JPS574556A - Automatic tester for printed board - Google Patents

Automatic tester for printed board

Info

Publication number
JPS574556A
JPS574556A JP7717880A JP7717880A JPS574556A JP S574556 A JPS574556 A JP S574556A JP 7717880 A JP7717880 A JP 7717880A JP 7717880 A JP7717880 A JP 7717880A JP S574556 A JPS574556 A JP S574556A
Authority
JP
Japan
Prior art keywords
test
processor
board
signal
microprocessor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7717880A
Other languages
Japanese (ja)
Inventor
Shinichi Kagaya
Noriyoshi Abe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Araco Co Ltd
Kyoei Sangyo KK
Original Assignee
Araco Co Ltd
Kyoei Sangyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Araco Co Ltd, Kyoei Sangyo KK filed Critical Araco Co Ltd
Priority to JP7717880A priority Critical patent/JPS574556A/en
Publication of JPS574556A publication Critical patent/JPS574556A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To shorten the test time by using a master microprocessor and a slave microprocessor, and asigning the control function to each of the microprocessors. CONSTITUTION:The slave microprocessor 51 controls the position of the printed board PB to be tested in accordance with the command of the master microprocessor 41, and pins 18 of a contact probe 17 are contacted with the board PB. At the same time, the processor 41 receives reference conduction pattern data from an external memory 42. Therefore, the data reception and the position control are carried out at the same time. Then a scanning console 20 sequentially sends a signal ''1'' to each pin 18, and receives the signal obtained from the other pin and sends it to the processor 41. The processor 41 compares this signal with the reference conduction pattern and performs the test. By repeating this test, the entire area of the board PB is tested. Thus the test time can be shortened.
JP7717880A 1980-06-10 1980-06-10 Automatic tester for printed board Pending JPS574556A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7717880A JPS574556A (en) 1980-06-10 1980-06-10 Automatic tester for printed board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7717880A JPS574556A (en) 1980-06-10 1980-06-10 Automatic tester for printed board

Publications (1)

Publication Number Publication Date
JPS574556A true JPS574556A (en) 1982-01-11

Family

ID=13626543

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7717880A Pending JPS574556A (en) 1980-06-10 1980-06-10 Automatic tester for printed board

Country Status (1)

Country Link
JP (1) JPS574556A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59126059U (en) * 1983-02-12 1984-08-24 寺田　富美雄 tombstone cover
JPS61243372A (en) * 1985-04-20 1986-10-29 Hitachi Electronics Eng Co Ltd Ic test method and apparatus therefor
EP0447798A2 (en) * 1990-03-19 1991-09-25 SECATEC GmbH Berührungslose Schalttechnik Test apparatus for printed circuits with IC's on both sides

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59126059U (en) * 1983-02-12 1984-08-24 寺田　富美雄 tombstone cover
JPS61243372A (en) * 1985-04-20 1986-10-29 Hitachi Electronics Eng Co Ltd Ic test method and apparatus therefor
EP0447798A2 (en) * 1990-03-19 1991-09-25 SECATEC GmbH Berührungslose Schalttechnik Test apparatus for printed circuits with IC's on both sides

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