JPS58169001A - ２方向タツチセンサ - Google Patents

２方向タツチセンサ

Info

Publication number
JPS58169001A
JPS58169001A JP57052825A JP5282582A JPS58169001A JP S58169001 A JPS58169001 A JP S58169001A JP 57052825 A JP57052825 A JP 57052825A JP 5282582 A JP5282582 A JP 5282582A JP S58169001 A JPS58169001 A JP S58169001A
Authority
JP
Japan
Prior art keywords
contact
touch sensor
probe
probe shaft
shaft
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57052825A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0239721B2 (enrdf_load_stackoverflow
Inventor
Takeshi Yamamoto
武 山本
Hideo Sakata
坂田　秀夫
Iwao Sugizaki
杉崎　岩男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsutoyo Manufacturing Co Ltd
Original Assignee
Mitsutoyo Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsutoyo Manufacturing Co Ltd filed Critical Mitsutoyo Manufacturing Co Ltd
Priority to JP57052825A priority Critical patent/JPS58169001A/ja
Priority to PCT/JP1983/000096 priority patent/WO1983003467A1/ja
Priority to GB08327749A priority patent/GB2139357B/en
Priority to DE19833338695 priority patent/DE3338695C2/de
Publication of JPS58169001A publication Critical patent/JPS58169001A/ja
Priority to US06/557,293 priority patent/US4561190A/en
Publication of JPH0239721B2 publication Critical patent/JPH0239721B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/002—Constructional details of contacts for gauges actuating one or more contacts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
JP57052825A 1982-03-31 1982-03-31 ２方向タツチセンサ Granted JPS58169001A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP57052825A JPS58169001A (ja) 1982-03-31 1982-03-31 ２方向タツチセンサ
PCT/JP1983/000096 WO1983003467A1 (en) 1982-03-31 1983-03-29 Bi-directional touch sensor
GB08327749A GB2139357B (en) 1982-03-31 1983-03-29 Bi-directional touch sensor
DE19833338695 DE3338695C2 (de) 1982-03-31 1983-03-29 Zweirichtungs-Tastvorrichtung
US06/557,293 US4561190A (en) 1982-03-31 1983-11-22 Two-directional touch sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57052825A JPS58169001A (ja) 1982-03-31 1982-03-31 ２方向タツチセンサ

Publications (2)

Publication Number Publication Date
JPS58169001A true JPS58169001A (ja) 1983-10-05
JPH0239721B2 JPH0239721B2 (enrdf_load_stackoverflow) 1990-09-06

Family

ID=12925626

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57052825A Granted JPS58169001A (ja) 1982-03-31 1982-03-31 ２方向タツチセンサ

Country Status (5)

Country Link
US (1) US4561190A (enrdf_load_stackoverflow)
JP (1) JPS58169001A (enrdf_load_stackoverflow)
DE (1) DE3338695C2 (enrdf_load_stackoverflow)
GB (1) GB2139357B (enrdf_load_stackoverflow)
WO (1) WO1983003467A1 (enrdf_load_stackoverflow)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4509266A (en) * 1982-06-14 1985-04-09 Gte Valeron Corporation Touch probe
SE450172B (sv) * 1985-10-18 1987-06-09 Carl Urban Ungerstedt Anordning for att kompensera for glapp i ett metsystem
EP0342770B1 (en) * 1986-03-04 1994-05-18 Rank Taylor Hobson Limited Metrological apparatus
DE3701730A1 (de) * 1987-01-22 1988-08-04 Haff & Schneider Tastmessgeraet
JPH0799328B2 (ja) * 1987-04-16 1995-10-25 株式会社メトロ−ル タツチセンサ
US5212646A (en) * 1987-12-19 1993-05-18 Renishaw Plc Method of using a mounting for surface-sensing stylus
GB8729638D0 (en) * 1987-12-19 1988-02-03 Renishaw Plc Mounting for surface sensing device
GB8803847D0 (en) * 1988-02-18 1988-03-16 Renishaw Plc Mounting for surface-sensing device
US5152072A (en) * 1988-02-18 1992-10-06 Renishaw Plc Surface-sensing device
DE3885274T2 (de) * 1988-07-01 1994-05-19 Metrol Co Kontaktfühler.
GB8815984D0 (en) * 1988-07-05 1988-08-10 Univ Brunel Probes
US5189806A (en) * 1988-12-19 1993-03-02 Renishaw Plc Method of and apparatus for scanning the surface of a workpiece
DE3904767A1 (de) * 1989-02-14 1990-09-27 Schmidt & Haensch Franz Abtastkopf
DE69003429T2 (de) * 1989-04-14 1994-01-20 Renishaw Plc Tastkopf.
DE69003149T2 (de) * 1989-04-14 1994-01-05 Renishaw Plc Tastkopf.
US5351125A (en) * 1993-03-29 1994-09-27 Moore Products, Inc. Gaging finger for precision measuring instruments
FR2778738B1 (fr) * 1998-05-14 2000-07-21 Rech Etude Materiel Ind Remi Dispositif de controle de positionnement et de centrage d'une piece
JP3834817B2 (ja) * 2003-05-30 2006-10-18 株式会社東京精密 測定ヘッド

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5417989U (enrdf_load_stackoverflow) * 1977-07-08 1979-02-05

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE899268C (de) * 1942-01-28 1953-12-10 Bauer & Schaurte Grenzkontaktlehre
FR1183412A (fr) * 1957-09-26 1959-07-07 Cie Crouzet Palpeur de contrôle à grande sensibilité
US3235222A (en) * 1961-07-21 1966-02-15 Claude H Nickell Tracer equipment
DD99221A1 (enrdf_load_stackoverflow) * 1972-04-06 1973-07-20
US3922791A (en) * 1974-09-16 1975-12-02 Westinghouse Electric Corp Profile indicating apparatus displaceable either along an axis or in a plane perpendicular thereto
JPS5249865U (enrdf_load_stackoverflow) * 1975-10-06 1977-04-08
JPS5249865A (en) * 1975-10-17 1977-04-21 Seiko Epson Corp Electronic watch
GB1593050A (en) * 1976-09-30 1981-07-15 Renishaw Electrical Ltd Contact sensing probe
US4136458A (en) * 1976-10-01 1979-01-30 The Bendix Corporation Bi-axial probe
GB2009351B (en) * 1977-12-06 1982-05-26 Poclain Sa Device for the rotary assembly of a member controlled by pressurised fluid
JPS5653401A (en) * 1979-10-05 1981-05-13 Osaka Kiko Co Ltd Three dimensional type contact detector

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5417989U (enrdf_load_stackoverflow) * 1977-07-08 1979-02-05

Also Published As

Publication number Publication date
DE3338695C2 (de) 1986-05-07
US4561190A (en) 1985-12-31
WO1983003467A1 (en) 1983-10-13
JPH0239721B2 (enrdf_load_stackoverflow) 1990-09-06
GB2139357B (en) 1985-10-23
GB8327749D0 (en) 1983-11-16
GB2139357A (en) 1984-11-07
DE3338695T1 (de) 1984-04-05

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