JPS58164222A - Heat treatment device - Google Patents

Heat treatment device

Info

Publication number
JPS58164222A
JPS58164222A JP4821882A JP4821882A JPS58164222A JP S58164222 A JPS58164222 A JP S58164222A JP 4821882 A JP4821882 A JP 4821882A JP 4821882 A JP4821882 A JP 4821882A JP S58164222 A JPS58164222 A JP S58164222A
Authority
JP
Japan
Prior art keywords
top plate
processing container
plate
heating
supporting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4821882A
Other languages
Japanese (ja)
Other versions
JPH0381295B2 (en
Inventor
Yuichiro Yamada
雄一郎 山田
Shinichi Mizuguchi
水口 信一
Hirozo Shima
島 博三
Junichi Nozaki
野崎 順一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP4821882A priority Critical patent/JPS58164222A/en
Publication of JPS58164222A publication Critical patent/JPS58164222A/en
Publication of JPH0381295B2 publication Critical patent/JPH0381295B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/48Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation
    • C23C16/481Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation by radiant heating of the substrate

Abstract

PURPOSE:To make uniform the heating condition of a semiconductor substrate arranged in a vessel by a method wherein the treatment vessel is constituted of a case body part having an inlet port and an exhaust port, and having circulating holes for a cooling fluid at the inside of the body, and of a flat board type top plate consisting of transparent quartz, and infrared lamps for heating by radiation are provided at the upper part of the top plate. CONSTITUTION:The supporting stainless steel frame 8 to constitute the cylindrical side wall is provided on the stainless steel base 7 having the inlet port 15 and the exhaust port 16, and the top plate 9 consisting of the transparent quartz flat board is put on the upper face of the supporting frame 8 being supported with the ring type fixing frame 10. At this construction, circulating paths 11 for cooling water are formed respectively in the supporting frame 8 and the fixing frame 10, a supporting desk 12 to mount the semiconductor substrate 13 is provided in space surrounded with the supporting frame 8, and a thermally shielding plate 17 of opaque quartz is arranged at the lower side thereof. After then, the infrared lamps 14 for heating are provided at the upper part of the plate 9 interposing the prescribed interval between them, and the surface of the substrate 13 is heated by direct radiation through the plate 9.

Description

【発明の詳細な説明】 本発明は、所定の雰囲気を内部音Mに有する処理容器、
例えば半導体製造における気相成長装置において、処理
容器内の物体の表面を容器外部からの輻射熱によって熱
処理するための加熱処理装置に係り、外力や高温加熱時
に発生する熱応力する。
DETAILED DESCRIPTION OF THE INVENTION The present invention provides a processing container having a predetermined atmosphere in its internal sound M;
For example, in a vapor phase growth apparatus used in semiconductor manufacturing, the heat treatment apparatus heat-treats the surface of an object inside a processing chamber using radiant heat from outside the chamber, and thermal stress generated during external force or high-temperature heating is applied.

従来の加熱処理装置は第1図に示すように、金属製の基
台1と一体的に形成された透明石英製のペルジャー2か
ら処理容器が構成され、容器外部に設けられた赤外線ラ
ンプ3からの熱輻射によって、容器内部の支持台4に支
持された被加熱物体6を加熱しようとするものでア14
を是。
As shown in FIG. 1, in a conventional heat treatment apparatus, a processing container is composed of a transparent quartz Pelger 2 integrally formed with a metal base 1, and an infrared lamp 3 provided on the outside of the container is used as a processing container. A14 is intended to heat the object to be heated 6 supported on the support stand 4 inside the container by thermal radiation.
Yes.

すなわち、赤外線ランプの後方には放物面を有する凹面
鏡6が設けられて、上記凹面鏡の反射特性を利用して物
体表面に対する熱輻射方向を平行に保持していた。また
赤外線ランプ3と支持台4にはさまれる石英ペルジャー
は、矢印X方向に対して垂直となるように平板形状をな
しており、上記2点の工夫から熱線の交錯及び熱線が石
英を透過する際の反射屈折を可能な限り避けて加熱の均
一性を得ようとしている。しかし、この加熱処理装置は
、石英ペルジャーの側壁部での赤外線の反射や屈折、並
びに金属製基台の熱伝導効果などに起因して石英ペルジ
ャーへの蓄熱がなされる結果、高温加熱状態で石英ペル
ジャーに熱応力によるクラックを生じること、石英ペル
ジャーや基台からの熱輻射によって物体表面に加熱の均
一性が得られないことなどの欠点を有していた。さらに
、処理容器全体に対し、石英ペルジャーの占める割合が
大きいため、容器内外の圧力差や外部力に対し、強度的
に脆いという欠点、及び従来例の形状をなす石英ペルジ
ャーの製作が困難であるという欠点を有、していた。
That is, a concave mirror 6 having a parabolic surface is provided behind the infrared lamp, and the reflection characteristics of the concave mirror are used to maintain the direction of heat radiation parallel to the object surface. In addition, the quartz Pelger sandwiched between the infrared lamp 3 and the support base 4 has a flat plate shape perpendicular to the direction of the arrow The goal is to avoid catastrophe and refraction as much as possible to achieve uniform heating. However, with this heat treatment equipment, heat is accumulated in the quartz Pel jar due to reflection and refraction of infrared rays on the side walls of the quartz Pel jar, as well as the heat conduction effect of the metal base. It has drawbacks such as cracks occurring in the Pelger due to thermal stress and the inability to achieve uniform heating on the surface of the object due to heat radiation from the quartz Pelger and the base. Furthermore, since the quartz Pel jar occupies a large proportion of the entire processing container, it has the disadvantage of being brittle against pressure differences inside and outside the container and external forces, and it is difficult to manufacture a quartz Pel jar in the shape of the conventional example. It had the following drawbacks.

本発明は上記従来の欠点を解消するもので、以下にその
一実施例を第2図及び第3図に基いて説明する。
The present invention solves the above-mentioned conventional drawbacks, and one embodiment thereof will be described below with reference to FIGS. 2 and 3.

第2図において7はステンレス製の基台でアシ、8は基
台7の上に既知の方法で固定され処理容器の円筒形状の
側壁をなすステンレス製の支持枠であり、この支持枠8
の上部に透明な石英平板からなるトッププレート9が、
ステンレス製で中空円板形状をなす固定枠10によって
固定されている。
In FIG. 2, 7 is a stainless steel base, and 8 is a stainless steel support frame that is fixed on the base 7 by a known method and forms a cylindrical side wall of the processing container.
A top plate 9 made of a transparent quartz plate is placed on the top of the
It is fixed by a fixed frame 10 made of stainless steel and shaped like a hollow disc.

すなわち処理容器は基台7.支持枠8.固定枠1゜から
なる金属製の筐体部とトッププレート9から構成されて
いる。支持枠8及び固定枠1oの内部には冷却水の循環
孔11が設けられている。12は上記筐体部とトッププ
レー)9からなる処理容器内部に設けられた半導体基板
13を支持する基板支持台である。14は加熱用赤外線
ランプであり、基板支持台12の表面に対し、トッププ
レートeをはさんで対面するように設置されている。
In other words, the processing container is the base 7. Support frame 8. It consists of a metal casing section with a fixed frame of 1° and a top plate 9. Cooling water circulation holes 11 are provided inside the support frame 8 and the fixed frame 1o. Reference numeral 12 denotes a substrate support stand for supporting a semiconductor substrate 13 provided inside a processing container consisting of the above-mentioned casing and top plate 9. Reference numeral 14 denotes a heating infrared lamp, which is installed so as to face the surface of the substrate support 12 with the top plate e interposed therebetween.

16は基台に設けられた吸気口であシ、16は基台に設
けられた排気口である。17は赤外線ランプ14から基
台7に対する熱輻射を防止するために、基台7の上に設
けられた例えば不透明石英からなる熱遮蔽板である。
16 is an intake port provided on the base, and 16 is an exhaust port provided on the base. Reference numeral 17 denotes a heat shield plate made of, for example, opaque quartz, provided on the base 7 in order to prevent heat radiation from the infrared lamp 14 to the base 7.

1記構成において反応ガスとキャリアガスは図示されな
いガス吸入装置によって吸気口16を通して処理容器内
部に流入し、また図示されない排気装置によって排気口
16から容器外部へ流出する。上記赤外#2ンプ14か
らの輻射熱と上記混合ガスによって、処理容器内部に加
熱状態を含めた所定の雰囲気が形成される。すなわち基
板支持台12の上に設置された半導体基板13の表面は
赤外線ランプ14からの輻射熱によって高温に加熱され
、反応ガスの熱反応を誘起して気相成長がなされる。上
記の加熱処理装置において、ステンレス製の支持枠8.
固定枠1oに伝導された熱はその内部を循環する冷却水
によって吸収され、また基台7に対する赤外線ランプ1
4からの熱輻射は熱遮蔽板17によって防止される。以
上のように処理容器のトッププレート以外の筐体部の蓄
熱を防止した結果、高温加熱によって処理容器に密閉異
常や破損を生じることがなく、また上記蓄熱ゞ′防止効
果は容器から半導体基板13への2次的輻射熱の影響を
無くすため、半導体基板13の表面は石英5トツププレ
ート9を通し4て直接輻射される熱のみによって加熱さ
れることとなシ、半導体基板13上の加熱状態に関する
均一性を保つ効果を生む。また半導体基板13と赤外線
ランプ14を処理容器の内部と外部に分離する平板形状
の透明石英トッププレート9は、従来例の一体的に製作
されたペルジャー型に比べその製作は容易であり、しか
も処理容器の主な部分にステンレスを用いたことにより
、充分な強度をもつ処理容器を得ることができる。
In configuration 1, the reaction gas and carrier gas flow into the processing container through the intake port 16 by a gas suction device (not shown), and flow out of the container from the exhaust port 16 by an exhaust device (not shown). The radiant heat from the infrared #2 pump 14 and the mixed gas form a predetermined atmosphere including a heated state inside the processing container. That is, the surface of the semiconductor substrate 13 placed on the substrate support stand 12 is heated to a high temperature by radiant heat from the infrared lamp 14, inducing a thermal reaction of the reaction gas and performing vapor phase growth. In the above heat treatment apparatus, the stainless steel support frame 8.
The heat conducted to the fixed frame 1o is absorbed by the cooling water circulating inside the fixed frame 1o, and the infrared lamp 1 to the base 7
Heat radiation from 4 is prevented by a heat shield plate 17. As a result of preventing heat accumulation in the casing other than the top plate of the processing container as described above, the processing container is prevented from being sealed abnormally or damaged due to high-temperature heating. In order to eliminate the influence of secondary radiant heat on the semiconductor substrate 13, the surface of the semiconductor substrate 13 is heated only by the heat directly radiated through the quartz top plate 9. Produces the effect of maintaining uniformity. Furthermore, the flat transparent quartz top plate 9 that separates the semiconductor substrate 13 and the infrared lamp 14 into the inside and outside of the processing container is easier to manufacture than the conventional Pelger type, which is manufactured integrally, and is also easy to process. By using stainless steel for the main parts of the container, a processing container with sufficient strength can be obtained.

なお、この実施例においては処理容器の形状を円筒形と
したが、角形等の他の形状でもよい。また吸気口、排気
口は特に基台7に設ける必要はなく、支持枠8.固定枠
10を含めた筐体部のいずれかの場所に設けられればよ
い。また基台7内部に冷却流体循環孔を設けて蓄熱防止
効果を得ることもできる。さらにトッププレート9に対
する蓄熱を防止するために外部からトッププレートの表
面に冷却ガスを吹きつけることも可能である。
In this embodiment, the processing container has a cylindrical shape, but it may have another shape such as a rectangular shape. Further, it is not necessary to provide the intake port and the exhaust port in the base 7, and the support frame 8. It may be provided anywhere in the housing including the fixed frame 10. Further, cooling fluid circulation holes may be provided inside the base 7 to obtain the effect of preventing heat accumulation. Furthermore, in order to prevent heat accumulation on the top plate 9, it is also possible to blow cooling gas onto the surface of the top plate from the outside.

このように本発明によれば、処理容器の構成として、赤
外線ランプと支持台の対面している部分にのみ透明石英
のトッププレートを用い、他の筐体部には内部に冷却流
体循環孔を有し、また高強度金有す′る部材を用りるこ
とにより、高温加熱による熱応力の影響を避けると共に
、加熱の均一性を得、しかも処理容器全体の強度を増す
効果を発揮するものである。
As described above, according to the present invention, the processing container is configured such that a transparent quartz top plate is used only in the portion where the infrared lamp and the support stand face each other, and cooling fluid circulation holes are provided inside the other housing portions. By using components made of high-strength metal, it avoids the effects of thermal stress caused by high-temperature heating, achieves uniform heating, and increases the strength of the entire processing container. It is.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の加熱処理装置の断面図、第2図は本発明
の一実施例における加熱処理装置の断面図、第3図は第
2図におけるA−AI矢視図である。 7・・・・・・基台、8・・・・・・支持部材、9・・
・・・・トッププレート、1o・・・・・・蓋、11・
・・・・・冷却水の循環路、12・・・・・・支持台、
14・・・・・・赤外線ランプ、16・・・・・・吸気
口、16・・・・・・排気口、17・・・・・・熱遮蔽
板。 代理人の氏名 弁理士 中 尾 敏 男 ほか1名$1
311 手続補正書 昭和57年6月23日 特許庁長官殿 l事件の表示 昭和67年特許願第48218  号 2発明の名称 加熱処理装置 3補正をする者 事件との関係      特  許  出  願  人
任 所  大阪府門真市大字門真1006番地名 称 
(582)松下電器産業株式会社代表者    山  
下  俊  彦 4代理人 〒571 住 所  大阪府門真市大字門真1006番地6補正の
対象 明細書の発明の詳細な説明の欄 1 明細書簡2頁4行目の「加熱処理装置わ得ることを
」を「加熱処理装置を得ることを」と補正する。 2 明細書簡6頁14行目の「可能である。」を「可能
である。さらに半導体基板13を支持する基板支持台1
2を気相成長の膜厚を均一化するため回転可能に構成す
ることも可能である。」と補正する。
FIG. 1 is a sectional view of a conventional heat treatment apparatus, FIG. 2 is a sectional view of a heat treatment apparatus according to an embodiment of the present invention, and FIG. 3 is a view taken along the line A-AI in FIG. 7...Base, 8...Supporting member, 9...
...Top plate, 1o...Lid, 11.
... Cooling water circulation path, 12 ... Support stand,
14...Infrared lamp, 16...Intake port, 16...Exhaust port, 17...Heat shield plate. Name of agent: Patent attorney Toshio Nakao and 1 other person $1
311 Procedural amendment June 23, 1980 Mr. Commissioner of the Japan Patent Office l Indication of the case 1988 Patent Application No. 48218 2 Name of the invention Heat treatment device 3 Relationship with the person making the amendment Patent application Person who made the amendment 1006 Kadoma, Kadoma City, Osaka Prefecture Name
(582) Matsushita Electric Industrial Co., Ltd. Representative Yama
Toshihiko Shimo 4 Agent 571 Address 1006 Kadoma, Kadoma-shi, Osaka Prefecture 6 Detailed explanation of the invention in the specification subject to amendment Column 1: ``The heat treatment apparatus can be obtained'' on page 2, line 4 of the specification letter is corrected to ``obtaining a heat treatment device.'' 2. Change "It is possible." on page 6, line 14 of the specification letter to "It is possible. Furthermore, the substrate support stand 1 that supports the semiconductor substrate 13
2 may be configured to be rotatable in order to make the film thickness uniform in vapor phase growth. ” he corrected.

Claims (1)

【特許請求の範囲】[Claims] (1)吸気口と排気口を備え内部に冷却流体の循環孔を
有する筐体部と透明石英からなる平板形状のトッププレ
ートとで構成された処理容器と、この処理容器内部に設
けられ、かつトッププレートヒ平行に設けられた被加熱
物体の支持台と、前記処理容器外部に設けられ、支持台
及びトッププレートに対向するよう取り付けられた輻射
加熱用赤外線ランプとからなり、処理容器内部に所定の
雰囲気を形成する加熱処理装置。 @)上記処理容器の内部に赤外線による処理容器内壁へ
の輻射加熱を阻止する熱遮蔽板を設けた特許請求の範囲
第1項記載の加勢処理装置。
(1) A processing container composed of a casing having an intake port and an exhaust port and a cooling fluid circulation hole therein, and a flat plate-shaped top plate made of transparent quartz; It consists of a support stand for the object to be heated, which is provided parallel to the top plate, and an infrared heating lamp for radiant heating, which is provided outside the processing container and is attached to face the support stand and the top plate. A heat treatment device that creates an atmosphere of @) The auxiliary processing apparatus according to claim 1, further comprising a heat shield plate provided inside the processing container to prevent radiant heating of the inner wall of the processing container by infrared rays.
JP4821882A 1982-03-25 1982-03-25 Heat treatment device Granted JPS58164222A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4821882A JPS58164222A (en) 1982-03-25 1982-03-25 Heat treatment device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4821882A JPS58164222A (en) 1982-03-25 1982-03-25 Heat treatment device

Publications (2)

Publication Number Publication Date
JPS58164222A true JPS58164222A (en) 1983-09-29
JPH0381295B2 JPH0381295B2 (en) 1991-12-27

Family

ID=12797268

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4821882A Granted JPS58164222A (en) 1982-03-25 1982-03-25 Heat treatment device

Country Status (1)

Country Link
JP (1) JPS58164222A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0237744A (en) * 1988-07-27 1990-02-07 Tokyo Electron Ltd Transfer
JPH0771601A (en) * 1992-12-14 1995-03-17 Trw United Carr Gmbh & Co Kg Closure lid
US5445675A (en) * 1992-07-09 1995-08-29 Tel-Varian Limited Semiconductor processing apparatus
JP2755369B2 (en) * 1992-02-25 1998-05-20 エージー.アソシェーツ、インコーポレイテッド Gas phase doping of semiconductor materials under reduced pressure in a radiantly heated cold wall reactor
WO2020100376A1 (en) * 2018-11-14 2020-05-22 株式会社アルバック Vacuum heating device and reflector device

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0237744A (en) * 1988-07-27 1990-02-07 Tokyo Electron Ltd Transfer
JP2755369B2 (en) * 1992-02-25 1998-05-20 エージー.アソシェーツ、インコーポレイテッド Gas phase doping of semiconductor materials under reduced pressure in a radiantly heated cold wall reactor
US5445675A (en) * 1992-07-09 1995-08-29 Tel-Varian Limited Semiconductor processing apparatus
JPH0771601A (en) * 1992-12-14 1995-03-17 Trw United Carr Gmbh & Co Kg Closure lid
WO2020100376A1 (en) * 2018-11-14 2020-05-22 株式会社アルバック Vacuum heating device and reflector device
JPWO2020100376A1 (en) * 2018-11-14 2021-06-10 株式会社アルバック Vacuum heating device, reflector device
TWI749366B (en) * 2018-11-14 2021-12-11 日商愛發科股份有限公司 Vacuum heating device and reflector device

Also Published As

Publication number Publication date
JPH0381295B2 (en) 1991-12-27

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