JPS58204462A - 質量分析計におけるイオン源装置 - Google Patents
質量分析計におけるイオン源装置Info
- Publication number
- JPS58204462A JPS58204462A JP57086850A JP8685082A JPS58204462A JP S58204462 A JPS58204462 A JP S58204462A JP 57086850 A JP57086850 A JP 57086850A JP 8685082 A JP8685082 A JP 8685082A JP S58204462 A JPS58204462 A JP S58204462A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- electrode
- emitter
- ionization
- mass spectrometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Sources, Ion Sources (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57086850A JPS58204462A (ja) | 1982-05-22 | 1982-05-22 | 質量分析計におけるイオン源装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57086850A JPS58204462A (ja) | 1982-05-22 | 1982-05-22 | 質量分析計におけるイオン源装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58204462A true JPS58204462A (ja) | 1983-11-29 |
| JPH0232749B2 JPH0232749B2 (cg-RX-API-DMAC7.html) | 1990-07-23 |
Family
ID=13898282
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57086850A Granted JPS58204462A (ja) | 1982-05-22 | 1982-05-22 | 質量分析計におけるイオン源装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58204462A (cg-RX-API-DMAC7.html) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2021033318A1 (ja) * | 2019-08-22 | 2021-02-25 | 株式会社島津製作所 | ガスクロマトグラフ質量分析計および質量分析方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51136189U (cg-RX-API-DMAC7.html) * | 1975-04-25 | 1976-11-02 | ||
| JPS5297785A (en) * | 1976-02-13 | 1977-08-16 | Hitachi Ltd | Ion source device |
-
1982
- 1982-05-22 JP JP57086850A patent/JPS58204462A/ja active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51136189U (cg-RX-API-DMAC7.html) * | 1975-04-25 | 1976-11-02 | ||
| JPS5297785A (en) * | 1976-02-13 | 1977-08-16 | Hitachi Ltd | Ion source device |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2021033318A1 (ja) * | 2019-08-22 | 2021-02-25 | 株式会社島津製作所 | ガスクロマトグラフ質量分析計および質量分析方法 |
| JPWO2021033318A1 (cg-RX-API-DMAC7.html) * | 2019-08-22 | 2021-02-25 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0232749B2 (cg-RX-API-DMAC7.html) | 1990-07-23 |
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