KR900006791A - Test mode setting circuit using IC test pin - Google Patents

Test mode setting circuit using IC test pin

Info

Publication number
KR900006791A
KR900006791A KR1019880014002A KR880014002A KR900006791A KR 900006791 A KR900006791 A KR 900006791A KR 1019880014002 A KR1019880014002 A KR 1019880014002A KR 880014002 A KR880014002 A KR 880014002A KR 900006791 A KR900006791 A KR 900006791A
Authority
KR
South Korea
Prior art keywords
test
mode setting
setting circuit
pin
test mode
Prior art date
Application number
KR1019880014002A
Other languages
Korean (ko)
Other versions
KR950013606B1 (en
Inventor
김형제
Original Assignee
금성일렉트론주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론주식회사 filed Critical 금성일렉트론주식회사
Priority to KR1019880014002A priority Critical patent/KR950013606B1/en
Publication of KR900006791A publication Critical patent/KR900006791A/en
Application granted granted Critical
Publication of KR950013606B1 publication Critical patent/KR950013606B1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
KR1019880014002A 1988-10-27 1988-10-27 Test mode setting circuit for ic KR950013606B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019880014002A KR950013606B1 (en) 1988-10-27 1988-10-27 Test mode setting circuit for ic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019880014002A KR950013606B1 (en) 1988-10-27 1988-10-27 Test mode setting circuit for ic

Publications (2)

Publication Number Publication Date
KR900006791A true KR900006791A (en) 1990-05-08
KR950013606B1 KR950013606B1 (en) 1995-11-13

Family

ID=19278789

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019880014002A KR950013606B1 (en) 1988-10-27 1988-10-27 Test mode setting circuit for ic

Country Status (1)

Country Link
KR (1) KR950013606B1 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100394575B1 (en) * 2001-04-11 2003-08-14 삼성전자주식회사 method for outputting internal information through test pin in semiconductor memory and output circuit therefore
KR100496859B1 (en) * 2002-08-13 2005-06-22 삼성전자주식회사 Semiconductor integrated circuit with functionsl modes
KR100706241B1 (en) * 2005-02-04 2007-04-11 삼성전자주식회사 System on chip tested without any pin and method thereof

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7574638B2 (en) 2005-02-03 2009-08-11 Samsung Electronics Co., Ltd. Semiconductor device tested using minimum pins and methods of testing the same
KR100862994B1 (en) 2006-12-07 2008-10-13 주식회사 하이닉스반도체 Semiconductor Memory Apparatus Having Test Mode Driving Circuit and Test Mode Driving Method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100394575B1 (en) * 2001-04-11 2003-08-14 삼성전자주식회사 method for outputting internal information through test pin in semiconductor memory and output circuit therefore
KR100496859B1 (en) * 2002-08-13 2005-06-22 삼성전자주식회사 Semiconductor integrated circuit with functionsl modes
KR100706241B1 (en) * 2005-02-04 2007-04-11 삼성전자주식회사 System on chip tested without any pin and method thereof

Also Published As

Publication number Publication date
KR950013606B1 (en) 1995-11-13

Similar Documents

Publication Publication Date Title
DE68921269T2 (en) Integrated test circuit.
DK213989A (en) INTEGRATED CIRCUIT CARD
DE68926589D1 (en) Tester
DE69025365D1 (en) Integrated circuit card
KR900012345A (en) Integrated circuit chip
DE68914178D1 (en) Electro-radiation testing of electronic components.
KR900012359A (en) Integrated circuit chip
KR900021177U (en) TAB burn-in test socket
DE69029634T2 (en) Test latch circuit
KR900006791A (en) Test mode setting circuit using IC test pin
KR900010956A (en) Multiple test mode selection circuit
DE69127149D1 (en) Circuit test procedure
FR2604260B1 (en) ELECTRONIC CIRCUIT TESTER
DE68929487D1 (en) Supply pin arrangement for an integrated circuit
GB8820042D0 (en) Circuit testing
DE68928600T2 (en) Extended test circuit
FR2617290B1 (en) INTEGRATED CIRCUIT TEST DEVICE
KR910001198U (en) Circuit board tester
BR6802479U (en) INTEGRATED CIRCUIT TESTER
KR910018712U (en) Connection pin connection device of test board
KR900009870U (en) Eject pin setting device
KR930015330U (en) IC test circuit
KR930012346U (en) IC chip test mode control circuit
KR900008287A (en) Timer IC measurement device
KR890021499U (en) Oscilloscope auto setup circuit

Legal Events

Date Code Title Description
A201 Request for examination
G160 Decision to publish patent application
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20061026

Year of fee payment: 12

LAPS Lapse due to unpaid annual fee