JPS5746167A - Crystal q meter - Google Patents

Crystal q meter

Info

Publication number
JPS5746167A
JPS5746167A JP12174980A JP12174980A JPS5746167A JP S5746167 A JPS5746167 A JP S5746167A JP 12174980 A JP12174980 A JP 12174980A JP 12174980 A JP12174980 A JP 12174980A JP S5746167 A JPS5746167 A JP S5746167A
Authority
JP
Japan
Prior art keywords
voltage
crystal oscillator
circuit
constitution
driving voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12174980A
Other languages
English (en)
Inventor
Toshio Omori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Citizen Holdings Co Ltd
Citizen Watch Co Ltd
Original Assignee
Citizen Holdings Co Ltd
Citizen Watch Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Citizen Holdings Co Ltd, Citizen Watch Co Ltd filed Critical Citizen Holdings Co Ltd
Priority to JP12174980A priority Critical patent/JPS5746167A/ja
Publication of JPS5746167A publication Critical patent/JPS5746167A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2688Measuring quality factor or dielectric loss, e.g. loss angle, or power factor

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP12174980A 1980-09-04 1980-09-04 Crystal q meter Pending JPS5746167A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12174980A JPS5746167A (en) 1980-09-04 1980-09-04 Crystal q meter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12174980A JPS5746167A (en) 1980-09-04 1980-09-04 Crystal q meter

Publications (1)

Publication Number Publication Date
JPS5746167A true JPS5746167A (en) 1982-03-16

Family

ID=14818926

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12174980A Pending JPS5746167A (en) 1980-09-04 1980-09-04 Crystal q meter

Country Status (1)

Country Link
JP (1) JPS5746167A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011097408A (ja) * 2009-10-30 2011-05-12 Kyocera Kinseki Corp 水晶発振回路の励振電力測定方法
PL444208A1 (pl) * 2023-03-27 2024-07-15 Politechnika Warszawska Urządzenia do pomiaru dobroci

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011097408A (ja) * 2009-10-30 2011-05-12 Kyocera Kinseki Corp 水晶発振回路の励振電力測定方法
PL444208A1 (pl) * 2023-03-27 2024-07-15 Politechnika Warszawska Urządzenia do pomiaru dobroci
PL448099A1 (pl) * 2023-03-27 2024-09-30 Politechnika Warszawska Urządzenie do pomiaru dobroci
PL448101A1 (pl) * 2023-03-27 2024-09-30 Politechnika Warszawska Urządzenie do pomiaru dobroci
PL448098A1 (pl) * 2023-03-27 2024-09-30 Politechnika Warszawska Urządzenie do pomiaru dobroci
PL448100A1 (pl) * 2023-03-27 2024-09-30 Politechnika Warszawska Urządzenie do pomiaru dobroci

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