JPS58223323A - 電子ビ−ム描画装置 - Google Patents

電子ビ−ム描画装置

Info

Publication number
JPS58223323A
JPS58223323A JP10716582A JP10716582A JPS58223323A JP S58223323 A JPS58223323 A JP S58223323A JP 10716582 A JP10716582 A JP 10716582A JP 10716582 A JP10716582 A JP 10716582A JP S58223323 A JPS58223323 A JP S58223323A
Authority
JP
Japan
Prior art keywords
cathode
electron
image
beams
mask
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10716582A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0415609B2 (enrdf_load_stackoverflow
Inventor
Isao Sasaki
勲 佐々木
Tadahiro Takigawa
忠宏 滝川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP10716582A priority Critical patent/JPS58223323A/ja
Publication of JPS58223323A publication Critical patent/JPS58223323A/ja
Publication of JPH0415609B2 publication Critical patent/JPH0415609B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/3002Details
    • H01J37/3007Electron or ion-optical systems

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
JP10716582A 1982-06-22 1982-06-22 電子ビ−ム描画装置 Granted JPS58223323A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10716582A JPS58223323A (ja) 1982-06-22 1982-06-22 電子ビ−ム描画装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10716582A JPS58223323A (ja) 1982-06-22 1982-06-22 電子ビ−ム描画装置

Publications (2)

Publication Number Publication Date
JPS58223323A true JPS58223323A (ja) 1983-12-24
JPH0415609B2 JPH0415609B2 (enrdf_load_stackoverflow) 1992-03-18

Family

ID=14452128

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10716582A Granted JPS58223323A (ja) 1982-06-22 1982-06-22 電子ビ−ム描画装置

Country Status (1)

Country Link
JP (1) JPS58223323A (enrdf_load_stackoverflow)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5332677A (en) * 1976-09-08 1978-03-28 Toshiba Corp Electron beam exposure apparatus
JPS5648029A (en) * 1979-09-26 1981-05-01 Toshiba Corp Electron gun
JPS56132736A (en) * 1980-03-21 1981-10-17 Toshiba Corp Electron gun

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5332677A (en) * 1976-09-08 1978-03-28 Toshiba Corp Electron beam exposure apparatus
JPS5648029A (en) * 1979-09-26 1981-05-01 Toshiba Corp Electron gun
JPS56132736A (en) * 1980-03-21 1981-10-17 Toshiba Corp Electron gun

Also Published As

Publication number Publication date
JPH0415609B2 (enrdf_load_stackoverflow) 1992-03-18

Similar Documents

Publication Publication Date Title
EP1279183B1 (en) A nanotube-based electron emission device and systems using the same
US6410923B1 (en) Magnetic lens apparatus for use in high-resolution scanning electron microscopes and lithographic processes
US4853545A (en) Particle beam apparatus for low-error imaging of line-shaped subjects
US7189979B2 (en) Electron gun
US6392333B1 (en) Electron gun having magnetic collimator
JP2004534360A (ja) 電子線装置及びその電子線装置を用いたデバイスの製造方法
JP3658235B2 (ja) 電子銃および電子銃を用いた描画装置および電子線応用装置
TWI620223B (zh) 具有整合式多極電極結構之電子發射體裝置
JP2777840B2 (ja) 電子線装置
JPS58223323A (ja) 電子ビ−ム描画装置
US3978338A (en) Illumination system in a scanning electron microscope
US4570072A (en) Electromagnetic lens polepiece structure
JP2005174568A (ja) 対物レンズ、電子線装置及びこれらを用いたデバイス製造方法
JPH0654643B2 (ja) 電界放射型電子銃用レンズ
JPH11224846A (ja) レチクル照明光学系
JPH0129021B2 (enrdf_load_stackoverflow)
JP2007123599A (ja) 荷電粒子線レンズアレイ及び該レンズアレイを用いた荷電粒子線露光装置
JP3492978B2 (ja) 半導体集積回路の製造方法
JP2002141010A (ja) 電子線装置及びその電子線装置を用いたデバイスの製造方法
JPH0131256B2 (enrdf_load_stackoverflow)
JPH0451438A (ja) 電子ビーム露光装置及び露光方法
JPH0128450B2 (enrdf_load_stackoverflow)
JPS58209844A (ja) 電界電離型イオン源
JP7734851B2 (ja) 荷電粒子源、荷電粒子銃、荷電粒子ビーム装置
JP7168269B2 (ja) エミッタ、それを用いた電子銃、それを用いた電子機器、および、その製造方法