JPS5816525A - Liquid phase epitaxial growth - Google Patents

Liquid phase epitaxial growth

Info

Publication number
JPS5816525A
JPS5816525A JP56114447A JP11444781A JPS5816525A JP S5816525 A JPS5816525 A JP S5816525A JP 56114447 A JP56114447 A JP 56114447A JP 11444781 A JP11444781 A JP 11444781A JP S5816525 A JPS5816525 A JP S5816525A
Authority
JP
Japan
Prior art keywords
substrate
growth
crystal
crystal growth
hight
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56114447A
Other languages
Japanese (ja)
Inventor
Yukio Watanabe
幸雄 渡辺
Naoto Mogi
茂木 直人
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP56114447A priority Critical patent/JPS5816525A/en
Publication of JPS5816525A publication Critical patent/JPS5816525A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B19/00Liquid-phase epitaxial-layer growth
    • C30B19/12Liquid-phase epitaxial-layer growth characterised by the substrate

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
  • Semiconductor Lasers (AREA)
  • Led Devices (AREA)

Abstract

PURPOSE:To eliminate various bad effects during crystal growth by using a sliding board and making in advance the edge portion and its adjacent area of a crystal substrate thinner than the substrate's central portion. CONSTITUTION:In the multi-layer liquid phase epitaxial growth method using a sliding board the thickness of the edge portion and its adjacent area of a crystal growth substrate 4 coming in contact with a crystal growth solution is made thinner than the central portion of the substrate 4. For instance, the step difference of the substrate 4 at (a) is approx. 100mum, the taper hight of the substrate 4 at (b) is -100mum, and both substrates are approx. 150mum in length. This constitution can restrict the hight of an upheaval due to abnormal growth below the hight of the central portion of the substrate 4, thereby eliminating bad effects during crystal growth and when a grown crystal is processed.

Description

【発明の詳細な説明】 この発明は液相エビタキンヤル成長方法C二関する。[Detailed description of the invention] The present invention relates to a method C2 for liquid phase epitaphthalmic growth.

スライディングホートラ用いた液相エビタキシマル戚長
方法に於いて成長後及び成長過程に於ける成長結晶の平
坦度はl要な問題となっている。
In the liquid phase epitaxial growth method using a sliding hole, the flatness of the grown crystal after growth and during the growth process is an important issue.

通富液相エピタキシャル成長C二は第1図に示し丁棟な
スライディングボートが用いら訊る。なお図中1は溶液
61収容する被数の溶液収容体、2は基8!4v収容す
るための凹を有テるスライダである。このスライディン
グボート内が平坦な温度分布である場合、第1番目の溶
液及び第2番目の溶液を通過して出てきた成長結晶は第
2図1a■二示した基板断面図の様に基板中央部と端部
に厚みの差のあるものが得られる。この溶液が6−7個
ある場合、それを通過して出てきた基板は場所6二よっ
ては$2図(blに示すようC:〜10倍もの厚みの差
が生じる。この端部に於いて成長層が厚く成長する原因
としては第3図(第1図ムの部分の拡大図)の様なモデ
ルが考えられる。丁なわち、第3JNj:示したa、の
部分の容液舊:は、冷却が進むにつれ過飽和状態となり
、最短距離にある11点へ析出する拳が考えられる。同
じ< ILIの部分の過飽和容液からはす8点へ、am
はす、へと析出すると考えると、b1点へ厚く成長テる
事になる。
Tsutomu liquid phase epitaxial growth C2 is shown in FIG. 1 and is carried out using a flat sliding boat. In the figure, numeral 1 denotes a solution container for storing 61 solutions, and 2 denotes a slider having a recess for accommodating 8!4V. If the inside of this sliding boat has a flat temperature distribution, the grown crystals that have passed through the first solution and the second solution will be located at the center of the substrate as shown in the cross-sectional view of the substrate shown in Figure 2. A product with a difference in thickness between the part and the end can be obtained. When there are 6-7 pieces of this solution, the substrate that comes out after passing through it will have a thickness difference of ~10 times depending on the location 62 (as shown in BL). The reason why the growth layer grows thicker can be thought of by a model as shown in Figure 3 (enlarged view of the part in Figure 1). As the cooling progresses, the liquid becomes supersaturated, and the fist is considered to precipitate to the 11 points at the shortest distance.
If we consider that it will precipitate into lotus, it will grow thickly to point b1.

通常使用されているスライドボートではこのb1点への
結晶の析出は幾層にも渡って行なわれる為前述した様(
;〜lO倍の厚みの差が生じてしまう。
In the slide boat that is normally used, crystal precipitation at point b1 occurs in many layers, so as mentioned above (
; A difference in thickness of ~1O times occurs.

この異状成長は結晶成長の過程及び成長基板の加工上で
種々な弊害を及ぼす、前者の場合を簡奉に説明テ、ると
、通常結晶成長は第1因に示した様なスライデング方式
のボートを用いて行なわれるが、結晶成長中及び後C:
於ける基板スライドの際に基板表面を傷つけぬ様、基板
とガイド部の間4ニ一定の隔間が設けられている。この
隔間の下限は理想的には結晶成長の厚みだけであれば良
い訳であるが実験的には傷のつか無くなるのは合計〜5
戸の結晶成長を行なう場合で〜60となっている。
This abnormal growth causes various problems in the crystal growth process and in the processing of the growth substrate.To briefly explain the former case, crystal growth is normally carried out using a sliding boat as shown in the first factor. During and after crystal growth C:
In order to avoid damaging the surface of the substrate when the substrate slides, a constant distance of 4 is provided between the substrate and the guide section. Ideally, the lower limit of this interval would be just the thickness of the crystal growth, but experimentally it has been found that the total distance required for no scratches is ~5
It is ~60 when performing crystal growth.

又上限は多層結晶成長の場合n番目の溶液をn+1番目
に持ち込む現象が起こる為下限に近い値なとる様C二し
である。ここで、前述した様な異常成長が起こると異常
成長の起った部分のクリアランスは実質的に減少しスラ
イドの際C;ボー)Cよって削られ基板表面を汚染ある
いはガイド部のカーボン!削り取る等の害を及は丁。又
スライド面I:対しガイド面が固定されてない場合はガ
イド面を押し上げn番目の溶液なn+1番目の溶液槽へ
持ち込む、いわゆる持ち込みが起こる。この持ち込みは
4元の結晶成員等では特(:きられれる。
Further, in the case of multilayer crystal growth, a phenomenon in which the nth solution is brought into the (n+1)th solution occurs, so the upper limit is close to the lower limit. Here, when abnormal growth as described above occurs, the clearance of the part where abnormal growth has occurred is substantially reduced, and it is scraped by C; bow) during sliding, contaminating the substrate surface or causing carbon in the guide section. Do not cause any damage such as scraping it off. Slide surface I: On the other hand, when the guide surface is not fixed, the guide surface is pushed up and the nth solution is brought into the n+1th solution tank, so-called carry-over occurs. This is especially true for quartet crystal members.

次6;後者の場合ではこの異常成長により端部が中央部
より盛り上がっているのであるから成長後の結晶をその
まま加工しようとした場合へ密着激のiスフ合わせ装置
等を使用する過程で割れt生じる等の弊害が起こる・ 本発明は上記の欠虞に観みてなされたもので異常成長に
よる弊害!結晶成長基板!予め加工しておくことにより
取り除く方法を提供1゛るものである。
Next 6: In the latter case, the abnormal growth causes the edges to bulge out from the center, so if you try to process the grown crystal as it is, it will cause cracks in the process of using a tight-adhesive I-frame alignment device, etc. The present invention was made in view of the above-mentioned deficiencies, and it prevents the harmful effects of abnormal growth! Crystal growth substrate! This method provides a method for removing the particles by processing them in advance.

本発明は基板結晶の端部又はそれ(:近接する部分、テ
なわち異常成長の起こりやすい部分を予め基板中央部よ
りも薄くすることにより結晶成長中の種々な弊IFV無
く丁と共に成長後の結晶基板の加工上の弊害をなくすこ
との可能な成長方法である。
The present invention eliminates various disadvantages during IFV during crystal growth by making the edge of the substrate crystal or the adjacent area (i.e., the area where abnormal growth is likely to occur) thinner than the center of the substrate. This is a growth method that can eliminate problems in processing crystal substrates.

以下本発明の実施例を内面を用いて説明する。Hereinafter, embodiments of the present invention will be explained using the inner surface.

本発明で用いた結晶基板の断面を第4図の(a1%lb
lに示す、用いた成長用ボートは第1図に示したものと
同様なものである。第4図のIB+で用いた基板の段差
は約100μ、(t+1で用いた基板のテーバの高さ〜
10°0声であり、lal、(blとも長さ約150μ
である。結晶用基板−:はGaAs基板結晶を使用し、
800℃の保持温度から0.21@g/winの冷却速
度で平衡冷却法により〜4層のGaAe、GaAtAs
の結晶成長を行なった。一層当りの厚みは約1μであり
計4μ程度の結晶成長1行なった。tJ&5図−二成長
後の様子を各基板毎シー示した。これからも分かる様に
異常成長による盛り上かりは基板゛中央部高さより低く
押さえられ結晶成長中及び成長結晶加工の際に何ら弊害
を及は丁ことのないものとなる。
The cross section of the crystal substrate used in the present invention is shown in Figure 4 (a1%lb
The growth boat used, shown in FIG. 1, is similar to that shown in FIG. The level difference of the substrate used in IB+ in Figure 4 is approximately 100μ, (the height of the taber of the substrate used in t+1 ~
10°0 voice, both lal and (bl) are approximately 150μ in length.
It is. Crystal substrate: uses a GaAs substrate crystal,
~4 layers of GaAe, GaAtAs were prepared by equilibrium cooling method at a cooling rate of 0.21@g/win from a holding temperature of 800°C.
Crystal growth was performed. The thickness of each layer was about 1 μm, and a total of about 4 μm of crystal growth was performed. Figure tJ & 5 - The state after growth is shown for each substrate. As can be seen from this, the bulge due to abnormal growth is suppressed to a level lower than the height of the center portion of the substrate, so that it does not cause any adverse effects during crystal growth and processing of the grown crystal.

以上の様に基板端部を中央部よりも低くすることで異常
成長による弊害を防ぐことが出来る。この端部と中央部
との高さは成長層の厚み、数により変化させれば良いこ
とは当然であり形状も列記した以外のも−のでも良いこ
とはいうまでもない。
By making the edge portions of the substrate lower than the center portion as described above, it is possible to prevent harmful effects caused by abnormal growth. It goes without saying that the height between the end portion and the center portion may be changed depending on the thickness and number of growth layers, and it goes without saying that the shape may also be other than those listed.

【図面の簡単な説明】[Brief explanation of drawings]

は$1因の成長装置で基板に液相エビタキンヤル成長を
行った状態な示T因、第3図は従来の問題長を行った場
合の断面図である。 l:溶液収容体   2;スライダ 3;異状成長部分  4:基 板 6;溶液 (7317)代理人 弁理士 則 近 憲 佑(ほか1
名) 第1図 (久)                tl:、)第
3図 第4図 第5図
FIG. 3 is a cross-sectional view of a state in which liquid-phase epitaxy growth is performed on a substrate using a $1 growth apparatus, and FIG. 3 is a cross-sectional view when conventional problem length growth is performed. l: Solution container 2; Slider 3; Abnormal growth part 4: Substrate 6; Solution (7317) Agent: Noriyuki Chika, patent attorney (and 1 others)
name) Figure 1 (ku) tl:,) Figure 3 Figure 4 Figure 5

Claims (1)

【特許請求の範囲】[Claims] スライディングボートを用いた多層液相エビタ#7ヤル
成長方法に於いて、結晶成長用溶液に接Tる結晶成長用
基板の端部及び端部−こ近接した部分が該結晶基板中央
部よりも薄く出来ていることl特徴とする液相エビタキ
ンヤル成長方法。
In the multilayer liquid phase Evita #7 growth method using a sliding boat, the edges of the crystal growth substrate that are in contact with the crystal growth solution and the areas near the edges are thinner than the center of the crystal substrate. What it does: A method for growing liquid-phase shrimp.
JP56114447A 1981-07-23 1981-07-23 Liquid phase epitaxial growth Pending JPS5816525A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56114447A JPS5816525A (en) 1981-07-23 1981-07-23 Liquid phase epitaxial growth

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56114447A JPS5816525A (en) 1981-07-23 1981-07-23 Liquid phase epitaxial growth

Publications (1)

Publication Number Publication Date
JPS5816525A true JPS5816525A (en) 1983-01-31

Family

ID=14637955

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56114447A Pending JPS5816525A (en) 1981-07-23 1981-07-23 Liquid phase epitaxial growth

Country Status (1)

Country Link
JP (1) JPS5816525A (en)

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