FR2617290B1 - INTEGRATED CIRCUIT TEST DEVICE - Google Patents

INTEGRATED CIRCUIT TEST DEVICE

Info

Publication number
FR2617290B1
FR2617290B1 FR8709042A FR8709042A FR2617290B1 FR 2617290 B1 FR2617290 B1 FR 2617290B1 FR 8709042 A FR8709042 A FR 8709042A FR 8709042 A FR8709042 A FR 8709042A FR 2617290 B1 FR2617290 B1 FR 2617290B1
Authority
FR
France
Prior art keywords
integrated circuit
test device
circuit test
integrated
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8709042A
Other languages
French (fr)
Other versions
FR2617290A1 (en
Inventor
Michel Joseph Marie Binet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Laboratoires dElectronique Philips SAS
Original Assignee
Laboratoires dElectronique et de Physique Appliquee
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Laboratoires dElectronique et de Physique Appliquee filed Critical Laboratoires dElectronique et de Physique Appliquee
Priority to FR8709042A priority Critical patent/FR2617290B1/en
Publication of FR2617290A1 publication Critical patent/FR2617290A1/en
Application granted granted Critical
Publication of FR2617290B1 publication Critical patent/FR2617290B1/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
FR8709042A 1987-06-26 1987-06-26 INTEGRATED CIRCUIT TEST DEVICE Expired FR2617290B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8709042A FR2617290B1 (en) 1987-06-26 1987-06-26 INTEGRATED CIRCUIT TEST DEVICE

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8709042A FR2617290B1 (en) 1987-06-26 1987-06-26 INTEGRATED CIRCUIT TEST DEVICE

Publications (2)

Publication Number Publication Date
FR2617290A1 FR2617290A1 (en) 1988-12-30
FR2617290B1 true FR2617290B1 (en) 1989-12-29

Family

ID=9352567

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8709042A Expired FR2617290B1 (en) 1987-06-26 1987-06-26 INTEGRATED CIRCUIT TEST DEVICE

Country Status (1)

Country Link
FR (1) FR2617290B1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69216965T2 (en) * 1991-08-26 1997-08-14 Hughes Aircraft Co Electrical circuit with an elastic sealing ring to connect an increased contact
US5264787A (en) * 1991-08-30 1993-11-23 Hughes Aircraft Company Rigid-flex circuits with raised features as IC test probes

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3596228A (en) * 1969-05-29 1971-07-27 Ibm Fluid actuated contactor
JPS5929151B2 (en) * 1981-08-03 1984-07-18 日本電子材料株式会社 Semiconductor wafer testing equipment
US4649339A (en) * 1984-04-25 1987-03-10 Honeywell Inc. Integrated circuit interface
US4636722A (en) * 1984-05-21 1987-01-13 Probe-Rite, Inc. High density probe-head with isolated and shielded transmission lines
US4672312A (en) * 1984-12-20 1987-06-09 Hughes Aircraft Company Giga-hertz test jig

Also Published As

Publication number Publication date
FR2617290A1 (en) 1988-12-30

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Legal Events

Date Code Title Description
CD Change of name or company name
ST Notification of lapse