JPS58109859A - 光による電圧・電界測定器 - Google Patents

光による電圧・電界測定器

Info

Publication number
JPS58109859A
JPS58109859A JP56212235A JP21223581A JPS58109859A JP S58109859 A JPS58109859 A JP S58109859A JP 56212235 A JP56212235 A JP 56212235A JP 21223581 A JP21223581 A JP 21223581A JP S58109859 A JPS58109859 A JP S58109859A
Authority
JP
Japan
Prior art keywords
voltage
electro
optical
temperature
electric field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56212235A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0211868B2 (OSRAM
Inventor
Koji Tada
多田　紘二
Miki Kuhara
美樹 工原
Masami Tatsumi
雅美 龍見
Akihiko Kawakami
川上　明彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP56212235A priority Critical patent/JPS58109859A/ja
Priority to CA000418006A priority patent/CA1194123A/en
Priority to EP82306838A priority patent/EP0083196B1/en
Priority to DE8282306838T priority patent/DE3269757D1/de
Priority to AU91802/82A priority patent/AU563868B2/en
Priority to US06/452,326 priority patent/US4563093A/en
Publication of JPS58109859A publication Critical patent/JPS58109859A/ja
Publication of JPH0211868B2 publication Critical patent/JPH0211868B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0878—Sensors; antennas; probes; detectors
    • G01R29/0885—Sensors; antennas; probes; detectors using optical probes, e.g. electro-optical, luminescent, glow discharge, or optical interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
    • G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/12—Measuring electrostatic fields or voltage-potential

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
JP56212235A 1981-12-24 1981-12-24 光による電圧・電界測定器 Granted JPS58109859A (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP56212235A JPS58109859A (ja) 1981-12-24 1981-12-24 光による電圧・電界測定器
CA000418006A CA1194123A (en) 1981-12-24 1982-12-17 Voltage and electric field measuring device using light
EP82306838A EP0083196B1 (en) 1981-12-24 1982-12-21 Voltage and electric field measuring device using light
DE8282306838T DE3269757D1 (en) 1981-12-24 1982-12-21 Voltage and electric field measuring device using light
AU91802/82A AU563868B2 (en) 1981-12-24 1982-12-22 Electro-optical voltage and electric field measurement device
US06/452,326 US4563093A (en) 1981-12-24 1982-12-22 Voltage and electric field measuring device using light

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56212235A JPS58109859A (ja) 1981-12-24 1981-12-24 光による電圧・電界測定器

Publications (2)

Publication Number Publication Date
JPS58109859A true JPS58109859A (ja) 1983-06-30
JPH0211868B2 JPH0211868B2 (OSRAM) 1990-03-16

Family

ID=16619194

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56212235A Granted JPS58109859A (ja) 1981-12-24 1981-12-24 光による電圧・電界測定器

Country Status (6)

Country Link
US (1) US4563093A (OSRAM)
EP (1) EP0083196B1 (OSRAM)
JP (1) JPS58109859A (OSRAM)
AU (1) AU563868B2 (OSRAM)
CA (1) CA1194123A (OSRAM)
DE (1) DE3269757D1 (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0231171A (ja) * 1988-07-20 1990-02-01 Ngk Insulators Ltd 光電流・磁界センサ

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59147274A (ja) * 1983-02-10 1984-08-23 Hitachi Ltd 光方式電界測定装置
JPH0721512B2 (ja) * 1987-03-27 1995-03-08 日本碍子株式会社 光センサ用光部品
DE3817568C2 (de) * 1987-05-25 1995-06-22 Hitachi Ltd Optischer Modulator mit einem supraleitenden Oxid
US4857836A (en) * 1987-06-09 1989-08-15 Siemens Aktiengesellschaft Mechanical probe for optical measurement of electrical signals
JPH01259266A (ja) * 1988-04-08 1989-10-16 Hamamatsu Photonics Kk 電圧測定装置
FR2634553B1 (fr) * 1988-07-21 1990-09-07 Schlumberger Ind Sa Dispositif a capteurs optiques principal et secondaire
JPH0670653B2 (ja) * 1989-03-31 1994-09-07 日本碍子株式会社 光温度・電気量測定装置
US4928058A (en) * 1989-05-23 1990-05-22 The University Of Rochester Electro-optic signal measurement
DE3924369A1 (de) * 1989-07-22 1991-01-31 Asea Brown Boveri Verfahren zur messung eines elektrischen feldes oder einer elektrischen spannung und einrichtung zur durchfuehrung des verfahrens
US5434698A (en) * 1989-11-13 1995-07-18 Dai Nippon Printing Co., Ltd. Potential sensor employing electrooptic crystal and potential measuring method
US5124635A (en) * 1990-02-15 1992-06-23 Photon Dynamics, Inc. Voltage imaging system using electro-optics
US5109189A (en) * 1990-02-27 1992-04-28 Geo-Centers, Inc. Single crystal electro-optic sensor with three-axis measurement capability
US5090824A (en) * 1990-07-31 1992-02-25 Geo-Centers, Inc. Fast optical switch having reduced light loss
US5175504A (en) * 1991-06-17 1992-12-29 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing a simple matrix circuit panel
US5432461A (en) * 1991-06-28 1995-07-11 Photon Dynamics, Inc. Method of testing active matrix liquid crystal display substrates
US5444385A (en) * 1991-09-10 1995-08-22 Photon Dynamics, Inc. Testing apparatus for liquid crystal display substrates
US5504438A (en) * 1991-09-10 1996-04-02 Photon Dynamics, Inc. Testing method for imaging defects in a liquid crystal display substrate
US5465052A (en) * 1991-09-10 1995-11-07 Photon Dynamics, Inc. Method of testing liquid crystal display substrates
US5543729A (en) * 1991-09-10 1996-08-06 Photon Dynamics, Inc. Testing apparatus and connector for liquid crystal display substrates
US5459409A (en) * 1991-09-10 1995-10-17 Photon Dynamics, Inc. Testing device for liquid crystal display base plate
JPH05219836A (ja) * 1992-02-04 1993-08-31 Toyobo Co Ltd 壁面の緑化方法
DE4205509A1 (de) * 1992-02-24 1993-08-26 Mwb Pruefsysteme Gmbh Verfahren und sensor zum messen von elektrischen spannungen und/oder elektrischen feldstaerken
US5305136A (en) * 1992-03-31 1994-04-19 Geo-Centers, Inc. Optically bidirectional fast optical switch having reduced light loss
US5298964A (en) * 1992-03-31 1994-03-29 Geo-Center, Inc. Optical stress sensing system with directional measurement capabilities
US5917598A (en) * 1995-12-05 1999-06-29 Jatom Systems Incorporated Method and apparatus for measuring the orientation of optical axes
US6441901B2 (en) 1996-07-23 2002-08-27 Symyx Technologies, Inc. Optical systems and methods for rapid screening of libraries of different materials
US20050009081A1 (en) * 1996-07-23 2005-01-13 Symyx Technologies, Inc. Optical systems and methods for rapid screening of libraries of different materials
DE19639944A1 (de) * 1996-09-27 1998-04-09 Siemens Ag Optische Meßvorrichtung für elektrische Felder/Spannungen mit verringerter Temperaturabhängigkeit
DE19639948C1 (de) * 1996-09-27 1998-05-20 Siemens Ag Optische Meßvorrichtung für elektrische Felder/Spannungen mit planarem Aufbau und optimierter Kleinsignalempfindlichkeit und insbesondere linearer Kennlinie
WO1998015813A1 (en) 1996-10-09 1998-04-16 Symyx Technologies Infrared spectroscopy and imaging of libraries
US6906506B1 (en) * 2001-06-08 2005-06-14 The Regents Of The University Of Michigan Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe
US20030219456A1 (en) * 2002-05-21 2003-11-27 Taing Ok Method of utilization of zygosaccharomyces rouxii
EP1462810B1 (de) * 2003-03-28 2015-09-09 ABB Research Ltd. Temperaturkompensierter elektrooptischer Spannungssensor
EP1462811A1 (de) * 2003-03-28 2004-09-29 Abb Research Ltd. Elektrooptischer Spannungssensor für hohe Spannungen
US8358415B2 (en) 2007-09-06 2013-01-22 The United States Of America, As Represented By The Secretary Of The Navy Apparatus and system for a quasi longitudinal mode electro optic sensor for high power microwave testing
US7920263B2 (en) 2007-09-06 2011-04-05 The United States Of America As Represented By The Secretary Of The Navy Apparatus and system for electro magnetic field measurements and automatic analyses of phase modulated optical signals from electrooptic devices
DE102010045363B4 (de) 2010-09-14 2012-09-06 Kai-Uwe Demasius Elektrostatischer Halbleitersensor

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1484684A (fr) * 1966-03-16 1967-06-16 Merlin Gerin Réducteurs de tension électro-optiques
DE2131224C3 (de) * 1971-06-18 1978-08-17 Siemens Ag, 1000 Berlin Und 8000 Muenchen Einrichtung zur Messung von Spannungen an Hochspannungsleitern
DD135769A1 (de) * 1978-04-13 1979-05-23 Reinhard Demny Verfahren und einrichtung zur elektrischen spannungsmessung im tieftemperaturbereich
DE2845625A1 (de) * 1978-10-19 1980-04-30 Siemens Ag Anordnung zur elektrooptischen spannungsmessung
NL181528C (nl) * 1980-01-12 1987-09-01 Sumitomo Electric Industries Inrichting voor het meten van een spanning of van een elektrisch veld met gebruikmaking van licht.

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0231171A (ja) * 1988-07-20 1990-02-01 Ngk Insulators Ltd 光電流・磁界センサ

Also Published As

Publication number Publication date
DE3269757D1 (en) 1986-04-10
AU9180282A (en) 1983-06-30
EP0083196A1 (en) 1983-07-06
US4563093A (en) 1986-01-07
EP0083196B1 (en) 1986-03-05
AU563868B2 (en) 1987-07-23
CA1194123A (en) 1985-09-24
JPH0211868B2 (OSRAM) 1990-03-16

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