JPS5611351A - Time division-type multifrequency eddy current - Google Patents
Time division-type multifrequency eddy currentInfo
- Publication number
- JPS5611351A JPS5611351A JP8733079A JP8733079A JPS5611351A JP S5611351 A JPS5611351 A JP S5611351A JP 8733079 A JP8733079 A JP 8733079A JP 8733079 A JP8733079 A JP 8733079A JP S5611351 A JPS5611351 A JP S5611351A
- Authority
- JP
- Japan
- Prior art keywords
- current
- zero
- frequency
- excited
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
PURPOSE: To improve the SN ratio and reliability, by providing a circuit, which generates a pulse when the instantaneous value of a checking excited current is zero, and a circuit which switches the operating excited current when its instantaneous value is zero.
CONSTITUTION: Oscillator 1 and frequency demultiplying and shaping equipment 2 generate sincere wave continuous voltages V1 and V2 of frequency f1 and frequency f2 (f2<f1) respectively. Two voltages V1 and V2 different in frequency are led to electronic switch 3, and exciting coil 6a of check coil 6 is excited by one voltage of them. Circuit 5 detects zero points of these currents i1 and i2 and generates pulse P at the detection time. In case that contact 3b of electronic switch 3 is closed and voltage V2 is given to power amplifier 4 and exciting coil 6a is excited by current i2, control circuit 7 generates pulse P each time current i2 passes the zero point, and free-running multivibrator 7 is inverted forcedly, and contact 3b of electronic switch 3 is opened, and contact 3a is closed, and switching is performed under the state of current zero. Consequently, demerits dependent upon transient phenomena can be eliminated to improve the SN ratio and reliability.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8733079A JPS5611351A (en) | 1979-07-10 | 1979-07-10 | Time division-type multifrequency eddy current |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8733079A JPS5611351A (en) | 1979-07-10 | 1979-07-10 | Time division-type multifrequency eddy current |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5611351A true JPS5611351A (en) | 1981-02-04 |
JPS639182B2 JPS639182B2 (en) | 1988-02-26 |
Family
ID=13911851
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8733079A Granted JPS5611351A (en) | 1979-07-10 | 1979-07-10 | Time division-type multifrequency eddy current |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5611351A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59108955A (en) * | 1982-12-13 | 1984-06-23 | Nippon Steel Corp | Multiprobe-coil multifrequency eddy current type flaw detector |
JPS59166857A (en) * | 1983-03-11 | 1984-09-20 | Nippon Steel Corp | Signal processing circuit of multi-probe and multi-frequency eddy current test equipment |
JPH05135246A (en) * | 1991-11-08 | 1993-06-01 | Omron Corp | Automatic money changer with each denomination display function |
JP2006250935A (en) * | 2005-03-09 | 2006-09-21 | General Electric Co <Ge> | Inspection method and system using multifrequency phase analysis |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003050233A (en) * | 2001-08-07 | 2003-02-21 | Marktec Corp | Eddy-current flaw detection testing method and eddy- current flaw detection testing device |
JP4681770B2 (en) * | 2001-08-07 | 2011-05-11 | マークテック株式会社 | Eddy current testing equipment |
-
1979
- 1979-07-10 JP JP8733079A patent/JPS5611351A/en active Granted
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59108955A (en) * | 1982-12-13 | 1984-06-23 | Nippon Steel Corp | Multiprobe-coil multifrequency eddy current type flaw detector |
JPH0441300B2 (en) * | 1982-12-13 | 1992-07-07 | Nippon Steel Corp | |
JPS59166857A (en) * | 1983-03-11 | 1984-09-20 | Nippon Steel Corp | Signal processing circuit of multi-probe and multi-frequency eddy current test equipment |
JPH0441302B2 (en) * | 1983-03-11 | 1992-07-07 | Nippon Steel Corp | |
JPH05135246A (en) * | 1991-11-08 | 1993-06-01 | Omron Corp | Automatic money changer with each denomination display function |
JP2006250935A (en) * | 2005-03-09 | 2006-09-21 | General Electric Co <Ge> | Inspection method and system using multifrequency phase analysis |
Also Published As
Publication number | Publication date |
---|---|
JPS639182B2 (en) | 1988-02-26 |
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