JPS5839019A - Semiconductor die-bonding device - Google Patents

Semiconductor die-bonding device

Info

Publication number
JPS5839019A
JPS5839019A JP13677081A JP13677081A JPS5839019A JP S5839019 A JPS5839019 A JP S5839019A JP 13677081 A JP13677081 A JP 13677081A JP 13677081 A JP13677081 A JP 13677081A JP S5839019 A JPS5839019 A JP S5839019A
Authority
JP
Japan
Prior art keywords
die
mounting
controller
mount
amount
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13677081A
Other languages
Japanese (ja)
Inventor
Toshihiro Kato
加藤 俊博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP13677081A priority Critical patent/JPS5839019A/en
Publication of JPS5839019A publication Critical patent/JPS5839019A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/75Apparatus for connecting with bump connectors or layer connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/8319Arrangement of the layer connectors prior to mounting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/838Bonding techniques
    • H01L2224/8385Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01082Lead [Pb]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/06Polymers
    • H01L2924/078Adhesive characteristics other than chemical
    • H01L2924/07802Adhesive characteristics other than chemical not being an ohmic electrical conductor

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Die Bonding (AREA)

Abstract

PURPOSE:To increase the positional accuracy of die-bonding by a method wherein a device, with which the position and the condition of the die-bonding after mounting are automatically detected, is provided and the amount of detection is computed and fed back. CONSTITUTION:Die-mounting parts 10a and 10a' are fed at equal intervals. A mounting agent injection head 2 is provided on a die-mounting section 10a in the state wherein a lead frame 1 is at a standstill, and a controller 3 for mounting agent injection quantity, which comes down when the mounting agent is injected, is provided, a mount head 4 is attached on an XY table 4a, picks up a die 11 located on another table 5 and carried it to the die-mounting part 10a'. An ITV camera 6 is installed on a die-mounting part 10a'' which is located after several die-mounting parts. The position where a die is mounted, the quantity of mounting agent and the deffective mounting of a die are detected and the result is inputted to a central controller 7, an arithmetic oprational processing is performed on the above data, and the mounting agent injection quantity of the controller 3 and the amount of performance of the mount head 4 are corrected by performing a feed back.

Description

【発明の詳細な説明】 この発明は半導体ダイボンディング装置に関するO 従来の自動ダイボンディング装置ではダイマウント後の
位置やダイ欠は等の不良は人が定時にチェックしていた
。しかし、値上のチェックは人がダイマウント後の状態
につき視認するものなので装置における熱的変動や機械
的変動、その他の影響による変動をただちにチェックで
きない。このため、ある定時のチェックから次のチェッ
クまでの間にかなりの不良が連続して発生することがし
ばしば見られていた。また、低い発生率で生ずるような
不良についてはチェックできないのでそのまま流れて品
質の低下をまねくようなこともある。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a semiconductor die bonding apparatus. In conventional automatic die bonding apparatuses, defects such as the position of the die after mounting and defects such as missing dies are checked by humans at regular intervals. However, since the value check is a visual check of the state after die mounting, it is not possible to immediately check for fluctuations due to thermal fluctuations, mechanical fluctuations, or other influences in the equipment. For this reason, it has often been seen that a considerable number of defects occur continuously between one regular check and the next check. Furthermore, since it is not possible to check defects that occur at a low rate of occurrence, they may continue to occur and cause a decline in quality.

この発明は上記従来の欠点に鑑みてなされたもので、自
動の半導体ダイボンディング装置に対しマウントされた
のちの位置、状態を自動認識する装置を設け、検出量を
演算しフィードバックさせるようにしたものである。
This invention has been made in view of the above-mentioned conventional drawbacks, and is provided with a device that automatically recognizes the position and state of a semiconductor die bonding device after it has been mounted, and calculates and feeds back the detected amount. It is.

以下にこの発明を1実施例につき図面を参照して詳細に
説明する。第1図はl実施例の要部を示すもので、(1
)はリードフレーム翰搬送部で、リードフレームに等間
隔に設けられているダイマウン) @ (10m)、(
10m)・−・を上記間隔ずつ送る。そして、リードフ
レームが停止した状態での1つのダイマウント部(10
m)上にマウント剤注加ヘッド(2)が設けられ、この
ヘッドは昇降機構(図示省略)によってマウント剤注加
時に下降すると同時にマウント剤注加量のコントローラ
(3)を有し、この動作ハのちに述べる中央コントロー
ラの指令によって補正される。次に(4)はマウントヘ
ッドで、前記マウント剤注加ヘッド(2)からダイマウ
ント部でいくつか後のダイマウント部(10a’)上に
あって、XYテーブル(4m)上に取着されかつ、別の
XYテーブル(5)上のダイat+を支持してダイマウ
ント部(10a)上に搬送する機能1.すなわち上昇位
にて往動しダイ上に至り、ここで下降してダイaυを吸
引支持したのち上昇してダイマウント部(10a’)上
に至り下降してこのダイをダイマウント部上に載置する
機能を備える。また、前記マウントヘッド(4)の動作
はのちに述べる中央コントローラの指令によって動作量
の補正が施される。さらに、マウントヘッド(4)から
いくつか後のダイマウント部(10a’)上にITVカ
メラ(6)を備える。このITVカメラはビジコン、力
)L/ : :ff 7、CCD(Charge Co
upled Device )等のいずれでもよく、ダ
イかマウントされた位置、マウント剤の量、マウント不
良を検出して中央コントローラ(7)(マイコン)に入
れ、そのデーターを演算処理してマウント剤注加量のコ
ントローラ(3)とマウントヘッド(4)の動作量とに
補正を加えるフィードバックが施される。なお、前記マ
ウント位置の補正は最適のマウント位置からのずれ、Δ
X、Δy、Δ0を演算処理し、それに応じた値をデジタ
ルに補正量としてフィードバックさせるが、より高い精
度にするためには前後3回のデータをメモリさせ、2乗
収束を行なわせる演算処理を施すことは有効である。次
にマウント剤の量をコントロールするには1例えばディ
スペンサーを用いるエポキシマウントの場合、ディスペ
ンス時間をコントロールすればよい。また、他の検出項
目としてダイの欠け、表面きず、汚れなどは発生率が設
定値以上になった場合には装置の稼動が停止するか、異
常警報、ランプ表示等が中央コントロールから発令され
るようになっている。
Hereinafter, one embodiment of the present invention will be explained in detail with reference to the drawings. Figure 1 shows the main part of the l embodiment, (1
) is the lead frame conveyor section, and the die mounts provided at equal intervals on the lead frame) @ (10m), (
10m)... by the above interval. Then, one die mount part (10
m) is provided with a mounting agent injection head (2), which is lowered by an elevating mechanism (not shown) when injecting the mounting agent, and at the same time has a controller (3) for controlling the amount of mounting agent to be injected. C. Correction is made by commands from the central controller, which will be described later. Next, (4) is a mount head, which is located on the die mount part (10a') a few steps behind the mount agent injection head (2) in the die mount part, and is mounted on the XY table (4 m). and the function of supporting the die at+ on another XY table (5) and transporting it onto the die mount section (10a). That is, it moves forward in the ascending position and reaches above the die, then descends and supports the die aυ by suction, then rises and reaches above the die mount part (10a'), descends and places this die on the die mount part. It has the function of placing Further, the operation amount of the mount head (4) is corrected by a command from a central controller, which will be described later. Further, an ITV camera (6) is provided on the die mount section (10a') some distance behind the mount head (4). This ITV camera is a charge co, L/: :ff 7, CCD
It can detect the mounted position of the die, the amount of mounting agent, and the mounting failure, and input it to the central controller (7) (microcomputer), which processes the data and calculates the amount of mounting agent to be injected. Feedback is provided to correct the amount of movement of the controller (3) and the mount head (4). Note that the correction of the mount position is based on the deviation from the optimal mount position, Δ
X, Δy, Δ0 are computed and the corresponding values are digitally fed back as correction amounts, but in order to achieve higher accuracy, the data of the previous and previous three times are memorized and arithmetic processing is performed to perform square convergence. It is effective to do so. Next, in order to control the amount of the mounting agent, for example, in the case of epoxy mounting using a dispenser, the dispensing time may be controlled. In addition, if the occurrence rate of other detection items such as die chips, surface scratches, and dirt exceeds a set value, the equipment will stop operating, or an abnormality alarm, lamp display, etc. will be issued from the central control. It looks like this.

この発明によればダイボンディングの位置精度が向上す
るので高集積化に対応でき有効である。
According to the present invention, the positional accuracy of die bonding is improved, so that it is effective in responding to high integration.

また、不良の検出とデータのフィードバックにより歩留
の顕著な向上ができるとともに信頼性の向上にもつなが
る。さらに人手を要せずに自己判断できるので装置の完
全自動化(無人化)が達成できる。
In addition, defect detection and data feedback can significantly improve yield and lead to improved reliability. Furthermore, since the system can make self-judgments without requiring any human intervention, complete automation (unmanned equipment) can be achieved.

【図面の簡単な説明】[Brief explanation of drawings]

図はこの発明の1実施例の斜視図を示す。 l      リードフレーム搬送部 2     マウント剤注加ヘッド 3    7、ラント剤注加量のコントローラ4   
 マウントヘッド 4m、5   XYテーブル 6     ITVカメラ 7    中央コントローラ 10      リードフレーム 10a 、 10a 、 10a    ダイマウント
部代理人 弁理士 井 上 −男
The figure shows a perspective view of one embodiment of the invention. l Lead frame conveyance section 2 Mounting agent injection head 3 7, controller 4 for the amount of lant agent injection
Mount head 4m, 5 XY table 6 ITV camera 7 Central controller 10 Lead frame 10a, 10a, 10a Die mount department representative Patent attorney Mr. Inoue

Claims (1)

【特許請求の範囲】[Claims] 半導体用ダイボンダーにおいて、マウ′ントされた状態
を自己認識するための検出器のITVを備えてマウント
の位置、マウント剤の量、マウント不良を検出し、その
、検出データに基づいてマイコンで演算処理を施し、マ
ウントヘッドのコントローラーと、マウント剤注加ヘッ
ドのコントローラにフィードバックさせることを特徴と
する半導体ダイボンディング装置。
A die bonder for semiconductors is equipped with an ITV detector to self-recognize the mounted state, and detects the mount position, amount of mounting agent, and mount failure, and a microcomputer performs arithmetic processing based on the detected data. A semiconductor die bonding apparatus characterized in that the feedback is provided to a controller of a mounting head and a controller of a mounting agent injection head.
JP13677081A 1981-08-31 1981-08-31 Semiconductor die-bonding device Pending JPS5839019A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13677081A JPS5839019A (en) 1981-08-31 1981-08-31 Semiconductor die-bonding device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13677081A JPS5839019A (en) 1981-08-31 1981-08-31 Semiconductor die-bonding device

Publications (1)

Publication Number Publication Date
JPS5839019A true JPS5839019A (en) 1983-03-07

Family

ID=15183102

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13677081A Pending JPS5839019A (en) 1981-08-31 1981-08-31 Semiconductor die-bonding device

Country Status (1)

Country Link
JP (1) JPS5839019A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59128735U (en) * 1983-02-17 1984-08-30 新日本無線株式会社 Semiconductor chip bonding equipment
JPS60227431A (en) * 1984-04-26 1985-11-12 Fujitsu Ltd Inspecting device of die bonding state
JPS60262432A (en) * 1984-06-11 1985-12-25 Toshiba Corp Mounting system

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59128735U (en) * 1983-02-17 1984-08-30 新日本無線株式会社 Semiconductor chip bonding equipment
JPH027466Y2 (en) * 1983-02-17 1990-02-22
JPS60227431A (en) * 1984-04-26 1985-11-12 Fujitsu Ltd Inspecting device of die bonding state
JPS60262432A (en) * 1984-06-11 1985-12-25 Toshiba Corp Mounting system

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