JPS58137772A - 回路基板テストシステムに用いるフイクスチア - Google Patents

回路基板テストシステムに用いるフイクスチア

Info

Publication number
JPS58137772A
JPS58137772A JP57020396A JP2039682A JPS58137772A JP S58137772 A JPS58137772 A JP S58137772A JP 57020396 A JP57020396 A JP 57020396A JP 2039682 A JP2039682 A JP 2039682A JP S58137772 A JPS58137772 A JP S58137772A
Authority
JP
Japan
Prior art keywords
test
board
plate
adapter plate
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57020396A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0345347B2 (enExample
Inventor
Mitsunori Ogata
尾形　充紀
Yasuo Machino
町野　靖雄
Takashi Harashima
原島　孝
Kyoya Aoyama
青山　恭也
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
M I TECHNICAL SERVICE KK
Original Assignee
M I TECHNICAL SERVICE KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by M I TECHNICAL SERVICE KK filed Critical M I TECHNICAL SERVICE KK
Priority to JP57020396A priority Critical patent/JPS58137772A/ja
Publication of JPS58137772A publication Critical patent/JPS58137772A/ja
Publication of JPH0345347B2 publication Critical patent/JPH0345347B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
JP57020396A 1982-02-10 1982-02-10 回路基板テストシステムに用いるフイクスチア Granted JPS58137772A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57020396A JPS58137772A (ja) 1982-02-10 1982-02-10 回路基板テストシステムに用いるフイクスチア

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57020396A JPS58137772A (ja) 1982-02-10 1982-02-10 回路基板テストシステムに用いるフイクスチア

Publications (2)

Publication Number Publication Date
JPS58137772A true JPS58137772A (ja) 1983-08-16
JPH0345347B2 JPH0345347B2 (enExample) 1991-07-10

Family

ID=12025849

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57020396A Granted JPS58137772A (ja) 1982-02-10 1982-02-10 回路基板テストシステムに用いるフイクスチア

Country Status (1)

Country Link
JP (1) JPS58137772A (enExample)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5095778A (enExample) * 1973-12-25 1975-07-30
JPS53147969A (en) * 1977-05-31 1978-12-23 Nippon Aviotronics Kk Method of and device for automatically testing printed board circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5095778A (enExample) * 1973-12-25 1975-07-30
JPS53147969A (en) * 1977-05-31 1978-12-23 Nippon Aviotronics Kk Method of and device for automatically testing printed board circuit

Also Published As

Publication number Publication date
JPH0345347B2 (enExample) 1991-07-10

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