JPS4984349A - - Google Patents
Info
- Publication number
- JPS4984349A JPS4984349A JP12616072A JP12616072A JPS4984349A JP S4984349 A JPS4984349 A JP S4984349A JP 12616072 A JP12616072 A JP 12616072A JP 12616072 A JP12616072 A JP 12616072A JP S4984349 A JPS4984349 A JP S4984349A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- Filters And Equalizers (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12616072A JPS4984349A (en) | 1972-12-18 | 1972-12-18 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12616072A JPS4984349A (en) | 1972-12-18 | 1972-12-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS4984349A true JPS4984349A (en) | 1974-08-13 |
Family
ID=14928149
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12616072A Pending JPS4984349A (en) | 1972-12-18 | 1972-12-18 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS4984349A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57157164A (en) * | 1981-03-25 | 1982-09-28 | Nippon Telegr & Teleph Corp <Ntt> | Testing method for reliability in thermo-acceleration of integrated circuit |
| JPS6149504A (en) * | 1984-08-17 | 1986-03-11 | Fujitsu Ltd | Sine wave signal generating circuit |
| JPH01115303U (en) * | 1988-01-28 | 1989-08-03 | ||
| JPH01291503A (en) * | 1988-05-19 | 1989-11-24 | Sony Corp | Frequency multiplication circuit |
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1972
- 1972-12-18 JP JP12616072A patent/JPS4984349A/ja active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57157164A (en) * | 1981-03-25 | 1982-09-28 | Nippon Telegr & Teleph Corp <Ntt> | Testing method for reliability in thermo-acceleration of integrated circuit |
| JPS6149504A (en) * | 1984-08-17 | 1986-03-11 | Fujitsu Ltd | Sine wave signal generating circuit |
| JPH0449284B2 (en) * | 1984-08-17 | 1992-08-11 | Fujitsu Ltd | |
| JPH01115303U (en) * | 1988-01-28 | 1989-08-03 | ||
| JPH01291503A (en) * | 1988-05-19 | 1989-11-24 | Sony Corp | Frequency multiplication circuit |