JPS5883274A - Sampling method for repeated waveform - Google Patents

Sampling method for repeated waveform

Info

Publication number
JPS5883274A
JPS5883274A JP18143681A JP18143681A JPS5883274A JP S5883274 A JPS5883274 A JP S5883274A JP 18143681 A JP18143681 A JP 18143681A JP 18143681 A JP18143681 A JP 18143681A JP S5883274 A JPS5883274 A JP S5883274A
Authority
JP
Japan
Prior art keywords
output
circuit
frequency divider
vco
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18143681A
Other languages
Japanese (ja)
Inventor
Eikichi Tanaka
田中 英吉
Tokuyasu Oki
沖 十九康
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ando Electric Co Ltd
Original Assignee
Ando Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ando Electric Co Ltd filed Critical Ando Electric Co Ltd
Priority to JP18143681A priority Critical patent/JPS5883274A/en
Publication of JPS5883274A publication Critical patent/JPS5883274A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03LAUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00Automatic control of frequency or phase; Synchronisation
    • H03L7/06Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
    • H03L7/16Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop
    • H03L7/18Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop
    • H03L7/183Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop a time difference being used for locking the loop, the counter counting between fixed numbers or the frequency divider dividing by a fixed number

Landscapes

  • Measurement Of Current Or Voltage (AREA)

Abstract

PURPOSE:To perform a high-resolution sampling with a low frequency, by inserting a PLL circuit between a frequency divider and a circuit to be measured. CONSTITUTION:The output of a pulse generator 1 which generates pulses having a repeat period T is connected directly to the input of a sample holding circuit 5, and a PLL circuit consisting of a frequency divider 3, a phase detector 6, and a voltage control oscillator (VCO) 7 is inserted between a frequency divider 2 and a circuit 4 to be measured. The repeat period of the output of the VCO 7 is set to NT/M, and this output is supplied to the circuit 4 to be measured. The phase detector 6 detects the phase defference between an output NT of the frequency divider 2 and the output NT of the frequency divider 3 and performs such control that the output NT/M of the VCO 7 is constant. N=MXK-A is true in the relation between M and N. A, K, M, and N are integers, and A is equal to or larger than 1, and K is a constant, and values of M and N are so set that N/M is not an integer.

Description

【発明の詳細な説明】 tll  発明の技術分野 この発明は、繰シ返し波形を時間軸上で細かく分解して
サンプリングしていく方法についてのものである。
DETAILED DESCRIPTION OF THE INVENTION Technical Field of the Invention The present invention relates to a method in which a repetitive waveform is finely broken down on the time axis and sampled.

(2)従来技術 従来方法の構成図を第1図に示す。図で、1は繰り返し
周期Tのパルスを出すパルス発生器、2はパルス発生器
1の出力を分周し、繰シ返し周期NTの出力を出す分周
器、5はパルス発生器1の出力を分周し、サンプル周期
MTの出力を出す分周器、4は被測定回路、5はサンプ
ルホールド回路である。
(2) Prior Art A block diagram of the conventional method is shown in FIG. In the figure, 1 is a pulse generator that outputs pulses with a repetition period T, 2 is a frequency divider that divides the output of pulse generator 1 and outputs an output with a repetition period NT, and 5 is the output of pulse generator 1. 4 is a circuit under test, and 5 is a sample hold circuit.

第1図はパルス発生器1の出力のうち、1つを分周器2
から被測定回路4を通ってサンプルホールド回路50入
力に加え、他の1つを分局器3からサンプルホールド回
路5の他の入力に加えている。#!1図では繰シ返し周
期Tが繰シ返し波形をどこまで分解するかをきめる分解
能であり、Nは最終的に求める波形の全データ数である
In Figure 1, one of the outputs of the pulse generator 1 is sent to the frequency divider 2.
The input signal passes through the circuit under test 4 and is added to the sample-and-hold circuit 50 input, and the other one is applied from the divider 3 to the other input of the sample-and-hold circuit 5. #! In FIG. 1, the repetition period T is the resolution that determines how far the repetition waveform is to be resolved, and N is the total number of data of the waveform to be finally obtained.

MとNの間には次の関係がある。There is the following relationship between M and N.

N=MxK−A・・・・・・・・・・・・・・・・・・
・−・・・・・・・・・・・・・・・TalここにA、
に、M、Nはそれぞれ整数でA≧1゜K=定数であり、
かつ87Mが整数になら危いようにMとNの値を設定す
る。式(alからN)Mである。
N=MxK-A・・・・・・・・・・・・・・・・・・
・-・・・・・・・・・・・・・・・Tal here A,
, M and N are each integers and A≧1゜K=constant,
And if 87M is an integer, the values of M and N are set so that it is dangerous. The formula (al to N) is M.

次に、第1図による波形例を第2図に示す。図の波形W
1、W2は被測定回路4の出力波形で、繰り返し周期は
NTである。Plは最初のサンプリング点、P2は次の
サンプリング点で、点P1と点P2の時間間隔はサンプ
ル周期MTになる。
Next, an example of the waveform shown in FIG. 1 is shown in FIG. Waveform W in the figure
1 and W2 are the output waveforms of the circuit under test 4, and the repetition period is NT. Pl is the first sampling point, P2 is the next sampling point, and the time interval between the points P1 and P2 is the sampling period MT.

すなわち、第2図はノ(ルス発生器1の出力を分周器2
で分周して波形W1、W2.・・・・・の繰シ返し周期
NTをつくり、またMとNを式(alの関係になるよう
にパルス発生器1の出力を分周してサンプル周期M T
をつくる。そして、点P1、P2、・・・・・・で波形
W1をサンプリングしていき、さらに次の波形W2をサ
ンプリングしていく。この場合、波形W2の最初のサン
プリング点P11は波形W1の点P1から式(alのA
xTだけずれた位置になる。
In other words, in FIG. 2, the output of pulse generator 1 is
The frequency is divided by waveforms W1, W2 . Create a repetition period NT of .
Create. Then, the waveform W1 is sampled at points P1, P2, . . . , and then the next waveform W2 is sampled. In this case, the first sampling point P11 of the waveform W2 is calculated from the point P1 of the waveform W1 by the formula (A of al).
The position will be shifted by xT.

こjLは87Mが整数にならないようにしであるので、
繰り返し周期NTをサンプル周期MTでサンプリングし
ていくとATだけはみ出すからで、波形W1と波形W2
のサンプリング点がずれていく。
This jL is designed so that 87M is not an integer, so
This is because if the repetition period NT is sampled at the sampling period MT, only AT will protrude, resulting in waveforms W1 and W2.
The sampling point of will shift.

なお1通常は式(atのA=1であるが、A〉1で使用
してもよい。
Note that 1. Usually, A=1 in the formula (at), but it may also be used with A>1.

このようにサンプルホールド回路5は被測定回路4のレ
スポンスを点PI、P2%・・・・・・の順にサンプリ
ングする。そして、サンプルホールド回路5の出力は図
示を省略しているがAD変換器からCRTなどに表示さ
れる。
In this way, the sample and hold circuit 5 samples the response of the circuit under test 4 in the order of points PI, P2%, . . . . Although not shown, the output of the sample and hold circuit 5 is displayed on a CRT or the like from an AD converter.

次に、第1図の数値例を示す。第1図の場合の分解能は
即パルス発生器1の繰シ返し周期Tであり、T=α1p
sとし、N=4095とする。
Next, a numerical example of FIG. 1 will be shown. The resolution in the case of Fig. 1 is the repetition period T of the immediate pulse generator 1, and T = α1p
s and N=4095.

MTO値はサンプルホールド回路5に接続するAD変換
器の変換時間で制限を受け1通常MT≧5PSである。
The MTO value is limited by the conversion time of the AD converter connected to the sample and hold circuit 5, and usually MT≧5PS.

’l’= CL 1p s すf)テ、M≧50になる
。Mは分局比なので、M=2’=64にする。
'l' = CL 1p s f) Te, M≧50. Since M is the division ratio, M=2'=64.

式(alを変形すると、 K=(N+A)/M・・・・・・・・・・・・・・・・
・・・・・・lb1式tblにN=4095、A=1、
M=64を入nると、K=2’=64になる。
If you transform the formula (al), K=(N+A)/M・・・・・・・・・・・・・・・
・・・・・・N=4095, A=1 in lb1 formula tbl,
When M=64 is entered, K=2'=64.

第1図、第2図による変換時間はMXNXTで与えら3
るが、M=64.N=4095、T=α1μsなので、
変換時間はこれらの積から26m5となる。
The conversion time according to Figures 1 and 2 is given by MXNXT3
However, M=64. Since N=4095 and T=α1μs,
The conversion time is 26 m5 from these products.

(51従来技術の問題点 第1図の従来方法では、パルス発生器10基準周波数で
分解能Tが決まるが、T=α01−8が限界である。α
01μsは周波数に換算すると100MH2相等になシ
、技術的に困難である。
(51 Problems with the Prior Art In the conventional method shown in FIG. 1, the resolution T is determined by the reference frequency of the pulse generator 10, but the limit is T = α01-8. α
When converted into a frequency, 01 μs is equivalent to 100 MH2 phase, etc., which is technically difficult.

(4)発明の目的 この発明は第1図の分周器2と被測定回路40間にPL
L回路を入れることによシ、パルス発生器1の基準周波
数を第1図の場合の数百分の−にしても第1図と同じ性
能をもつことができるサンプル方法を提供するものであ
る。
(4) Purpose of the Invention This invention provides a PL between the frequency divider 2 and the circuit under test 40 in FIG.
By inserting an L circuit, a sampling method is provided in which the reference frequency of the pulse generator 1 can be reduced to several hundredths of that in the case of FIG. 1 and still have the same performance as in FIG. 1. .

(51発明の実施例 この発明による実施例の構成図を第5図に示す。(Examples of 51 inventions A block diagram of an embodiment according to the present invention is shown in FIG.

図で、1〜5は第1図と同じであシ、6は位相検波器、
7は電圧制御発振器(VCO)である。すなわち、第5
図は第1図の分周器2と被測定回路4の間に分局器3、
位相検波器6およびVCO7で構成するI’LL回路を
入nるとともに、第1図ノパルス発生器1とサンプルホ
ールド回路50間にあう九分周器3の位置を変え、パル
ス発生器1の出力を直接サンプルホールド回路50入力
に接続するものである。
In the figure, 1 to 5 are the same as in Figure 1, 6 is a phase detector,
7 is a voltage controlled oscillator (VCO). That is, the fifth
The figure shows a divider 3 between the frequency divider 2 and the circuit under test 4 in Figure 1.
In addition to inserting an I'LL circuit consisting of a phase detector 6 and a VCO 7, the position of the divide-by-nine frequency divider 3 between the pulse generator 1 and the sample-hold circuit 50 in FIG. It is connected to the sample and hold circuit 50 input.

VCO7はその出力の繰多返し周期をNT/Mにして被
測定回路4に供給する。VCO7の出力の一部は分周器
3に入シ、分周器5の出力はNTになる。したがって、
位相検波器6は分周器2の出力NTと分周器3の出力N
Tの位相差を検出し、VCO7の出力NT/Mが一定に
なるように制御する。
The VCO 7 sets the repetition period of its output to NT/M and supplies it to the circuit under test 4. A part of the output of the VCO 7 is input to the frequency divider 3, and the output of the frequency divider 5 becomes NT. therefore,
The phase detector 6 uses the output NT of the frequency divider 2 and the output N of the frequency divider 3.
The phase difference of T is detected and controlled so that the output NT/M of the VCO 7 is constant.

第6図の場合も第1図の場合と同じように、式(alの
関係が成り立つようにする。そして、A、K、M、Nは
それぞn整数でA≧1.に=定数であシ、かつN7Mが
M数にならないようにMとNの値を設定する。
In the case of FIG. 6, as in the case of FIG. Set the values of M and N so that the number of reeds and N7M does not become the number M.

次に、第3図の数値例を示す。第1図、第2図の場合と
条件を同じにするため、N=4095、M=64、A=
1、K=64とする。第3図の場合の分解能はT/Mで
あり1分解能を第1図の場合と同じa1μSとすnば、
M=64なのでT=6.4μsとなる。これは周波数に
換算すると、約156kH2である。また、VCO7の
繰シ返し周期はNT/Mなので、それぞれの値を代入す
ると(141msになる。これは周波数に換算すると約
2.4kHzである。すなわち、第5図のようにPLL
回路を採用すれば、パルス発生器1の繰シ返し周期は第
1図の数値例でT=r1.1μsに対し。
Next, a numerical example of FIG. 3 will be shown. In order to keep the conditions the same as those in Figures 1 and 2, N = 4095, M = 64, A =
1, K=64. The resolution in the case of Fig. 3 is T/M, and if one resolution is a1μS, which is the same as in the case of Fig. 1, then
Since M=64, T=6.4 μs. This is approximately 156 kHz when converted into frequency. Also, since the repetition period of VCO 7 is NT/M, substituting each value (141 ms). This is approximately 2.4 kHz when converted into frequency. In other words, as shown in Fig. 5, PLL
If the circuit is adopted, the repetition period of the pulse generator 1 is T=r1.1 μs in the numerical example of FIG.

第5図の数値例ではT=44−8になる。このため、第
3図のパルス発生器1の基準周波数を大幅に下げること
ができる。
In the numerical example of FIG. 5, T=44-8. Therefore, the reference frequency of the pulse generator 1 shown in FIG. 3 can be significantly lowered.

なお、第3図の波形例は第2図と同じになる。Note that the waveform example in FIG. 3 is the same as in FIG. 2.

(41発明の効果 この発明によ扛ば、従来方法に比べて低い周波数で高分
解能のサンプリングをすることができる。
(41) Effects of the Invention According to the present invention, high-resolution sampling can be performed at a lower frequency than in conventional methods.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来方法の構成図、 第2図は第1図による波形例、 第5図はこの発明による実施例の構成図。 1・・・・・・パルス発生器、2・・・・・・分周比N
の分周器。 6・・・・分周比Mの分周器、4・・・・・・被測定回
路、5・・・・・・サンプルホールド回路、6・・・・
・・位相検波器。 7・・・・・■CO 代理人  弁理士  小俣欽用 第1図 第2図 第3図
FIG. 1 is a block diagram of a conventional method, FIG. 2 is a waveform example according to FIG. 1, and FIG. 5 is a block diagram of an embodiment according to the present invention. 1... Pulse generator, 2... Frequency division ratio N
divider. 6... Frequency divider with frequency division ratio M, 4... Circuit under test, 5... Sample hold circuit, 6...
...Phase detector. 7...■CO Agent Patent Attorney Kinyo Omata Figure 1 Figure 2 Figure 3

Claims (1)

【特許請求の範囲】 1、 繰り返し周期Tのパルス発生器と、このパルス発
生器の出力から繰シ返し周期NTの出力を出す第1の分
局器と、 第1の分周器出力を第1の入力とする位相検波器と、 この位相検波器の出力を入力とするvCOと。 このvCOの出力を入力とし、その出力を前記位相検波
器の第2の入力とする分周比Mの第2の分局器と。 繰シ返し周期がNT/Mの前記vCO出力を被測定回路
を介して第1の入力とし、前記パルス発生器の出力を直
接筒2の入力とするサンプルホールド回路とを備え、 N=MxK−A。 ここにA、に、M%Nはそれぞれ整数でA≧1゜K一定
数とし、 かつN7Mが整数にならないようにMとNの値を設定す
ることを特徴とする繰シ返し波形′のサンプル方法。
[Claims] 1. A pulse generator with a repetition period T, a first divider that outputs an output with a repetition period NT from the output of this pulse generator, and a first frequency divider that outputs an output with a repetition period NT. A phase detector that takes the input as the input, and a vCO that takes the output of this phase detector as the input. a second divider with a frequency division ratio M, which takes the output of this vCO as an input and takes the output as a second input of the phase detector; A sample and hold circuit is provided, in which the vCO output with a repetition period of NT/M is used as a first input via the circuit under test, and the output of the pulse generator is directly input to the cylinder 2, N=MxK- A. Here, in A, there is a sample of a repetitive waveform characterized in that M%N is an integer and A≧1°K is a constant number, and the values of M and N are set so that N7M is not an integer. Method.
JP18143681A 1981-11-12 1981-11-12 Sampling method for repeated waveform Pending JPS5883274A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18143681A JPS5883274A (en) 1981-11-12 1981-11-12 Sampling method for repeated waveform

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18143681A JPS5883274A (en) 1981-11-12 1981-11-12 Sampling method for repeated waveform

Publications (1)

Publication Number Publication Date
JPS5883274A true JPS5883274A (en) 1983-05-19

Family

ID=16100736

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18143681A Pending JPS5883274A (en) 1981-11-12 1981-11-12 Sampling method for repeated waveform

Country Status (1)

Country Link
JP (1) JPS5883274A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS541667A (en) * 1977-06-06 1979-01-08 Shiyunichi Nozawa Digital receiver for waveform information

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS541667A (en) * 1977-06-06 1979-01-08 Shiyunichi Nozawa Digital receiver for waveform information

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