JPS57157164A - Testing method for reliability in thermo-acceleration of integrated circuit - Google Patents

Testing method for reliability in thermo-acceleration of integrated circuit

Info

Publication number
JPS57157164A
JPS57157164A JP56042503A JP4250381A JPS57157164A JP S57157164 A JPS57157164 A JP S57157164A JP 56042503 A JP56042503 A JP 56042503A JP 4250381 A JP4250381 A JP 4250381A JP S57157164 A JPS57157164 A JP S57157164A
Authority
JP
Japan
Prior art keywords
coder
analog signal
square
signals
square wave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56042503A
Other languages
Japanese (ja)
Inventor
Takeshi Mizusawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP56042503A priority Critical patent/JPS57157164A/en
Publication of JPS57157164A publication Critical patent/JPS57157164A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To prevent the breakage of a CODER at the turning on of a power source eliminating the need for an exclusive square wave oscillator by inputting easy ti generate square signals into an analog signal input terminal. CONSTITUTION:Square signals having an appropriate amplitude made by R1 and R2 are applied to an analog signal input terminal 2 of a CODER to be tested from an output terminal 1 of a square wave generation circuit. The square wave generation cicuit can be composed of one IC and several resistance capacitors. The symbol C indicates a capacitor for removing a DC content. The CODER being tested is placed at a high temperature (e.g. about 150 deg.C). A PCM coding circuit in the CODER codes analog signals. So, even when an aquare wave is applied, an electric stress can be provided to an internal circuit of the CODER in such a manner as to be equivelent to that when an analog signal is applied. This elminates special testing device thereby the testing with a simple oscillator can be achieved.
JP56042503A 1981-03-25 1981-03-25 Testing method for reliability in thermo-acceleration of integrated circuit Pending JPS57157164A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56042503A JPS57157164A (en) 1981-03-25 1981-03-25 Testing method for reliability in thermo-acceleration of integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56042503A JPS57157164A (en) 1981-03-25 1981-03-25 Testing method for reliability in thermo-acceleration of integrated circuit

Publications (1)

Publication Number Publication Date
JPS57157164A true JPS57157164A (en) 1982-09-28

Family

ID=12637866

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56042503A Pending JPS57157164A (en) 1981-03-25 1981-03-25 Testing method for reliability in thermo-acceleration of integrated circuit

Country Status (1)

Country Link
JP (1) JPS57157164A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01129174A (en) * 1987-11-13 1989-05-22 Matsushita Electron Corp Integrated circuit testing apparatus
JPH01140083A (en) * 1987-11-26 1989-06-01 Matsushita Electron Corp Apparatus for testing integrated circuit
US5168219A (en) * 1988-10-31 1992-12-01 Fujitsu Limited Integrated circuit device having signal discrimination circuit and method of testing the same
JP2017528293A (en) * 2014-09-12 2017-09-28 アルバート ヌーネス Apparatus and method for providing hyperthermia
US11883644B2 (en) 2017-12-19 2024-01-30 Innovarius Corp. Apparatus for creating resonant standing waves in biological tissue

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4984349A (en) * 1972-12-18 1974-08-13
JPS53124984A (en) * 1977-04-07 1978-10-31 Mitsubishi Electric Corp Burn-in system
JPS5460545A (en) * 1977-10-24 1979-05-16 Hewlett Packard Yokogawa Sine wave signal generator

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4984349A (en) * 1972-12-18 1974-08-13
JPS53124984A (en) * 1977-04-07 1978-10-31 Mitsubishi Electric Corp Burn-in system
JPS5460545A (en) * 1977-10-24 1979-05-16 Hewlett Packard Yokogawa Sine wave signal generator

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01129174A (en) * 1987-11-13 1989-05-22 Matsushita Electron Corp Integrated circuit testing apparatus
JPH01140083A (en) * 1987-11-26 1989-06-01 Matsushita Electron Corp Apparatus for testing integrated circuit
US5168219A (en) * 1988-10-31 1992-12-01 Fujitsu Limited Integrated circuit device having signal discrimination circuit and method of testing the same
US5304923A (en) * 1988-10-31 1994-04-19 Fujitsu Limited Integrated circuit device having signal discrimination circuit and method of testing the same
US5365167A (en) * 1988-10-31 1994-11-15 Fujitsu Limited Integrated circuit device having signal discrimination circuit and method of testing the same
JP2017528293A (en) * 2014-09-12 2017-09-28 アルバート ヌーネス Apparatus and method for providing hyperthermia
US11324961B2 (en) 2014-09-12 2022-05-10 Albert Nunez Apparatus and method for providing hyperthermia therapy
US11883644B2 (en) 2017-12-19 2024-01-30 Innovarius Corp. Apparatus for creating resonant standing waves in biological tissue

Similar Documents

Publication Publication Date Title
ATE83589T1 (en) ARRANGEMENT FOR RAPID SHORT CIRCUIT DETECTION.
EP0158512A3 (en) Reset circuit
JPS57157164A (en) Testing method for reliability in thermo-acceleration of integrated circuit
JPS5767327A (en) Error testing device
JPS5383610A (en) Wave generator for electronic musical instruments
JPS57186351A (en) Semiconductor device
JPS57131118A (en) Pulse generator
RU96120374A (en) QUALITY CONTROL DEVICE FOR FRUIT AND VEGETABLE PRODUCTS
JPS5681455A (en) Generating device for testing voltage
JPS5241829A (en) Inverter apparatus
JPS6423622A (en) Device for inspecting a/d converter
SU429384A1 (en) DEVICE FOR CLASSIFICATION OF SEMI-CONDUCTOR DEVICES VALUE DI / dt
SU1205074A1 (en) Apparatus for converting static parameters of crystal vibrators
JPS54158148A (en) Clock monitor circuit
JPS5734467A (en) Circuit for measuring characteristic of coder
SU761914A1 (en) Measuring circuit
JPS578460A (en) Earth resistance tester
JPS56151365A (en) Noise detector
AIDA et al. Frequency spectra of the gaseous phase arc in breaking Ag contacts with low inductive load
JPS56118676A (en) Operating method for amplitude value
JPS5587976A (en) Device for detecting electronic watch
JPS57119265A (en) Orientating method for trouble point of cable
Troltzsch The Testing of Materials by Measurement of Frequency and Period of Vibration in Electrical Circuits in Feed-Back Connection
JPS56129434A (en) Large scale integrated circuit device
JPS5669905A (en) Fm demodulator