JPS5757267A - Combined equivalent testing apparatus for dc breaker - Google Patents
Combined equivalent testing apparatus for dc breakerInfo
- Publication number
- JPS5757267A JPS5757267A JP13161880A JP13161880A JPS5757267A JP S5757267 A JPS5757267 A JP S5757267A JP 13161880 A JP13161880 A JP 13161880A JP 13161880 A JP13161880 A JP 13161880A JP S5757267 A JPS5757267 A JP S5757267A
- Authority
- JP
- Japan
- Prior art keywords
- breaker
- current
- commutation
- capacitor
- low frequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/333—Testing of the switching capacity of high-voltage circuit-breakers ; Testing of breaking capacity or related variables, e.g. post arc current or transient recovery voltage
- G01R31/3333—Apparatus, systems or circuits therefor
- G01R31/3336—Synthetic testing, i.e. with separate current and voltage generators simulating distance fault conditions
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Circuit Breakers, Generators, And Electric Motors (AREA)
Abstract
PURPOSE:To make it possible totest the cutoff performance securely by constituting a current source by a low speed operation shorting generator from which a low frequency current is obtained and a transformer, and constituting a voltage source by a series circuit of a resistor and a capacitor. CONSTITUTION:A switch 18 is closed D, and a low frequency, asummetric, shorting current is conducted to anauxiliary commutation breaker 23 and a commutation breaker to be tested 24. Then the breakers 23 and 24 are opened E at the same time. Then an oscillation current is overlapped on the low frequency current by the mutual action of an auxiliary commutation reactor 21 and an auxiliary commutation capacitor 22. The current IC of the breaker 24 becomes the oscillating current, a zero current point F is generated, and the breakers 23 and 24 are cut off. If a charging voltge for a voltage source capacitor 9 is applied across the breaker 24 by a switch 8 before the cutoff, a voltage VC which is determined by a capacity CO and a resistance r of a resistor 7 is applied. In this constitution, even through the breaker is of a multi-point type, the cutoff is always achieved at the same time, the voltage waveform applied to the breaker 24 becomes constant, and the reliable equivalent test can be performed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13161880A JPS5757267A (en) | 1980-09-24 | 1980-09-24 | Combined equivalent testing apparatus for dc breaker |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13161880A JPS5757267A (en) | 1980-09-24 | 1980-09-24 | Combined equivalent testing apparatus for dc breaker |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5757267A true JPS5757267A (en) | 1982-04-06 |
Family
ID=15062267
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13161880A Pending JPS5757267A (en) | 1980-09-24 | 1980-09-24 | Combined equivalent testing apparatus for dc breaker |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5757267A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5653265A (en) * | 1984-02-13 | 1997-08-05 | Excell Corporation | Hollow plastic product |
CN106772001A (en) * | 2016-11-28 | 2017-05-31 | 温州大学 | Large Copacity low-voltage circuit breaker snap action characteristic testing equipment |
WO2018042516A1 (en) * | 2016-08-30 | 2018-03-08 | 株式会社 東芝 | Mechanical switch testing method and testing device therefor |
WO2018109889A1 (en) * | 2016-12-15 | 2018-06-21 | 株式会社 東芝 | Testing apparatus for dc circuit breaker |
EP3315980A4 (en) * | 2015-06-26 | 2019-02-20 | Kabushiki Kaisha Toshiba, Inc. | Testing method for dc circuit breaker |
-
1980
- 1980-09-24 JP JP13161880A patent/JPS5757267A/en active Pending
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5653265A (en) * | 1984-02-13 | 1997-08-05 | Excell Corporation | Hollow plastic product |
EP3315980A4 (en) * | 2015-06-26 | 2019-02-20 | Kabushiki Kaisha Toshiba, Inc. | Testing method for dc circuit breaker |
WO2018042516A1 (en) * | 2016-08-30 | 2018-03-08 | 株式会社 東芝 | Mechanical switch testing method and testing device therefor |
CN106772001A (en) * | 2016-11-28 | 2017-05-31 | 温州大学 | Large Copacity low-voltage circuit breaker snap action characteristic testing equipment |
WO2018109889A1 (en) * | 2016-12-15 | 2018-06-21 | 株式会社 東芝 | Testing apparatus for dc circuit breaker |
CN110073229A (en) * | 2016-12-15 | 2019-07-30 | 东芝能源系统株式会社 | The experimental rig of dc circuit breaker |
EP3557268A4 (en) * | 2016-12-15 | 2020-08-19 | Toshiba Energy Systems & Solutions Corporation | Testing apparatus for dc circuit breaker |
CN110073229B (en) * | 2016-12-15 | 2021-04-09 | 东芝能源系统株式会社 | Test device of direct current breaker |
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