JPS5767327A - Error testing device - Google Patents

Error testing device

Info

Publication number
JPS5767327A
JPS5767327A JP14469280A JP14469280A JPS5767327A JP S5767327 A JPS5767327 A JP S5767327A JP 14469280 A JP14469280 A JP 14469280A JP 14469280 A JP14469280 A JP 14469280A JP S5767327 A JPS5767327 A JP S5767327A
Authority
JP
Japan
Prior art keywords
signal
output
subjected
digital
calculation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14469280A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0132692B2 (enrdf_load_stackoverflow
Inventor
Taketo Saito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nissin Electric Co Ltd
Original Assignee
Nissin Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nissin Electric Co Ltd filed Critical Nissin Electric Co Ltd
Priority to JP14469280A priority Critical patent/JPS5767327A/ja
Publication of JPS5767327A publication Critical patent/JPS5767327A/ja
Publication of JPH0132692B2 publication Critical patent/JPH0132692B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
    • G11B20/1816—Testing

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Analogue/Digital Conversion (AREA)
JP14469280A 1980-10-15 1980-10-15 Error testing device Granted JPS5767327A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14469280A JPS5767327A (en) 1980-10-15 1980-10-15 Error testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14469280A JPS5767327A (en) 1980-10-15 1980-10-15 Error testing device

Publications (2)

Publication Number Publication Date
JPS5767327A true JPS5767327A (en) 1982-04-23
JPH0132692B2 JPH0132692B2 (enrdf_load_stackoverflow) 1989-07-10

Family

ID=15368042

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14469280A Granted JPS5767327A (en) 1980-10-15 1980-10-15 Error testing device

Country Status (1)

Country Link
JP (1) JPS5767327A (enrdf_load_stackoverflow)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59187233U (ja) * 1983-05-27 1984-12-12 関西電力株式会社 誤差試験装置
JPS60109333A (ja) * 1983-10-20 1985-06-14 バアー‐ブラウン　コーポレーシヨン 高速データ変換部品を動的にテストするためのサンプリング波形デジタイザ
JPS6162440U (enrdf_load_stackoverflow) * 1984-09-27 1986-04-26
JPS63105527A (ja) * 1986-10-22 1988-05-10 Yokogawa Electric Corp 並列比較型ａ／ｄ変換器試験装置
JPS63131726A (ja) * 1986-11-21 1988-06-03 Yokogawa Electric Corp Ａ／ｄ変換器試験装置
JPS63135021A (ja) * 1986-11-26 1988-06-07 Yokogawa Electric Corp Ａ／ｄ変換器試験装置
JPS6460022A (en) * 1987-08-05 1989-03-07 Tektronix Inc Method and apparatus for measuring effective resolution of digitizer
JPH05297061A (ja) * 1991-03-04 1993-11-12 Mitsubishi Electric Corp 半導体集積回路
JP2006266837A (ja) * 2005-03-23 2006-10-05 Advantest Corp 試験装置
JP2008037413A (ja) * 2006-07-13 2008-02-21 Yazaki Corp 取付構造

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5279058U (enrdf_load_stackoverflow) * 1975-12-11 1977-06-13

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5279058U (enrdf_load_stackoverflow) * 1975-12-11 1977-06-13

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59187233U (ja) * 1983-05-27 1984-12-12 関西電力株式会社 誤差試験装置
JPS60109333A (ja) * 1983-10-20 1985-06-14 バアー‐ブラウン　コーポレーシヨン 高速データ変換部品を動的にテストするためのサンプリング波形デジタイザ
JPS6162440U (enrdf_load_stackoverflow) * 1984-09-27 1986-04-26
JPS63105527A (ja) * 1986-10-22 1988-05-10 Yokogawa Electric Corp 並列比較型ａ／ｄ変換器試験装置
JPS63131726A (ja) * 1986-11-21 1988-06-03 Yokogawa Electric Corp Ａ／ｄ変換器試験装置
JPS63135021A (ja) * 1986-11-26 1988-06-07 Yokogawa Electric Corp Ａ／ｄ変換器試験装置
JPS6460022A (en) * 1987-08-05 1989-03-07 Tektronix Inc Method and apparatus for measuring effective resolution of digitizer
JPH05297061A (ja) * 1991-03-04 1993-11-12 Mitsubishi Electric Corp 半導体集積回路
JP2006266837A (ja) * 2005-03-23 2006-10-05 Advantest Corp 試験装置
JP2008037413A (ja) * 2006-07-13 2008-02-21 Yazaki Corp 取付構造

Also Published As

Publication number Publication date
JPH0132692B2 (enrdf_load_stackoverflow) 1989-07-10

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