JPS58158543A - 透明、不透明部から成る物体の欠陥検出回路 - Google Patents

透明、不透明部から成る物体の欠陥検出回路

Info

Publication number
JPS58158543A
JPS58158543A JP4018182A JP4018182A JPS58158543A JP S58158543 A JPS58158543 A JP S58158543A JP 4018182 A JP4018182 A JP 4018182A JP 4018182 A JP4018182 A JP 4018182A JP S58158543 A JPS58158543 A JP S58158543A
Authority
JP
Japan
Prior art keywords
transparent
opaque
circuit
detection circuit
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4018182A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0136576B2 (enExample
Inventor
Kunihiko Edamatsu
枝松　邦彦
Kazue Shimizu
清水　和衛
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Fuji Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd, Fuji Electric Manufacturing Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP4018182A priority Critical patent/JPS58158543A/ja
Publication of JPS58158543A publication Critical patent/JPS58158543A/ja
Publication of JPH0136576B2 publication Critical patent/JPH0136576B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP4018182A 1982-03-16 1982-03-16 透明、不透明部から成る物体の欠陥検出回路 Granted JPS58158543A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4018182A JPS58158543A (ja) 1982-03-16 1982-03-16 透明、不透明部から成る物体の欠陥検出回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4018182A JPS58158543A (ja) 1982-03-16 1982-03-16 透明、不透明部から成る物体の欠陥検出回路

Publications (2)

Publication Number Publication Date
JPS58158543A true JPS58158543A (ja) 1983-09-20
JPH0136576B2 JPH0136576B2 (enExample) 1989-08-01

Family

ID=12573606

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4018182A Granted JPS58158543A (ja) 1982-03-16 1982-03-16 透明、不透明部から成る物体の欠陥検出回路

Country Status (1)

Country Link
JP (1) JPS58158543A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62194169A (ja) * 1986-02-19 1987-08-26 スタンレー電気株式会社 冷却用フアンの制御装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62194169A (ja) * 1986-02-19 1987-08-26 スタンレー電気株式会社 冷却用フアンの制御装置

Also Published As

Publication number Publication date
JPH0136576B2 (enExample) 1989-08-01

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