JPS5748261A - Interline ccd sensor and driving method thereof - Google Patents
Interline ccd sensor and driving method thereofInfo
- Publication number
- JPS5748261A JPS5748261A JP55123259A JP12325980A JPS5748261A JP S5748261 A JPS5748261 A JP S5748261A JP 55123259 A JP55123259 A JP 55123259A JP 12325980 A JP12325980 A JP 12325980A JP S5748261 A JPS5748261 A JP S5748261A
- Authority
- JP
- Japan
- Prior art keywords
- region
- ccd
- electron
- type
- ccd sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title abstract 3
- 239000000758 substrate Substances 0.000 abstract 2
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
- H01L27/14831—Area CCD imagers
Abstract
PURPOSE:To obtain the interline CCD sensor, having no after image, and the driving method thereof by a method wherein the microscopic region, having the conductive type reverse to a substrate, is turned to pinch-off condition. CONSTITUTION:The unit cell of the interline CCD sensor is consisted of a P type substrate 100, an N type region 301, a P<+> type region 105, CCD transfer electrodes 103 and 104 and a field oxide film 101. When the electron generated by an incident ray is accumulated in the N region, the electric potential PSIN is turned to low level 302, and when the CCD transfer pulse phiCCD becomes high level, the electron of the N region is transferred to the CCD passing through the P<+> region. A pinch-off state is obtained by reducing the density of the N region, by having all electron transfered to the CCD and by turning the N region into depletion. As no electron exists in the N region, electric charge is not shifted to the CCD and no after image is generated.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55123259A JPS5748261A (en) | 1980-09-05 | 1980-09-05 | Interline ccd sensor and driving method thereof |
US06/297,759 US4484210A (en) | 1980-09-05 | 1981-08-31 | Solid-state imaging device having a reduced image lag |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55123259A JPS5748261A (en) | 1980-09-05 | 1980-09-05 | Interline ccd sensor and driving method thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5748261A true JPS5748261A (en) | 1982-03-19 |
Family
ID=14856131
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55123259A Pending JPS5748261A (en) | 1980-09-05 | 1980-09-05 | Interline ccd sensor and driving method thereof |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5748261A (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5437422A (en) * | 1977-08-29 | 1979-03-19 | Toshiba Corp | Solid state pickup device |
-
1980
- 1980-09-05 JP JP55123259A patent/JPS5748261A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5437422A (en) * | 1977-08-29 | 1979-03-19 | Toshiba Corp | Solid state pickup device |
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