JPH0232749B2 - - Google Patents
Info
- Publication number
- JPH0232749B2 JPH0232749B2 JP57086850A JP8685082A JPH0232749B2 JP H0232749 B2 JPH0232749 B2 JP H0232749B2 JP 57086850 A JP57086850 A JP 57086850A JP 8685082 A JP8685082 A JP 8685082A JP H0232749 B2 JPH0232749 B2 JP H0232749B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- emitter
- ion source
- repeller
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Sources, Ion Sources (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57086850A JPS58204462A (ja) | 1982-05-22 | 1982-05-22 | 質量分析計におけるイオン源装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57086850A JPS58204462A (ja) | 1982-05-22 | 1982-05-22 | 質量分析計におけるイオン源装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58204462A JPS58204462A (ja) | 1983-11-29 |
| JPH0232749B2 true JPH0232749B2 (cg-RX-API-DMAC7.html) | 1990-07-23 |
Family
ID=13898282
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57086850A Granted JPS58204462A (ja) | 1982-05-22 | 1982-05-22 | 質量分析計におけるイオン源装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58204462A (cg-RX-API-DMAC7.html) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPWO2021033318A1 (cg-RX-API-DMAC7.html) * | 2019-08-22 | 2021-02-25 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51136189U (cg-RX-API-DMAC7.html) * | 1975-04-25 | 1976-11-02 | ||
| JPS5843862B2 (ja) * | 1976-02-13 | 1983-09-29 | 株式会社日立製作所 | イオン源装置 |
-
1982
- 1982-05-22 JP JP57086850A patent/JPS58204462A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58204462A (ja) | 1983-11-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Vestal | Methods of ion generation | |
| CN1961403B (zh) | 碳纳米管电子电离源 | |
| US7193206B2 (en) | Ambient pressure matrix-assisted laser desorption ionization (MALDI) apparatus and method of analysis | |
| US6515279B1 (en) | Device and method for alternating operation of multiple ion sources | |
| JPS5935347A (ja) | イオン生成装置 | |
| US6969848B2 (en) | Method of chemical ionization at reduced pressures | |
| US4888482A (en) | Atmospheric pressure ionization mass spectrometer | |
| JPH0512664B2 (cg-RX-API-DMAC7.html) | ||
| JP4415490B2 (ja) | 液体クロマトグラフ質量分析装置 | |
| US4988869A (en) | Method and apparatus for electron-induced dissociation of molecular species | |
| US4388531A (en) | Ionizer having interchangeable ionization chamber | |
| JP3300602B2 (ja) | 大気圧イオン化イオントラップ質量分析方法及び装置 | |
| JP2019530165A (ja) | イオン汚染を制御するための方法およびシステム | |
| US4159423A (en) | Chemical ionization ion source | |
| US4166952A (en) | Method and apparatus for the elemental analysis of solids | |
| US20060273254A1 (en) | Method and apparatus for ionization via interaction with metastable species | |
| JPH06215729A (ja) | 質量分析計 | |
| US20180114684A1 (en) | Ion Current On-Off Switching Method and Device | |
| US4808819A (en) | Mass spectrometric apparatus | |
| JPH0232749B2 (cg-RX-API-DMAC7.html) | ||
| US11217437B2 (en) | Electron capture dissociation (ECD) utilizing electron beam generated low energy electrons | |
| US11658020B2 (en) | Ion source assembly with multiple ionization volumes for use in a mass spectrometer | |
| JP3559736B2 (ja) | 質量分析計 | |
| JP3691522B2 (ja) | 液体クロマトグラフ質量分析計 | |
| JP7497779B2 (ja) | 質量分析装置 |