JPS58103665A - 異常検体の自動判定表示方法および装置 - Google Patents

異常検体の自動判定表示方法および装置

Info

Publication number
JPS58103665A
JPS58103665A JP56203208A JP20320881A JPS58103665A JP S58103665 A JPS58103665 A JP S58103665A JP 56203208 A JP56203208 A JP 56203208A JP 20320881 A JP20320881 A JP 20320881A JP S58103665 A JPS58103665 A JP S58103665A
Authority
JP
Japan
Prior art keywords
sample
judgment
abnormal
circuit
channel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56203208A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0323868B2 (enrdf_load_stackoverflow
Inventor
Hidehiko Yamamoto
秀彦 山本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp, Olympus Optical Co Ltd filed Critical Olympus Corp
Priority to JP56203208A priority Critical patent/JPS58103665A/ja
Publication of JPS58103665A publication Critical patent/JPS58103665A/ja
Publication of JPH0323868B2 publication Critical patent/JPH0323868B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00594Quality control, including calibration or testing of components of the analyser
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/82Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator producing a precipitate or turbidity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00594Quality control, including calibration or testing of components of the analyser
    • G01N35/00603Reinspection of samples

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Quality & Reliability (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Plasma & Fusion (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP56203208A 1981-12-16 1981-12-16 異常検体の自動判定表示方法および装置 Granted JPS58103665A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56203208A JPS58103665A (ja) 1981-12-16 1981-12-16 異常検体の自動判定表示方法および装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56203208A JPS58103665A (ja) 1981-12-16 1981-12-16 異常検体の自動判定表示方法および装置

Publications (2)

Publication Number Publication Date
JPS58103665A true JPS58103665A (ja) 1983-06-20
JPH0323868B2 JPH0323868B2 (enrdf_load_stackoverflow) 1991-03-29

Family

ID=16470251

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56203208A Granted JPS58103665A (ja) 1981-12-16 1981-12-16 異常検体の自動判定表示方法および装置

Country Status (1)

Country Link
JP (1) JPS58103665A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6095359A (ja) * 1983-10-22 1985-05-28 Nippon Tectron Co Ltd 血液自動分析装置のデ−タ処理装置
JPS60161560A (ja) * 1983-12-08 1985-08-23 Tokuyama Soda Co Ltd 自動分析装置のデ−タ処理装置
JPS61218949A (ja) * 1985-03-25 1986-09-29 Hitachi Ltd 自動分析装置
JPH02245662A (ja) * 1989-03-18 1990-10-01 Jeol Ltd 自動免疫測定装置
EP2116852A3 (en) * 2008-04-17 2011-07-06 Hitachi High-Technologies Corporation Automatic analyzer

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6095359A (ja) * 1983-10-22 1985-05-28 Nippon Tectron Co Ltd 血液自動分析装置のデ−タ処理装置
JPS60161560A (ja) * 1983-12-08 1985-08-23 Tokuyama Soda Co Ltd 自動分析装置のデ−タ処理装置
JPS61218949A (ja) * 1985-03-25 1986-09-29 Hitachi Ltd 自動分析装置
JPH02245662A (ja) * 1989-03-18 1990-10-01 Jeol Ltd 自動免疫測定装置
EP2116852A3 (en) * 2008-04-17 2011-07-06 Hitachi High-Technologies Corporation Automatic analyzer

Also Published As

Publication number Publication date
JPH0323868B2 (enrdf_load_stackoverflow) 1991-03-29

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