JPS5763839A - Method and device for judging semiconductor element - Google Patents

Method and device for judging semiconductor element

Info

Publication number
JPS5763839A
JPS5763839A JP13883380A JP13883380A JPS5763839A JP S5763839 A JPS5763839 A JP S5763839A JP 13883380 A JP13883380 A JP 13883380A JP 13883380 A JP13883380 A JP 13883380A JP S5763839 A JPS5763839 A JP S5763839A
Authority
JP
Japan
Prior art keywords
supply current
semiconductor element
ratio
current value
switch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13883380A
Other languages
Japanese (ja)
Inventor
Toshiharu Ishida
Riichi Uetsuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP13883380A priority Critical patent/JPS5763839A/en
Publication of JPS5763839A publication Critical patent/JPS5763839A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To judge the life of a semiconductor simply based on the correlation between the ratio of supply current values in two conditions and the thermal dependency thereof, by measuring the supply current value of the semiconductor element in the cut-off state at the normal temperature and at the time of heating and by calculating said ratio. CONSTITUTION:A prescribed voltage is impressed from a DC supply source 8 on the input terminal of the semiconductor element 11 placed in the cut-off state at the normal temperature and a current flows from the output terminal thereof through the intermediary of a switch 9 and a resistor 7. This current is memorized and held as the first supply current value. Next, a switch 10 is opened and a switch 12 is closed, and the semiconductor element is heated under the condition. A value measured at this time is determined as the second supply current value. Then the ratio between the first and second supply current values are calculated and, based on the correlation between the ratio and the temperature dependency of a supply current value found beforehand, the life of the element is judged. By this constitution, the semiconductor element is judged simply and in short time.
JP13883380A 1980-10-06 1980-10-06 Method and device for judging semiconductor element Pending JPS5763839A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13883380A JPS5763839A (en) 1980-10-06 1980-10-06 Method and device for judging semiconductor element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13883380A JPS5763839A (en) 1980-10-06 1980-10-06 Method and device for judging semiconductor element

Publications (1)

Publication Number Publication Date
JPS5763839A true JPS5763839A (en) 1982-04-17

Family

ID=15231279

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13883380A Pending JPS5763839A (en) 1980-10-06 1980-10-06 Method and device for judging semiconductor element

Country Status (1)

Country Link
JP (1) JPS5763839A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4489477A (en) * 1984-02-23 1984-12-25 Northern Telecom Limited Method for screening laser diodes
JP2008124049A (en) * 2006-11-08 2008-05-29 Sanyo Electric Co Ltd Inspection method of semiconductor chip
CN113030683A (en) * 2021-03-15 2021-06-25 五羊—本田摩托（广州）有限公司 Method, medium and computer equipment for measuring temperature of power switch device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4489477A (en) * 1984-02-23 1984-12-25 Northern Telecom Limited Method for screening laser diodes
JP2008124049A (en) * 2006-11-08 2008-05-29 Sanyo Electric Co Ltd Inspection method of semiconductor chip
CN113030683A (en) * 2021-03-15 2021-06-25 五羊—本田摩托（广州）有限公司 Method, medium and computer equipment for measuring temperature of power switch device

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