JPS58210546A - 結晶の面方位測定方法及び装置 - Google Patents
結晶の面方位測定方法及び装置Info
- Publication number
- JPS58210546A JPS58210546A JP9392182A JP9392182A JPS58210546A JP S58210546 A JPS58210546 A JP S58210546A JP 9392182 A JP9392182 A JP 9392182A JP 9392182 A JP9392182 A JP 9392182A JP S58210546 A JPS58210546 A JP S58210546A
- Authority
- JP
- Japan
- Prior art keywords
- crystal
- peak intensity
- plane
- phonon
- raman
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
Landscapes
- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9392182A JPS58210546A (ja) | 1982-06-01 | 1982-06-01 | 結晶の面方位測定方法及び装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9392182A JPS58210546A (ja) | 1982-06-01 | 1982-06-01 | 結晶の面方位測定方法及び装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58210546A true JPS58210546A (ja) | 1983-12-07 |
JPH0116378B2 JPH0116378B2 (enrdf_load_stackoverflow) | 1989-03-24 |
Family
ID=14095913
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9392182A Granted JPS58210546A (ja) | 1982-06-01 | 1982-06-01 | 結晶の面方位測定方法及び装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58210546A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4747684A (en) * | 1986-09-30 | 1988-05-31 | The United States Of America As Represented By The Secretary Of The Army | Method of and apparatus for real-time crystallographic axis orientation determination |
GB2419944A (en) * | 2003-09-05 | 2006-05-10 | Nat Inst Of Advanced Ind Scien | Optical measurement method and device |
-
1982
- 1982-06-01 JP JP9392182A patent/JPS58210546A/ja active Granted
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4747684A (en) * | 1986-09-30 | 1988-05-31 | The United States Of America As Represented By The Secretary Of The Army | Method of and apparatus for real-time crystallographic axis orientation determination |
GB2419944A (en) * | 2003-09-05 | 2006-05-10 | Nat Inst Of Advanced Ind Scien | Optical measurement method and device |
GB2419944B (en) * | 2003-09-05 | 2007-05-16 | Nat Inst Of Advanced Ind Scien | Optical measurement method and device |
US7408635B2 (en) | 2003-09-05 | 2008-08-05 | National Institute Of Advanced Industrial Science And Technology | Optical measurement method and device |
Also Published As
Publication number | Publication date |
---|---|
JPH0116378B2 (enrdf_load_stackoverflow) | 1989-03-24 |
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