JPS58148942A - 表面被覆薄膜の特性を求める方法および装置 - Google Patents

表面被覆薄膜の特性を求める方法および装置

Info

Publication number
JPS58148942A
JPS58148942A JP58019869A JP1986983A JPS58148942A JP S58148942 A JPS58148942 A JP S58148942A JP 58019869 A JP58019869 A JP 58019869A JP 1986983 A JP1986983 A JP 1986983A JP S58148942 A JPS58148942 A JP S58148942A
Authority
JP
Japan
Prior art keywords
thin film
light
reflected
photodetector
normal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58019869A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0248054B2 (en, 2012
Inventor
スタンリ−・ア−ネスト・オ−チヤ−ド
セリア・シヤ−ロツト・テイラ−
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Imperial Chemical Industries Ltd
Original Assignee
Imperial Chemical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Imperial Chemical Industries Ltd filed Critical Imperial Chemical Industries Ltd
Publication of JPS58148942A publication Critical patent/JPS58148942A/ja
Publication of JPH0248054B2 publication Critical patent/JPH0248054B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Fertilizers (AREA)
  • Chemical And Physical Treatments For Wood And The Like (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Polyurethanes Or Polyureas (AREA)
  • Polishing Bodies And Polishing Tools (AREA)
  • Paints Or Removers (AREA)
  • Steroid Compounds (AREA)
  • Chemical Treatment Of Metals (AREA)
  • Polymers With Sulfur, Phosphorus Or Metals In The Main Chain (AREA)
  • Agricultural Chemicals And Associated Chemicals (AREA)
  • Devices For Checking Fares Or Tickets At Control Points (AREA)
  • Toys (AREA)
JP58019869A 1982-02-19 1983-02-10 表面被覆薄膜の特性を求める方法および装置 Granted JPS58148942A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB8204933 1982-02-19
GB8204933 1982-02-19

Publications (2)

Publication Number Publication Date
JPS58148942A true JPS58148942A (ja) 1983-09-05
JPH0248054B2 JPH0248054B2 (en, 2012) 1990-10-23

Family

ID=10528457

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58019869A Granted JPS58148942A (ja) 1982-02-19 1983-02-10 表面被覆薄膜の特性を求める方法および装置

Country Status (18)

Country Link
US (1) US4572672A (en, 2012)
EP (1) EP0087222B1 (en, 2012)
JP (1) JPS58148942A (en, 2012)
AT (1) ATE32631T1 (en, 2012)
AU (1) AU558197B2 (en, 2012)
CA (1) CA1193467A (en, 2012)
DE (1) DE3375740D1 (en, 2012)
DK (1) DK159405C (en, 2012)
ES (1) ES519912A0 (en, 2012)
FI (1) FI830480L (en, 2012)
GB (1) GB2115141B (en, 2012)
IE (1) IE54038B1 (en, 2012)
IN (1) IN159549B (en, 2012)
MX (1) MX162872B (en, 2012)
NO (1) NO830330L (en, 2012)
NZ (1) NZ203140A (en, 2012)
PT (1) PT76264B (en, 2012)
ZA (1) ZA83671B (en, 2012)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8035817B2 (en) 2006-07-21 2011-10-11 Toyota Jidosha Kabushiki Kaisha Method for estimating reflectance
US12148146B2 (en) 2019-09-19 2024-11-19 Ppg Industries Ohio, Inc. Systems and methods for mapping coatings to a spatial appearance space

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2647411A (en) * 1950-11-09 1953-08-04 Filocamo Aldo Electric automatic operating apparatus for mechanical speed changing devices, particularly for motor cars
US4692481A (en) * 1984-09-27 1987-09-08 E. I. Du Pont De Nemours And Company Process for matching color of paint to a colored surface
US4606645A (en) * 1984-10-29 1986-08-19 Weyerhaeuser Company Method for determining localized fiber angle in a three dimensional fibrous material
US4711580A (en) * 1985-01-28 1987-12-08 Hunter Associates Laboratory, Inc. Modeling properties of flake finishes using directional resolution and statistical flake orientation distribution function
US4721389A (en) * 1985-04-18 1988-01-26 Potters Industries, Inc. Method and apparatus for measuring retroreflectivity of a reflective layer on a surface
ATE54027T1 (de) * 1986-02-22 1990-07-15 Pinsch Gmbh & Co Helmut K Schnittholz-pruefvorrichtung.
JP3027161B2 (ja) * 1989-07-14 2000-03-27 株式会社リコー 画像形成装置における画像濃度検知装置
US5155558A (en) * 1990-09-19 1992-10-13 E. I. Du Pont De Nemours And Company Method and apparatus for analyzing the appearance features of a surface
DE4127215C2 (de) * 1991-08-16 2003-07-17 Byk Gardner Gmbh Verfahren und Vorrichtung zur quantifizierten Bewertung des physiologischen Eindruckes von reflektionsfähigen Oberflächen
US5387977A (en) * 1991-09-04 1995-02-07 X-Rite, Incorporated Multiangular color measuring apparatus
US5231472A (en) * 1991-09-16 1993-07-27 Ppg Industries, Inc. Color matching and characterization of surface coatings
US5566244A (en) * 1993-11-22 1996-10-15 Honda Giken Kogyo Kabushiki Kaisha Method of inspecting a workpiece surface including a picturing system with a shortened focal plane
GB2293448B (en) * 1994-09-20 1996-12-11 Honda Motor Co Ltd Method of determining color tone of glitter-containing coating
US6166814A (en) * 1997-09-30 2000-12-26 Georgia Tech Research Corp. Method and apparatus for color matching paints
JP3631365B2 (ja) * 1998-02-10 2005-03-23 日本ペイント株式会社 変角分光反射率の測定方法
US6999167B2 (en) * 2001-02-12 2006-02-14 Engelhard Corporation Automated reactor endpointing of platy interference effect pigments
FR2840990B1 (fr) * 2002-06-18 2005-07-29 France Etat Ponts Chaussees Dispositif de mesure de caracteristiques photometriques d'un materiau
US6952265B2 (en) * 2003-06-12 2005-10-04 E. I. Du Pont De Nemours And Company Method of characterization of surface coating containing metallic flakes and device used therein
US20060169051A1 (en) * 2005-01-13 2006-08-03 Alman David H Method to specify acceptable surface appearance of a coated article
US9025153B2 (en) * 2011-11-16 2015-05-05 Axalta Coating Systems Ip Co., Llc Process for predicting degree of mottling in coating compositions by wet color measurement
CN105452847B (zh) * 2013-08-02 2018-10-16 锡克拜控股有限公司 用于确定在光学效应层的延伸区域上方的颜料颗粒取向的方法和装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4828290A (en, 2012) * 1971-08-12 1973-04-14
JPS5278484A (en) * 1975-12-25 1977-07-01 Asahi Optical Co Ltd Apparatus for measuring reflection factor of mirror surface

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH402463A (fr) * 1964-06-08 1965-11-15 Eicken Henri Dispositif détecteur dans une installation de redressement de tissu
DE1772725A1 (de) * 1968-06-26 1971-06-03 Agfa Gevaert Ag Verfahren zur Feststellung von Pegelschwankungen in magnetisierbaren Schichten
US3690771A (en) * 1970-04-07 1972-09-12 Du Pont Method and apparatus for instrumentally shading metallic paints
US3708233A (en) * 1971-01-12 1973-01-02 Du Pont Multi-angle panel holding device
US3712745A (en) * 1971-01-12 1973-01-23 Du Pont Spectrophotometer multi-angle viewing device
GB1474191A (en) * 1974-01-21 1977-05-18 Nat Res Dev Measurement of surface roughness
US4097160A (en) * 1974-09-06 1978-06-27 Canon Kabushiki Kaisha Method for inspecting object defection by light beam

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4828290A (en, 2012) * 1971-08-12 1973-04-14
JPS5278484A (en) * 1975-12-25 1977-07-01 Asahi Optical Co Ltd Apparatus for measuring reflection factor of mirror surface

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8035817B2 (en) 2006-07-21 2011-10-11 Toyota Jidosha Kabushiki Kaisha Method for estimating reflectance
JP4868258B2 (ja) * 2006-07-21 2012-02-01 トヨタ自動車株式会社 反射率推定方法
US12148146B2 (en) 2019-09-19 2024-11-19 Ppg Industries Ohio, Inc. Systems and methods for mapping coatings to a spatial appearance space

Also Published As

Publication number Publication date
IE54038B1 (en) 1989-05-24
AU1135083A (en) 1983-08-25
CA1193467A (en) 1985-09-17
US4572672A (en) 1986-02-25
DK159405B (da) 1990-10-08
DE3375740D1 (en) 1988-03-31
PT76264B (en) 1985-12-05
ES8402936A1 (es) 1984-02-16
IE830163L (en) 1983-08-19
GB2115141B (en) 1985-09-04
DK159405C (da) 1991-03-04
PT76264A (en) 1983-03-01
FI830480A7 (fi) 1983-08-20
AU558197B2 (en) 1987-01-22
ZA83671B (en) 1983-12-28
IN159549B (en, 2012) 1987-05-23
GB2115141A (en) 1983-09-01
ATE32631T1 (de) 1988-03-15
ES519912A0 (es) 1984-02-16
NO830330L (no) 1983-08-22
DK64683D0 (da) 1983-02-15
FI830480A0 (fi) 1983-02-11
NZ203140A (en) 1985-03-20
JPH0248054B2 (en, 2012) 1990-10-23
EP0087222B1 (en) 1988-02-24
DK64683A (da) 1983-08-20
GB8301438D0 (en) 1983-02-23
EP0087222A3 (en) 1984-11-07
FI830480L (fi) 1983-08-20
MX162872B (es) 1991-07-02
EP0087222A2 (en) 1983-08-31

Similar Documents

Publication Publication Date Title
JPS58148942A (ja) 表面被覆薄膜の特性を求める方法および装置
JP3406640B2 (ja) 携帯可能な分光光度計
US8072607B2 (en) Measuring device for measuring optical properties of transparent substrates
CN101995387B (zh) 一种多功能紫外-可见光谱仪
JPH10510365A (ja) 赤外微量分光計付属装置
CN104807761A (zh) 一种实现微区光谱测量的光谱仪设计方法
US4972092A (en) Apparatus for determining the effective surface roughness of polished optical samples by measuring the integral scattered radiation
Rönnow et al. Design review of an instrument for spectroscopic total integrated light scattering measurements in the visible wavelength region
US5859705A (en) Apparatus and method for using light scattering to determine the size of particles virtually independent of refractive index
US20040233426A1 (en) Raman probe and Raman spectrum measuring apparatus utilizing the same
JPS6017340A (ja) 紙の光学的な特性を測定する装置
US4676652A (en) Multiple pass optical system
Maulhardt et al. A Simple Device for Diffuse Reflectance Fourier Transform Infrared Spectroscopy
US3446562A (en) Apparatus for photometric analysis
JPS6212994Y2 (en, 2012)
JP3197104B2 (ja) Ｘ線解析装置
SU1567936A1 (ru) Способ определени коэффициента поглощени и коэффициента диффузии излучени в твердых слабопоглощающих сильнорассеивающих материалах
JPS59180441A (ja) メタリツク塗膜の色調判定方法およびその判定装置
Dunn DESIGN AND ANALYSIS OF AN ELLIPSOIDAL MIRROR REFLECTOMETER.
JPH03233338A (ja) 積分球内壁面反射率測定方法
JPH0675035B2 (ja) 反射率測定装置
JP3829663B2 (ja) 分光光度計
JPS5948338B2 (ja) 流体内の粒子を粒度測定分析する装置
JP3034382B2 (ja) 顕微全反射減衰測定光学系
EP1376101A1 (fr) Dispositif de mesure de caractéristiques photométriques d'un matériau