JPS5794668A - Measuring method of thermal resistance - Google Patents

Measuring method of thermal resistance

Info

Publication number
JPS5794668A
JPS5794668A JP17039380A JP17039380A JPS5794668A JP S5794668 A JPS5794668 A JP S5794668A JP 17039380 A JP17039380 A JP 17039380A JP 17039380 A JP17039380 A JP 17039380A JP S5794668 A JPS5794668 A JP S5794668A
Authority
JP
Japan
Prior art keywords
forward voltage
temperature
thermal resistance
variation
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17039380A
Other languages
English (en)
Inventor
Jun Fukaya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP17039380A priority Critical patent/JPS5794668A/ja
Publication of JPS5794668A publication Critical patent/JPS5794668A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP17039380A 1980-12-03 1980-12-03 Measuring method of thermal resistance Pending JPS5794668A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17039380A JPS5794668A (en) 1980-12-03 1980-12-03 Measuring method of thermal resistance

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17039380A JPS5794668A (en) 1980-12-03 1980-12-03 Measuring method of thermal resistance

Publications (1)

Publication Number Publication Date
JPS5794668A true JPS5794668A (en) 1982-06-12

Family

ID=15904089

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17039380A Pending JPS5794668A (en) 1980-12-03 1980-12-03 Measuring method of thermal resistance

Country Status (1)

Country Link
JP (1) JPS5794668A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103630820A (zh) * 2013-12-03 2014-03-12 黑龙江省计量科学研究院 大功率led热阻测量装置及采用该装置测量大功率led热阻的方法
CN104142463A (zh) * 2014-07-16 2014-11-12 西安芯派电子科技有限公司 一种场效应晶体管tsp参数的提取方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103630820A (zh) * 2013-12-03 2014-03-12 黑龙江省计量科学研究院 大功率led热阻测量装置及采用该装置测量大功率led热阻的方法
CN104142463A (zh) * 2014-07-16 2014-11-12 西安芯派电子科技有限公司 一种场效应晶体管tsp参数的提取方法

Similar Documents

Publication Publication Date Title
JPS5794668A (en) Measuring method of thermal resistance
JPS57208428A (en) Temperature detecting device
JPS6461611A (en) Air flow rate sensor
JPS5359385A (en) Production method of semiconductor thermal sensitive element
JPS5244573A (en) Method of mesuring thermal resistance of impatt diode
JPS57102085A (en) Adjusting method for photo output of semiconductor laser
JPS5763839A (en) Method and device for judging semiconductor element
Oskot'skii et al. Temperature dependence of thermal expansion of cadmium sulfide in the range from 20 to 820 degree K
KIMURA et al. Studies on the Finger Skin Temperature Reaction during a Cold Water Immersion On the adaptability of swimmers
JPS5299443A (en) Inrush current reducing device of positive temperature coefficient res istance element
JPS5475278A (en) Heat resistance measuring method for impatt diode
JPS5414683A (en) Measuring circuit for turn-off time
JPS5739364A (en) Thermal resistance measuring method of semiconductor device
JPS5483390A (en) Protective device for superconductive coil
JPS5320778A (en) Amorphous semiconductor switching element
JPS547280A (en) Measuring method for thermal resistance of transistor
JPS54142081A (en) Semiconductor integrated circuit
JPS52114985A (en) Heating of test cable
JPS5333081A (en) Semiconductor light emitting device
JPS5649559A (en) Semiconductor integrated circuit device
JPS53109112A (en) Control device of motor
JPS5598873A (en) Temperature compensated type constant-voltage diode
JPS52120780A (en) Semiconductor device
JPS5292483A (en) Semiconductor device
JPS56112117A (en) Delay circuit