JPS5855327A - 半導体材料及びその製造方法 - Google Patents
半導体材料及びその製造方法Info
- Publication number
- JPS5855327A JPS5855327A JP56151423A JP15142381A JPS5855327A JP S5855327 A JPS5855327 A JP S5855327A JP 56151423 A JP56151423 A JP 56151423A JP 15142381 A JP15142381 A JP 15142381A JP S5855327 A JPS5855327 A JP S5855327A
- Authority
- JP
- Japan
- Prior art keywords
- silicon
- aluminum
- layer
- semiconductor
- hydrogen
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/40—Crystalline structures
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0021—Reactive sputtering or evaporation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/83—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge
- H10D62/834—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge further characterised by the dopants
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
- Photovoltaic Devices (AREA)
- Light Receiving Elements (AREA)
- Silicon Compounds (AREA)
- Chemical Vapour Deposition (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56151423A JPS5855327A (ja) | 1981-09-26 | 1981-09-26 | 半導体材料及びその製造方法 |
| PCT/JP1982/000386 WO1983001151A1 (fr) | 1981-09-26 | 1982-09-25 | Materiau semiconducteur et son procede de production |
| DE823249030T DE3249030T1 (de) | 1981-09-26 | 1982-09-25 | Halbleitermaterial und verfahren zu dessen herstellung |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56151423A JPS5855327A (ja) | 1981-09-26 | 1981-09-26 | 半導体材料及びその製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5855327A true JPS5855327A (ja) | 1983-04-01 |
| JPH0239087B2 JPH0239087B2 (Sortimente) | 1990-09-04 |
Family
ID=15518290
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56151423A Granted JPS5855327A (ja) | 1981-09-26 | 1981-09-26 | 半導体材料及びその製造方法 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPS5855327A (Sortimente) |
| WO (1) | WO1983001151A1 (Sortimente) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6021380A (ja) * | 1983-07-18 | 1985-02-02 | Nippon Telegr & Teleph Corp <Ntt> | 非晶質シリコン薄膜の作製方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5678413A (en) * | 1979-11-27 | 1981-06-27 | Konishiroku Photo Ind Co Ltd | Preparation of amorphous silicon |
| JPS56122123A (en) * | 1980-03-03 | 1981-09-25 | Shunpei Yamazaki | Semiamorphous semiconductor |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56104477A (en) * | 1980-01-16 | 1981-08-20 | Energy Conversion Devices Inc | Amorphous semiconductor equivalent to crystalline semiconductor and method of manufacturing same |
-
1981
- 1981-09-26 JP JP56151423A patent/JPS5855327A/ja active Granted
-
1982
- 1982-09-25 WO PCT/JP1982/000386 patent/WO1983001151A1/ja not_active Ceased
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5678413A (en) * | 1979-11-27 | 1981-06-27 | Konishiroku Photo Ind Co Ltd | Preparation of amorphous silicon |
| JPS56122123A (en) * | 1980-03-03 | 1981-09-25 | Shunpei Yamazaki | Semiamorphous semiconductor |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6021380A (ja) * | 1983-07-18 | 1985-02-02 | Nippon Telegr & Teleph Corp <Ntt> | 非晶質シリコン薄膜の作製方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0239087B2 (Sortimente) | 1990-09-04 |
| WO1983001151A1 (fr) | 1983-03-31 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Zhang et al. | Effects of annealing ZnO films prepared by ion-beam-assisted reactive deposition | |
| Fraser et al. | Sputter‐Deposited CdS Films with High Photoconductivity through Film Thickness | |
| CN105655434B (zh) | 一种基于氧化镓纳米线阵列的紫外探测器件及其制备方法 | |
| GB1602007A (en) | Amorphous silicon photovoltaic device having an insulating layer | |
| JPS5855327A (ja) | 半導体材料及びその製造方法 | |
| JPS6084716A (ja) | 透明導電性膜およびその作成方法 | |
| JPS5814582A (ja) | 高効率のアモルフアスシリコン系太陽電池 | |
| South et al. | The effects of adsorbed oxygen and hydrogen on the electrical properties of high purity cadmium sulphide films | |
| JPH0639707B2 (ja) | 薄膜形成装置 | |
| Kokado et al. | Photoconductivity of Zinc Oxide under Different Ambient Conditions | |
| Bhide et al. | Kinetics of oxygen chemisorption and its effects on electrical conductivity of thin evaporated CdS films | |
| Gopal et al. | Conduction studies on electrodeposited indium selenide thin films | |
| Yao et al. | Improved visible-light photochromism in Au/MoO3SnO2 thin films | |
| JPS5935016A (ja) | 含水素シリコン層の製造方法 | |
| Shirai et al. | Stability and hole-transport in a-Si: H prepared by “Chemical Annealing” | |
| Kumar | Hydrogen sulfide gas sensing properties of SnO2 thin films prepared by thermal evaporation technique | |
| JPS5844775A (ja) | アモルフアスシリコン半導体装置及びその製造方法 | |
| JPS5867021A (ja) | アモルフアスシリコン半導体装置の製造方法 | |
| CN117305773A (zh) | 一种热蒸发制备氧化镓薄膜的方法及其存储器应用 | |
| US20240088240A1 (en) | Solid oxygen ionic conductor based field-effect transistor and method of manufacturing the same | |
| Wendel et al. | Reversible Barrier Switching of ZnO/RuO2 Schottky Diodes. Materials 2021, 14, 2678 | |
| JPS58112045A (ja) | 薄膜形成方法 | |
| JPS5837973A (ja) | アモルフアスシリコン半導体装置及びその製造方法 | |
| JPS5867020A (ja) | アモルフアスシリコン半導体装置の製造方法 | |
| Lin | HUMIDITY, PHOTO-AND GAS SENSITIVITY OF ZINC OXIDE THIN FILM TRANSISTOR |