JPS5850744A - シリコンウエハ−の評価方法 - Google Patents
シリコンウエハ−の評価方法Info
- Publication number
- JPS5850744A JPS5850744A JP14700081A JP14700081A JPS5850744A JP S5850744 A JPS5850744 A JP S5850744A JP 14700081 A JP14700081 A JP 14700081A JP 14700081 A JP14700081 A JP 14700081A JP S5850744 A JPS5850744 A JP S5850744A
- Authority
- JP
- Japan
- Prior art keywords
- oxygen
- resistivity
- wafer
- sample
- amount
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14700081A JPS5850744A (ja) | 1981-09-19 | 1981-09-19 | シリコンウエハ−の評価方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14700081A JPS5850744A (ja) | 1981-09-19 | 1981-09-19 | シリコンウエハ−の評価方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5850744A true JPS5850744A (ja) | 1983-03-25 |
| JPH0472380B2 JPH0472380B2 (enExample) | 1992-11-18 |
Family
ID=15420310
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14700081A Granted JPS5850744A (ja) | 1981-09-19 | 1981-09-19 | シリコンウエハ−の評価方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5850744A (enExample) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6092782A (ja) * | 1983-10-24 | 1985-05-24 | アクシユネツト カンパニー | ゴルフボール |
| JPS60163674A (ja) * | 1984-02-07 | 1985-08-26 | 株式会社ブリヂストン | ゴルフボ−ル |
| JPS6156668A (ja) * | 1973-05-24 | 1986-03-22 | アクシユネツト・カンパニ− | 外周面にデインプルを有するゴルフボ−ルの製造方法 |
| JPS61284264A (ja) * | 1985-06-07 | 1986-12-15 | 住友ゴム工業株式会社 | ゴルフボ−ル |
| JPS63309282A (ja) * | 1987-04-27 | 1988-12-16 | アクシュネット カンパニー | 多数ディンプルゴルフボール |
| US5127655A (en) * | 1990-07-27 | 1992-07-07 | Sumitomo Rubber Industries, Ltd. | Golf ball |
-
1981
- 1981-09-19 JP JP14700081A patent/JPS5850744A/ja active Granted
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6156668A (ja) * | 1973-05-24 | 1986-03-22 | アクシユネツト・カンパニ− | 外周面にデインプルを有するゴルフボ−ルの製造方法 |
| JPS6092782A (ja) * | 1983-10-24 | 1985-05-24 | アクシユネツト カンパニー | ゴルフボール |
| JPS60163674A (ja) * | 1984-02-07 | 1985-08-26 | 株式会社ブリヂストン | ゴルフボ−ル |
| JPS61284264A (ja) * | 1985-06-07 | 1986-12-15 | 住友ゴム工業株式会社 | ゴルフボ−ル |
| JPS63309282A (ja) * | 1987-04-27 | 1988-12-16 | アクシュネット カンパニー | 多数ディンプルゴルフボール |
| US5127655A (en) * | 1990-07-27 | 1992-07-07 | Sumitomo Rubber Industries, Ltd. | Golf ball |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0472380B2 (enExample) | 1992-11-18 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP2295943A1 (en) | Radiation thermometer calibration | |
| Grundbacher | Causes of variation in serum IgE levels in normal populations | |
| US11467110B2 (en) | Method for operating a sensor device | |
| Wood et al. | An investigation of the stability of thermistors | |
| TW200804778A (en) | Thermometer calibration by immersion in non-electrically conductive liquid | |
| GB277025A (en) | Method of and means for determining the amount of a constituent in a mixture, more particularly of gases | |
| GB2181298A (en) | Platinum resistance thermometer and manufacture thereof | |
| CN106706165A (zh) | 一种温度测量的方法及装置 | |
| KR910003778A (ko) | 실리콘 결정 평가 방법과 반도체 장치 제조방법 | |
| JPS5850744A (ja) | シリコンウエハ−の評価方法 | |
| Pliskin et al. | Properties of insulating thin films deposited by RF sputtering | |
| JPH07260721A (ja) | 環境センサの等価回路、臭い圧測定方法、臭い圧基準化方法、臭い検知装置、及び火災検知装置 | |
| Bloodworth et al. | Use of thermistors for the measurement of soil moisture and temperature | |
| CN105841846B (zh) | Ntc热敏芯片的测试方法 | |
| WO2022216303A1 (en) | Gas sensor calibration method | |
| White | Specific heats of silicates and platinum | |
| US3726592A (en) | Method and apparatus for detecting moisture | |
| JPH01114727A (ja) | 放射温度測定装置 | |
| CN108180879B (zh) | 超薄二氧化硅薄膜样片的定值方法 | |
| Quintana et al. | Polysilicon thin film developed on ultra-thin flexible glass for temperature sensor | |
| JPH05273122A (ja) | シリコン結晶中不純物の赤外吸収測定方法 | |
| Sakurai et al. | Intercomparison of 12 standard platinum resistance thermometers between 13.8 K and 273.15 K | |
| JPH07226428A (ja) | シリコン結晶中の酸素析出量の評価方法 | |
| JPS57102009A (en) | Semiconductor device | |
| Jones et al. | The stability of polycrystalline silicon thin film resistors measured using excess noise |