JPS5768071A - Semiconductor device with protective element - Google Patents
Semiconductor device with protective elementInfo
- Publication number
- JPS5768071A JPS5768071A JP55143348A JP14334880A JPS5768071A JP S5768071 A JPS5768071 A JP S5768071A JP 55143348 A JP55143348 A JP 55143348A JP 14334880 A JP14334880 A JP 14334880A JP S5768071 A JPS5768071 A JP S5768071A
- Authority
- JP
- Japan
- Prior art keywords
- gate
- substrate
- type
- resistor
- diodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
- H01L27/0255—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using diodes as protective elements
Abstract
PURPOSE:To effectively prevent the damage of a gate in an MISFET by inserting a protective resistor between a gate electrode and a gate input terminal and two diodes connected reversely through the resistor between the gate electrode and a substrate. CONSTITUTION:Diodes 23, 24 are connected reversely through a resistor 20' in a distribution manner between a gate electrode 8 and a substrate electrode 9 (ground). Then, one diode reversely biased constantly is inserted irrespective of the polarity in the surge voltage, thereby preventing the gate damage due to application of surge voltage from the terminal side of a power source. An N type resistance region 20 formed in the P type layer 19 of an N type substrate can form the layer 19 simultaneously upon formation of the P type layer of N channel FET, the impurity density of the layers 19 and 20 are selected with respect to the N type substrate to set the breakdown voltage of the diodes 23, 24. With this construction, the structure is simple and has large protective effect.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55143348A JPS5768071A (en) | 1980-10-14 | 1980-10-14 | Semiconductor device with protective element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55143348A JPS5768071A (en) | 1980-10-14 | 1980-10-14 | Semiconductor device with protective element |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5768071A true JPS5768071A (en) | 1982-04-26 |
Family
ID=15336694
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55143348A Pending JPS5768071A (en) | 1980-10-14 | 1980-10-14 | Semiconductor device with protective element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5768071A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6021561A (en) * | 1983-07-15 | 1985-02-02 | Nec Corp | Semiconductor protection device |
CN1037044C (en) * | 1988-12-20 | 1998-01-14 | 菲利浦电子有限公司 | Protection of power integrated circuits against load voltage surges |
KR100296147B1 (en) * | 1992-06-29 | 2001-10-22 | 이데이 노부유끼 | Semiconductor device and horizontal register of solid-state image sensing device |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54146975A (en) * | 1978-05-10 | 1979-11-16 | Nec Corp | Protection circuit of semiconductor device |
-
1980
- 1980-10-14 JP JP55143348A patent/JPS5768071A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54146975A (en) * | 1978-05-10 | 1979-11-16 | Nec Corp | Protection circuit of semiconductor device |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6021561A (en) * | 1983-07-15 | 1985-02-02 | Nec Corp | Semiconductor protection device |
JPH0244156B2 (en) * | 1983-07-15 | 1990-10-02 | Nippon Electric Co | |
CN1037044C (en) * | 1988-12-20 | 1998-01-14 | 菲利浦电子有限公司 | Protection of power integrated circuits against load voltage surges |
KR100296147B1 (en) * | 1992-06-29 | 2001-10-22 | 이데이 노부유끼 | Semiconductor device and horizontal register of solid-state image sensing device |
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