JPS5752856A - Electromagnetic ultrasonic flaw detecting device - Google Patents

Electromagnetic ultrasonic flaw detecting device

Info

Publication number
JPS5752856A
JPS5752856A JP55127265A JP12726580A JPS5752856A JP S5752856 A JPS5752856 A JP S5752856A JP 55127265 A JP55127265 A JP 55127265A JP 12726580 A JP12726580 A JP 12726580A JP S5752856 A JPS5752856 A JP S5752856A
Authority
JP
Japan
Prior art keywords
gap
transmitting
receiving coil
changes
detected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55127265A
Other languages
Japanese (ja)
Inventor
Kazuo Sugai
Yasuaki Sato
Takashi Kadowaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP55127265A priority Critical patent/JPS5752856A/en
Publication of JPS5752856A publication Critical patent/JPS5752856A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
    • G01N27/9053—Compensating for probe to workpiece spacing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

PURPOSE:To detect flaws exactly even if a gap between a transmitting and receiving coil and the surface of the material to be tested changes, by detecting the gap between said coil and said material to be tested and by changing the amplification of a receiving amplifier in response to magnitude of said detected signal. CONSTITUTION:A transmitting and receiving coil 4 and a gap sensor 13 are provided on the end of a central leg of an iron core 3 having a cross section in the shape of a character E, and the gap sensor 13 is driven to detect a gap between an object 5 to be inspected and the transmitting and receiving coil 4. A gap detecting circuit 14 calculates the attenuating amount of an ultrasonic received signal level corresponding to the gap detected. When the gap between the object 5 to be inspected and the transmitting and receiving coil 4 changes, the change is detected by means of the gap sensor 13 and the gap detecting circuit 14, thereby the amount of attenuation of the received signal level corresponding to the gap and a correction amount equivalent to said attenuation amount are generated in a compensating circuit 15 to allow the amplification degree of the amplifier 9 to be corrected. Even if the gap between the object 5 and the transmitting and receiving coil changes, the capability to detect flaws is kept constant at all times.
JP55127265A 1980-09-16 1980-09-16 Electromagnetic ultrasonic flaw detecting device Pending JPS5752856A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55127265A JPS5752856A (en) 1980-09-16 1980-09-16 Electromagnetic ultrasonic flaw detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55127265A JPS5752856A (en) 1980-09-16 1980-09-16 Electromagnetic ultrasonic flaw detecting device

Publications (1)

Publication Number Publication Date
JPS5752856A true JPS5752856A (en) 1982-03-29

Family

ID=14955739

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55127265A Pending JPS5752856A (en) 1980-09-16 1980-09-16 Electromagnetic ultrasonic flaw detecting device

Country Status (1)

Country Link
JP (1) JPS5752856A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58223751A (en) * 1982-06-23 1983-12-26 Hitachi Ltd Electromagnetic ultrasonic probe
JPH03291407A (en) * 1990-04-10 1991-12-20 Mitsubishi Heavy Ind Ltd Desulfurizer
FR2677125A1 (en) * 1991-05-30 1992-12-04 Micrel Apparatus and method for detecting defects on metal pieces
JP2008212705A (en) * 2002-04-11 2008-09-18 A-Dec Inc Fluid control system for chair

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55129749A (en) * 1979-03-28 1980-10-07 Sumitomo Metal Ind Ltd Sensitivity correction method for electromagnetic ultrasonic wave probe

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55129749A (en) * 1979-03-28 1980-10-07 Sumitomo Metal Ind Ltd Sensitivity correction method for electromagnetic ultrasonic wave probe

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58223751A (en) * 1982-06-23 1983-12-26 Hitachi Ltd Electromagnetic ultrasonic probe
JPH03291407A (en) * 1990-04-10 1991-12-20 Mitsubishi Heavy Ind Ltd Desulfurizer
FR2677125A1 (en) * 1991-05-30 1992-12-04 Micrel Apparatus and method for detecting defects on metal pieces
JP2008212705A (en) * 2002-04-11 2008-09-18 A-Dec Inc Fluid control system for chair

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