JPS5756777A - Method for measuring time difference of light propagation - Google Patents

Method for measuring time difference of light propagation

Info

Publication number
JPS5756777A
JPS5756777A JP13081780A JP13081780A JPS5756777A JP S5756777 A JPS5756777 A JP S5756777A JP 13081780 A JP13081780 A JP 13081780A JP 13081780 A JP13081780 A JP 13081780A JP S5756777 A JPS5756777 A JP S5756777A
Authority
JP
Japan
Prior art keywords
light
optical path
beams
light source
time difference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13081780A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0338555B2 (enrdf_load_stackoverflow
Inventor
Kiyobumi Mochizuki
Yasuhiko Niino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KDDI Corp
Original Assignee
Kokusai Denshin Denwa KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kokusai Denshin Denwa KK filed Critical Kokusai Denshin Denwa KK
Priority to JP13081780A priority Critical patent/JPS5756777A/ja
Publication of JPS5756777A publication Critical patent/JPS5756777A/ja
Publication of JPH0338555B2 publication Critical patent/JPH0338555B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP13081780A 1980-09-22 1980-09-22 Method for measuring time difference of light propagation Granted JPS5756777A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13081780A JPS5756777A (en) 1980-09-22 1980-09-22 Method for measuring time difference of light propagation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13081780A JPS5756777A (en) 1980-09-22 1980-09-22 Method for measuring time difference of light propagation

Publications (2)

Publication Number Publication Date
JPS5756777A true JPS5756777A (en) 1982-04-05
JPH0338555B2 JPH0338555B2 (enrdf_load_stackoverflow) 1991-06-11

Family

ID=15043400

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13081780A Granted JPS5756777A (en) 1980-09-22 1980-09-22 Method for measuring time difference of light propagation

Country Status (1)

Country Link
JP (1) JPS5756777A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011128040A (ja) * 2009-12-18 2011-06-30 Nippon Telegr & Teleph Corp <Ntt> 光ファイバ屈折率測定装置及び光ファイバ屈折率測定方法
CN103776801A (zh) * 2012-10-17 2014-05-07 成都光明光电股份有限公司 光学元件折射率的检测方法及其检测装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4203831B2 (ja) * 2006-11-30 2009-01-07 独立行政法人産業技術総合研究所 光学材料の群屈折率精密計測方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4827717A (enrdf_load_stackoverflow) * 1971-06-18 1973-04-12
JPS5010509A (enrdf_load_stackoverflow) * 1973-05-24 1975-02-03
JPS5225117A (en) * 1975-08-18 1977-02-24 Kanebo Ltd Prepapation of flame retardant polyamide
JPS5231750A (en) * 1975-04-07 1977-03-10 Toray Ind Inc Print device
JPS553407U (enrdf_load_stackoverflow) * 1978-06-20 1980-01-10

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4827717A (enrdf_load_stackoverflow) * 1971-06-18 1973-04-12
JPS5010509A (enrdf_load_stackoverflow) * 1973-05-24 1975-02-03
JPS5231750A (en) * 1975-04-07 1977-03-10 Toray Ind Inc Print device
JPS5225117A (en) * 1975-08-18 1977-02-24 Kanebo Ltd Prepapation of flame retardant polyamide
JPS553407U (enrdf_load_stackoverflow) * 1978-06-20 1980-01-10

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011128040A (ja) * 2009-12-18 2011-06-30 Nippon Telegr & Teleph Corp <Ntt> 光ファイバ屈折率測定装置及び光ファイバ屈折率測定方法
CN103776801A (zh) * 2012-10-17 2014-05-07 成都光明光电股份有限公司 光学元件折射率的检测方法及其检测装置

Also Published As

Publication number Publication date
JPH0338555B2 (enrdf_load_stackoverflow) 1991-06-11

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