JPS58103534A - Vacuum deposition apparatus - Google Patents

Vacuum deposition apparatus

Info

Publication number
JPS58103534A
JPS58103534A JP20153181A JP20153181A JPS58103534A JP S58103534 A JPS58103534 A JP S58103534A JP 20153181 A JP20153181 A JP 20153181A JP 20153181 A JP20153181 A JP 20153181A JP S58103534 A JPS58103534 A JP S58103534A
Authority
JP
Japan
Prior art keywords
film
gas
plasma
pretreatment
vacuum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20153181A
Other languages
Japanese (ja)
Inventor
Hideo Sanbe
秀雄 三瓶
Yoshimi Akai
赤井 好美
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP20153181A priority Critical patent/JPS58103534A/en
Publication of JPS58103534A publication Critical patent/JPS58103534A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain a vapor-deposited plastic film or the like having a good luster and excellent adhesion, by pretreating a film surface with a gas activated with microwave plasma and vacuum-depositing the film in the same vessel. CONSTITUTION:This apparatus consists of a vessel 1 for vacuum deposition, a system 2 for supplying a pretreatment gas, a system 3 for generating plasma and a system 4 for evacuation. After opening a lid 9, a film is mounted on an apparatus 6. After sealing the treatment chamber 1, the chamber 1 is evacuated to about 10<-4> Torr. From a carrier cylinder 12 and an oxygen cylinder 13, the gases are supplied. Then, a microwave oscillator 16 is operated to generate microwaves by which a treatment gas is converted into plasma. About several tens of seconds suffice for the time of contact between the film and the treatment gas. After completion of the pretreatment, the gas cylinder are stopped, the treatment chamber is evacuated to about 10<-4> Torr and vacuum deposition is carried out by heating an evaporation boat 8 while the film is being rewound.

Description

【発明の詳細な説明】 発明の技術分野 本発明は、プラスチックフィルム等の真空蒸着装置に係
り同一容器内で、マイクロ波プラズマを用いて活性化し
九ガスでフィルム表面を前処理する真空蒸着装置に−す
る。
DETAILED DESCRIPTION OF THE INVENTION Technical Field of the Invention The present invention relates to a vacuum evaporation apparatus for plastic films, etc., and relates to a vacuum evaporation apparatus for pretreating the surface of a film with nine gases activated using microwave plasma in the same container. - to do.

発明のfl!術的背景とそ0間層点 一般に、フィルムKM着ヤスバッタリングを行なう場合
の前処理として、フィルム表面の應埃を拭き取ったり、
#1剤で洗浄した9、あるい社付着性の悪い材料に対し
てはコロナ放電処1ullを施してから蒸着する。コロ
ナ放電処理の場合には通常高周波電極と鋳電材によって
被覆された回転金属ロールからな9、コロナ放電処理は
被処理物であるプラスチックフィルムを上記ロールと電
極の閣を通過させながらコロナ放電をさせて行うもので
ある。しかし、従来のこうして前処理を行う丸後フィル
ムを蒸着装置に入れて蒸着する方法では、フィルムと蒸
着膜との密着性が悪く、また光沢のよい蒸着膜が得られ
にくい。さらに詳しくは、九とえばコロナ放電処理の場
合には処jlKよってフィルム表面が、活性化された効
果が経時的に減少するため、処理されたフィルムは早期
KJI着を行わなければならない。また、たとえば金属
を蒸着し九場合、蒸着金属が経時的に剥離しゃすくなる
等の事実上の欠点を持っていた。
Invention fl! Technical Background and Layer Point Generally, as a pretreatment when performing film KM sand battering, the dust on the film surface is wiped off,
For materials that have been cleaned with agent #1 or that have poor adhesion, 1μll of corona discharge treatment is applied before vapor deposition. In the case of corona discharge treatment, a rotating metal roll coated with a high-frequency electrode and an electrocasting material is usually used.9 In corona discharge treatment, corona discharge is caused while the plastic film to be treated is passed through the cabinet of the roll and electrode. This is done by However, in the conventional method of depositing a pretreated film in a vapor deposition apparatus, the adhesion between the film and the deposited film is poor, and it is difficult to obtain a deposited film with good gloss. More specifically, in the case of corona discharge treatment, for example, the treated film must be subjected to early KJI deposition because the activation effect of the film surface decreases over time. Furthermore, when metal is vapor-deposited, for example, there is a practical drawback that the vapor-deposited metal tends to peel off over time.

発明の目的 本発明は、プラスチックフィルムのJUIIIKおける
上記欠点KfI/1み、光沢がよく、また密着性のすぐ
れた蒸着膜を得るための真空蒸着装置を提供するととK
ある0 発明の概要 本装置はたとえばアルゴン酸素混合ガス中窒素酸素混合
ガスあるいは酸素ガスを、マイクロ波放電によって発生
させ九プラズマにより活性化させプラズマ発生部から分
離された下流側領域で、咳活性ガスとフィルムとを接触
させ、前処理を行った後、同じ容器内でさらに真空度を
上げて蒸着を行なう装置である。
OBJECTS OF THE INVENTION The present invention addresses the above-mentioned drawbacks of KfI/1 in the plastic film JUIIIK and provides a vacuum deposition apparatus for obtaining a deposited film with good gloss and excellent adhesion.
0 Summary of the Invention This device generates, for example, a nitrogen-oxygen mixed gas in an argon-oxygen mixed gas or oxygen gas by microwave discharge, activates it with nine plasma, and generates a cough activated gas in a downstream area separated from the plasma generation part. This device brings the film into contact with the film, performs pretreatment, and then further increases the degree of vacuum in the same container to perform vapor deposition.

発明の実施例 第1図は、本発明の真空蒸着装置の構成例を示す。本装
置は、蒸着処理容器(1)、−処理ガス供給系(2)、
プラズマ発生系(3)、排気系(4)とから構成されて
いる。さらに詳しくは、蒸着処理容111(1)はフィ
ルム(5)、フィルム巻取り装置(6)、蒸着膜1m(
7) 。
Embodiment of the Invention FIG. 1 shows an example of the configuration of a vacuum evaporation apparatus of the invention. This apparatus includes a vapor deposition processing container (1), a processing gas supply system (2),
It consists of a plasma generation system (3) and an exhaust system (4). More specifically, the vapor deposition processing chamber 111(1) includes a film (5), a film winding device (6), a vapor deposited film of 1 m (
7).

蒸着用ボー[8)、41体(9)、0リングall、キ
ャパシタンス1ノメータallからな9、ま九処理ガス
供給系(2)は、キャリアーガスO貯賦ボンベn、酸素
の貯蔵ボンベas、重量針aJ&よびニードル弁(ハ)
を備えておシ、ガスをプラズマ発生系(3)に供給する
構造を採っている。またプラズマ発生系(3)は、マイ
クロ波発振an、マイクロ波伝送のための導波管αη、
さらにインピーダンス整合を行なうためのスリースタプ
チ凰−すα呻、プランジャーa傷、水冷管(至)、およ
びプラズマ発生管c21)を備えている0また排気系(
4)は排気系トラップ(2)、真空ポンプ(ハ)を備え
ている。
Vapor deposition board [8], 41 bodies (9), 0 rings all, capacitance 1 nometer all 9, 9, process gas supply system (2), carrier gas O storage cylinder n, oxygen storage cylinder as, Weight needle aJ & needle valve (c)
The plasma generation system (3) is provided with a structure in which gas is supplied to the plasma generation system (3). In addition, the plasma generation system (3) includes microwave oscillation an, a waveguide αη for microwave transmission,
In addition, it is equipped with three small holes, a plunger, a water-cooled tube, and a plasma generation tube for impedance matching, and an exhaust system (
4) is equipped with an exhaust system trap (2) and a vacuum pump (c).

以下、上記の構成を有する装置を用いて、フィルムを真
空蒸着する手順について記す。
Hereinafter, a procedure for vacuum-depositing a film using the apparatus having the above configuration will be described.

まず蓋体(9)をあけて、フィルムをフィルム巻取〕装
置(6)K装着する。次に処理室を密閉し死後、真空ポ
ンプ(至)を動作させて、処理室(1)内を1(r’ 
tuff程度まで排気する。次いでキャリアーガスボン
ベα湯および酸素ガスボンベ(Lsを開いてガスを供給
するO この際、キャリアーガスと酸素の混合比は薗対l〜5対
l(キャリアーガス対酸素)が処理効果の点から好まし
い。まえ、この時の処暑容器(D内の圧力は10−〜1
Qtorr一度、流量too 〜500mj/4in程
度が好ましく、これは流量計Iを見ながらニードル弁α
$を使って調整する0次にマイクロ波発振器−を作動さ
せて、例えば周波数2450MHg、電力2KWのマイ
クロ波を発振させ、スリースタブチェーナα時およびプ
ランジャーQlでインピーダンス整合し、プラズマ発生
部にマイクロ波を伝送して。
First, open the lid (9) and attach the film to the film winding device (6)K. Next, the processing chamber is sealed and after death, the vacuum pump (to) is operated to pump the inside of the processing chamber (1) to 1 (r'
Exhaust to about tuff. Next, the carrier gas cylinder α hot water and the oxygen gas cylinder (Ls are opened to supply gases. At this time, the mixing ratio of the carrier gas and oxygen is preferably 1:1 to 5:1 (carrier gas:oxygen) from the viewpoint of the processing effect. Before, at this time, the pressure inside the heat treatment container (D is 10-1
Once Qtorr, the flow rate is preferably about ~500mj/4in. This is done by checking the needle valve α while watching the flowmeter I.
Activate the zero-order microwave oscillator that is adjusted using $, oscillate microwaves with a frequency of 2450 MHg and a power of 2 KW, and match the impedance with the sleeve stub chainer α and plunger Ql, and send it to the plasma generation part. Transmit microwaves.

前記処理ガスを放電させプラズマとなす0こうして活性
化されたガスは、処理室(1)内に流入しフィルム(5
)と接触して、フィルム表面を改質する。
The processing gas is discharged to form plasma. The thus activated gas flows into the processing chamber (1) and forms a plasma (5).
) to modify the film surface.

ま九、フィルムはsap装置(6)kよって一定遮度で
送られてお)、処理した後KIk*られてゆく。
Finally, the film is sent through a SAP device (6)k at a constant shielding angle), processed, and then sent to KIk*.

このときのフィルムと処理ガスとの接触時間(処理時間
)は、数十秒1度で充分であるoeli処理が終り九ら
次に、ガス類のボンベの4&を閉じるとともに、ニード
ル弁(1sを締め、処理容器内圧力を。
At this time, the contact time (processing time) between the film and the processing gas is several tens of seconds once.Next, after the Oeli processing is completed, close the gas cylinder 4 & and close the needle valve (1s). Tighten the pressure inside the processing vessel.

10 ’ torr@度まで減圧し先後、前処理後のフ
ィルムを再度巻−堆〉ながら蒸着ボート(8)を加熱し
て蒸着する。
After reducing the pressure to 10' torr@degrees, the pretreated film is re-rolled and deposited while heating the deposition boat (8) for deposition.

本発明の装置によ)処暑し九フィルムと未嶋珊の場合お
よびコロナ放電を用いて処理した場合のフィルムの比較
例を第1表に示す。
Table 1 shows comparative examples of films treated by the apparatus of the present invention) and films treated with San Mishima and corona discharge.

ls1表 本発明における前処理に関して杜、フィルムO接触角が
急激に減少するととくより1m着に−われることが確か
められている。
Regarding the pretreatment in the present invention, it has been confirmed that if the contact angle of the film suddenly decreases, the film will be more likely to adhere to 1m.

ポリフッ化ビニリデンフィルムの金属蒸着を例にとった
場合、一般に実用性のあるポリフッ化ビニリデンフィル
ムの接触角は55〜600以下、望ましくは500以下
である。ll!lに、コロナ放電処理をした後、従来装
置を用いた場合と、本装置を眉いえ場合の実験結果を示
し九〇ま九亜鉛およびアル書ニウムの蒸着膜をそれぞれ
のフィルムに形成し先後、七四テープ(3M社II)を
彊ヤ付け、剥離させ走時の蒸着膜の剥離状況も示し九〇
これは実用的な蒸着膜O11着性は、セロテープをfi
l)付け、セロテープを剥離し良状態で金属蒸着lKが
同時に剥離し込いことが必要であるためである〇@1よ
〕明らかなように、本装置ではセロテープによる剥離テ
ストで、従来装置が1〜6ケ月後に剥離するのく対し1
本装置では1年経てもなお剥離せず、処理効果が持続し
ているのがわかる。
Taking metal vapor deposition of polyvinylidene fluoride film as an example, the contact angle of polyvinylidene fluoride film that is generally practical is 55 to 600 or less, preferably 500 or less. ll! Figure 1 shows the experimental results when using a conventional device and using this device after corona discharge treatment, and after forming evaporated films of zinc and arsenium on each film, 74 Tape (3M Company II) is applied and peeled off, and the peeling status of the vapor deposited film during running is also shown.
This is because it is necessary to peel off the cellophane tape and peel off the metal vapor deposited lK at the same time in good condition 〇@1] As is clear, in the peeling test using cellophane tape, this device was superior to the conventional device. Against peeling after 1 to 6 months 1
With this device, no peeling occurred even after one year, indicating that the treatment effect was sustained.

また従来装置では前処理効果を上けるために必畳以上K
II触角を下げようとすると、過度の前処理条件になp
、ピンホールを誘発してフィルムの特性を著しく悪化さ
せてしまう。
In addition, in conventional equipment, in order to improve the pretreatment effect,
If you try to lower the II antennae, you will end up with excessive pretreatment conditions.
, which induces pinholes and significantly deteriorates the properties of the film.

これに対して本装置では前処理反応が起こるのは処理ガ
スKII触したフィルム表面部だけであるため、かな〕
過度の部層条件で行なり九としてもピンホールを発生す
ること社ない。まえ、本装置で祉従来のように前処理後
、大気下で放置されることもないため、フィルム表面の
汚染中水分の教壇等も全くなく、また前処理直後、蒸着
を行なうため、前処理効果がきわめて効果的に働−1す
ぐれた蒸着膜を得ることができるのが特徴である0本装
置による蒸着膜の密着性向上および外観性向上に関する
理由を、本発明者は次の様に考えている。
On the other hand, with this device, the pretreatment reaction occurs only on the surface of the film that is in contact with the processing gas KII.
Even if this is done under excessive layer conditions, pinholes are unlikely to occur. First, because this device is not left in the atmosphere after pretreatment as in conventional methods, there is no chance of moisture contaminating the film surface, and since vapor deposition is performed immediately after pretreatment, pretreatment The inventor of the present invention considers the reasons for the improved adhesion and appearance of the deposited film by this device as follows: ing.

一般に蒸着膜の密着性は以下の諸条件により影響を受け
ると考えられる。すなわち、フィルム表面に水分、残留
溶剤、可塑剤未反応上ツマ−などが存在すると、7.イ
ルム基材と蒸着膜との界面にこうし九不純物あるいは添
加剤が介在する丸め。
Generally, the adhesion of a deposited film is considered to be affected by the following conditions. That is, if moisture, residual solvent, unreacted plasticizer, etc. are present on the film surface, 7. A rounding process in which impurities or additives are present at the interface between the film base material and the deposited film.

密着力が小さくなる。ま九フィルム材質の極性も大きく
影響し、ポリプロピレンやポリエチレンは剥離し中すい
材質とい見る。さらにフィルムの嶺細な表面粗さKも影
響されると考えられる。
Adhesion strength decreases. The polarity of the film material also has a large effect, and polypropylene and polyethylene are considered to be thin materials that peel off. Furthermore, it is thought that the ridged surface roughness K of the film is also affected.

これらの密着性に影響を及ぼす諸条件に対し本装置では
マイクロ波プラズマにより、鳥い反応性を有する活性種
、たとえば酸素ラジカル、#嵩イオン等が生成され、こ
れがフィルム表面と次0ような反応を起こす丸めと考え
られる。ま九同時に同一容器内で続けて処理を行うため
、処理後、大気中に出して大気中の水分、塵埃、ガス等
の汚染を受けることが全くないことも大きな理由と考え
られる。
In response to these conditions that affect adhesion, this device uses microwave plasma to generate highly reactive active species, such as oxygen radicals and bulk ions, which cause the following reactions with the film surface. This is considered to be rounding that causes Another reason is that since the treatment is carried out simultaneously in the same container, there is no chance of the treatment being exposed to the atmosphere and being contaminated by moisture, dust, gas, etc. in the atmosphere.

(1)残雷濤剤、可■削、未反応モノ1−などを酸化除
去する0 (2)フィルム基材と反応し、表面を酸化するので極性
を増加させる。
(1) It oxidizes and removes residual lightning repellents, scrapers, unreacted substances, etc. (2) It reacts with the film base material and oxidizes the surface, increasing polarity.

(3)鹸化反応により、フィルム表面を極微細に粗す0 (4)処理が真空系である丸め、水分を始めとする揮尭
威分等を線処理段階で除去で龜る0このように1本装置
を用いると、蒸着膜の光沢が良く、良質の纒が得られる
。一般KJI着属の光沢は、JII1着容器の真空度に
影響を受けるが、この点1本方法によれば水分中践*S
剤、町−剤、未反応噌ノi−等瀬着容器の真空度を悪く
する成分を前処!IIKよって除去し、その後、大気中
にさらされゐことがないため、真空度を悪くする成分の
着あるいは付着がなく、さらに大気中の塵埃等で汚染さ
れることも全くないため、光沢のよい威が得られるもの
と考えられる0 発明の効果 以上の如く、本真空蒸着装置を用いて蒸着すれば、フィ
ルム基材きの密着性がすぐれ、光沢のよい蒸着膜を得る
ことかで自、工業上非常に有用である0
(3) Due to the saponification reaction, the surface of the film is extremely finely roughened. (4) The rounding process is performed in a vacuum system, and volatile components such as moisture are removed during the line treatment stage. When one apparatus is used, the deposited film has good gloss and a high quality finish can be obtained. The gloss of general KJI deposition is affected by the degree of vacuum of the JII 1 deposition container, but in this respect, if the 1 method is used,
Pre-prepare ingredients that worsen the vacuum of the container, such as additives, cleaning agents, and unreacted waste! Since it is removed by IIK and is not exposed to the atmosphere afterwards, there is no adhesion or adhesion of components that would impair the degree of vacuum, and there is no contamination with dust in the atmosphere, resulting in a high-gloss finish. Effects of the Invention As described above, if the present vacuum evaporation apparatus is used for vapor deposition, it will be possible to obtain a vapor deposited film with excellent adhesion to the film base material and good gloss, which will be useful in both the industry and the industry. 0 which is very useful

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本発明の一実施例を示す概略構成図である0 1・・・フィルム処理室、2・・・処理ガス供給系。 3・・・プラズマ発生系、4・・・排気系、5・・・フ
ィルム、  6・・・フィルム巻取り装置。
The drawings are schematic configuration diagrams showing one embodiment of the present invention. 0 1...Film processing chamber, 2... Processing gas supply system. 3... Plasma generation system, 4... Exhaust system, 5... Film, 6... Film winding device.

Claims (2)

【特許請求の範囲】[Claims] (1)マイクロ諌放電によシ発生させ九プラズマを用い
て活性化し九ガスで、フィルム表面を前処理し先後、同
一容器内で蒸着することを特徴とするフィルムの真空蒸
着装置。
(1) A vacuum evaporation apparatus for a film, which is characterized in that the surface of the film is pretreated with a gas generated by a micro-discharge and activated using a gas, and then the film is deposited in the same container.
(2)前記処理ガスとして、アルゴン対酸素混合ガスあ
るいは窒素対酸素混合ガスをそれぞれ団対l〜5対10
−合で使用することを特徴とする特許請求の範囲第1項
記載のフィルムの真空蒸着装置。
(2) As the processing gas, use a mixed gas of argon and oxygen or a mixed gas of nitrogen and oxygen at a ratio of 1 to 5 to 10, respectively.
- The film vacuum deposition apparatus according to claim 1, which is used in the following cases.
JP20153181A 1981-12-16 1981-12-16 Vacuum deposition apparatus Pending JPS58103534A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20153181A JPS58103534A (en) 1981-12-16 1981-12-16 Vacuum deposition apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20153181A JPS58103534A (en) 1981-12-16 1981-12-16 Vacuum deposition apparatus

Publications (1)

Publication Number Publication Date
JPS58103534A true JPS58103534A (en) 1983-06-20

Family

ID=16442584

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20153181A Pending JPS58103534A (en) 1981-12-16 1981-12-16 Vacuum deposition apparatus

Country Status (1)

Country Link
JP (1) JPS58103534A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0328365A (en) * 1989-03-20 1991-02-06 Hitachi Ltd Metal/organic high molecular synthetic resin-conjugated material and its production
JP2016014161A (en) * 2014-06-30 2016-01-28 トーカロ株式会社 Polymer elastomer member excellent in antifouling property, and roll member using the same

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4865271A (en) * 1971-12-13 1973-09-08
JPS50159567A (en) * 1974-06-14 1975-12-24
JPS5122770A (en) * 1974-08-19 1976-02-23 Matsushita Electric Ind Co Ltd OREFUINKEIKOBUNSHIFUIRUMUNO KINZOKUKAHOHO
JPS5187579A (en) * 1975-01-31 1976-07-31 Citizen Watch Co Ltd
JPS5362982A (en) * 1976-11-17 1978-06-05 Toshiba Corp Plasma cvd apparatus

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4865271A (en) * 1971-12-13 1973-09-08
JPS50159567A (en) * 1974-06-14 1975-12-24
JPS5122770A (en) * 1974-08-19 1976-02-23 Matsushita Electric Ind Co Ltd OREFUINKEIKOBUNSHIFUIRUMUNO KINZOKUKAHOHO
JPS5187579A (en) * 1975-01-31 1976-07-31 Citizen Watch Co Ltd
JPS5362982A (en) * 1976-11-17 1978-06-05 Toshiba Corp Plasma cvd apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0328365A (en) * 1989-03-20 1991-02-06 Hitachi Ltd Metal/organic high molecular synthetic resin-conjugated material and its production
JP2016014161A (en) * 2014-06-30 2016-01-28 トーカロ株式会社 Polymer elastomer member excellent in antifouling property, and roll member using the same

Similar Documents

Publication Publication Date Title
JPH10121255A (en) Device for vapor-depositing shielding film on three dimensional article
JPH07504944A (en) Pretreatment method for the surface of plastic products
EP0686708A4 (en) Film forming method and film forming apparatus
JPS58103534A (en) Vacuum deposition apparatus
JPH06279998A (en) Dry coating method for inside surface of cylinder
JP2000328248A (en) Method for cleaning thin film forming apparatus and thin film forming apparatus
JPH03229886A (en) Atmospheric glow etching method
JPS5710629A (en) Plasma treatment of hollow body
JPH033700B2 (en)
JP2002093823A (en) Thin-film forming device
JPH0382747A (en) Formation of thin metal-surface film excellent in corrosion resistance and adhesive strength
JPH058272B2 (en)
JPS6314422A (en) Plasma chemical vapor desposition method
JPS5831078A (en) Method and device for pretreatment of film substrate
JPS62170477A (en) Coating method for inside and outside surface of pipe
JPS6025733A (en) Method of treating with plasma
JPH0287101A (en) Production of antireflection film
CN110088355B (en) Method for hydrophobizing substrates
JPH02194179A (en) Film forming device
JPS61256640A (en) Plasma chemical vapor deposition apparatus
JPH08188663A (en) Process for treating surface of substrate
JPH0315531Y2 (en)
JPS6014831B2 (en) Coating method and device for inner surface of metal tube
JPS5956723A (en) Thin film forming apparatus
JPH05131170A (en) Painting pretreatment method