sampling time interval error is reduced by the pulse generator 1.1 because the conversion time is obtained from the repetition period and the sampling period fully divided output. It is determined by the stability of the reference frequency used, and can be reduced to 0.014 or less by using an ordinary crystal oscillator.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来方法の構成図。 第2図は第1図による波形例、 第5図はこの発明による実施例の構成図、第4図は第5
図による波形図。 1・・・・・・パルス発生器、2・・・・・・のこぎ9
波発生器、5・・・・・階段波発生器、4・・・・・・
電圧比較器、5・・・・・・被測定回路、6・・・・・
・サンプルホールド回路、11・・・・・・繰シ返し周
期Tの出力を出すパルス発生器、12・・・・・・繰り
返し周期NTの出力を出す分局器、13・・・・・・サ
ンプル周期MTの出力を出す分周器。 代理人  弁理士  小俣欽司 竿 1.7 第9閃 第り図 隼4図
FIG. 1 is a block diagram of a conventional method. FIG. 2 is an example of the waveform according to FIG. 1, FIG. 5 is a configuration diagram of an embodiment according to the present invention, and FIG.
Graphical waveform diagram. 1... Pulse generator, 2... Saw 9
Wave generator, 5... Staircase wave generator, 4...
Voltage comparator, 5...Circuit under test, 6...
・Sample and hold circuit, 11...Pulse generator that outputs an output with a repetition period T, 12...A divider that outputs an output with a repetition period NT, 13...Sample A frequency divider that outputs a periodic MT output. Agent Patent Attorney Kinji Omata 1.7 9th Sen No. 4 Hayabusa

Claims (1)

【特許請求の範囲】 1、 繰り返し周期Tのパルス発生器と、このパルス発
生器の出力から繰り返し周期N Tの出力を出す第1の
分周器と、 このパルス発生器の出力からサンプル周期MTの出力を
出す第20分周器と。 第1の分周器出力を被測定(9)路を介して第1の入力
とし、第2の分周器出力含直接第2の入力とするサンプ
ルホールド回路とを備え。 N=MxK−A、 ここにA、に、M、Nはそれぞれ螢数でA≧1、K=定
数とし、 かつN7Mが整数にならないようにMとNの値を設定す
ることを%値とする繰シ返し波形のサンプル周期。
[Claims] 1. A pulse generator with a repetition period T, a first frequency divider that outputs an output with a repetition period NT from the output of this pulse generator, and a sample period MT from the output of this pulse generator. and a 20th frequency divider that outputs the output. and a sample hold circuit which takes the output of the first frequency divider as the first input via the path to be measured (9) and takes the output of the second frequency divider as the second input. N=MxK-A, where A, M and N are fireflies, respectively, A≧1, K=constant, and setting the values of M and N so that N7M is not an integer is called a % value. Sample period of the repeating waveform.
JP17264281A 1981-10-28 1981-10-28 Sampling method for repeated waveform Pending JPS5873877A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17264281A JPS5873877A (en) 1981-10-28 1981-10-28 Sampling method for repeated waveform

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17264281A JPS5873877A (en) 1981-10-28 1981-10-28 Sampling method for repeated waveform

Publications (1)

Publication Number Publication Date
JPS5873877A true JPS5873877A (en) 1983-05-04

Family

ID=15945659

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17264281A Pending JPS5873877A (en) 1981-10-28 1981-10-28 Sampling method for repeated waveform

Country Status (1)

Country Link
JP (1) JPS5873877A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS541667A (en) * 1977-06-06 1979-01-08 Shiyunichi Nozawa Digital receiver for waveform information

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS541667A (en) * 1977-06-06 1979-01-08 Shiyunichi Nozawa Digital receiver for waveform information

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