JPS58187830A - 波長板測定装置 - Google Patents

波長板測定装置

Info

Publication number
JPS58187830A
JPS58187830A JP7070382A JP7070382A JPS58187830A JP S58187830 A JPS58187830 A JP S58187830A JP 7070382 A JP7070382 A JP 7070382A JP 7070382 A JP7070382 A JP 7070382A JP S58187830 A JPS58187830 A JP S58187830A
Authority
JP
Japan
Prior art keywords
light beam
wave plate
wavelength plate
polarizing prism
optical axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7070382A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0464019B2 (enrdf_load_stackoverflow
Inventor
Kaneyasu Ookawa
金保 大川
Masaomi Sugawara
菅原　正臣
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp, Olympus Optical Co Ltd filed Critical Olympus Corp
Priority to JP7070382A priority Critical patent/JPS58187830A/ja
Publication of JPS58187830A publication Critical patent/JPS58187830A/ja
Publication of JPH0464019B2 publication Critical patent/JPH0464019B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP7070382A 1982-04-27 1982-04-27 波長板測定装置 Granted JPS58187830A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7070382A JPS58187830A (ja) 1982-04-27 1982-04-27 波長板測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7070382A JPS58187830A (ja) 1982-04-27 1982-04-27 波長板測定装置

Publications (2)

Publication Number Publication Date
JPS58187830A true JPS58187830A (ja) 1983-11-02
JPH0464019B2 JPH0464019B2 (enrdf_load_stackoverflow) 1992-10-13

Family

ID=13439222

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7070382A Granted JPS58187830A (ja) 1982-04-27 1982-04-27 波長板測定装置

Country Status (1)

Country Link
JP (1) JPS58187830A (enrdf_load_stackoverflow)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4946485A (enrdf_load_stackoverflow) * 1972-09-06 1974-05-04
JPS5083071A (enrdf_load_stackoverflow) * 1973-11-12 1975-07-04

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4946485A (enrdf_load_stackoverflow) * 1972-09-06 1974-05-04
JPS5083071A (enrdf_load_stackoverflow) * 1973-11-12 1975-07-04

Also Published As

Publication number Publication date
JPH0464019B2 (enrdf_load_stackoverflow) 1992-10-13

Similar Documents

Publication Publication Date Title
JP2629948B2 (ja) エンコーダー
JPH073344B2 (ja) エンコ−ダ−
US4453828A (en) Apparatus and methods for measuring the optical thickness and index of refraction of thin, optical membranes
JPS61259127A (ja) 干渉式楕円偏光計
JPH045922B2 (enrdf_load_stackoverflow)
JPH05157583A (ja) ロータリーエンコーダ
JPS58187830A (ja) 波長板測定装置
JP2636863B2 (ja) 偏光装置
JP2000241143A (ja) 角度センサ
SU587325A1 (ru) Пол ризационное устройство дл измерени углов скручивани объекта
JP2954635B2 (ja) 偏波面保存光ファイバのクロストーク測定器
SU1721437A1 (ru) Способ измерени угловых смещений объекта и устройство дл его осуществлени
JP2691899B2 (ja) 干渉計
JP2521324Y2 (ja) 干渉計
SU708281A1 (ru) Фотоэлектрический автоколлиматор
JP3314525B2 (ja) 波面分割素子
JPH04155260A (ja) 回転速度測定装置
JPH0599612A (ja) レーザ干渉計
SU1021959A1 (ru) Устройство дл измерени пол ризационных характеристик анизотропных сред
JP2629606B2 (ja) エンコーダー
JP2002504716A (ja) 線形コノスコピックホログラフィー
JP3517506B2 (ja) 光学式変位測定装置
JP2600783B2 (ja) 光学装置
JPH0439025B2 (enrdf_load_stackoverflow)
SU1060938A1 (ru) Устройство дл измерени угла поворота объекта