JPS5745406A - Three-dimensional coordinate measuring device - Google Patents

Three-dimensional coordinate measuring device

Info

Publication number
JPS5745406A
JPS5745406A JP12114680A JP12114680A JPS5745406A JP S5745406 A JPS5745406 A JP S5745406A JP 12114680 A JP12114680 A JP 12114680A JP 12114680 A JP12114680 A JP 12114680A JP S5745406 A JPS5745406 A JP S5745406A
Authority
JP
Japan
Prior art keywords
photoarray
laser beam
projected
deflection
determined
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12114680A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6341402B2 (enrdf_load_stackoverflow
Inventor
Akira Hirai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP12114680A priority Critical patent/JPS5745406A/ja
Publication of JPS5745406A publication Critical patent/JPS5745406A/ja
Publication of JPS6341402B2 publication Critical patent/JPS6341402B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
JP12114680A 1980-09-03 1980-09-03 Three-dimensional coordinate measuring device Granted JPS5745406A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12114680A JPS5745406A (en) 1980-09-03 1980-09-03 Three-dimensional coordinate measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12114680A JPS5745406A (en) 1980-09-03 1980-09-03 Three-dimensional coordinate measuring device

Publications (2)

Publication Number Publication Date
JPS5745406A true JPS5745406A (en) 1982-03-15
JPS6341402B2 JPS6341402B2 (enrdf_load_stackoverflow) 1988-08-17

Family

ID=14803987

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12114680A Granted JPS5745406A (en) 1980-09-03 1980-09-03 Three-dimensional coordinate measuring device

Country Status (1)

Country Link
JP (1) JPS5745406A (enrdf_load_stackoverflow)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59164973A (ja) * 1983-03-10 1984-09-18 Nippon Tsushin Gijutsu Kk ロボツト用ペア形計測ヘツド
JPS60149912A (ja) * 1984-01-17 1985-08-07 Kajima Corp トンネル断面測距装置
JPS61110008A (ja) * 1984-11-01 1986-05-28 ハネウェル・インコーポレーテッド リアルタイム3次元アクテイブビジヨンセンサ装置
JPS61197504U (enrdf_load_stackoverflow) * 1985-05-30 1986-12-10
JPS6228613A (ja) * 1985-07-30 1987-02-06 Agency Of Ind Science & Technol 3次元位置入力装置
JPH01311206A (ja) * 1988-03-18 1989-12-15 General Electric Co <Ge> 複数チャネル光学式飛点三角測量型距離測定装置
JP2005140510A (ja) * 2003-11-04 2005-06-02 Toyonaka Kenkyusho:Kk 遠距離対象物の変位測定方法と遠距離対象物の変位測定装置
CN104024797A (zh) * 2011-12-06 2014-09-03 赫克斯冈技术中心 用于确定对象的3d坐标的方法和装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS571905A (en) * 1980-05-02 1982-01-07 Jii Doreifuasu Maaku Contour measuring system

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS571905A (en) * 1980-05-02 1982-01-07 Jii Doreifuasu Maaku Contour measuring system

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59164973A (ja) * 1983-03-10 1984-09-18 Nippon Tsushin Gijutsu Kk ロボツト用ペア形計測ヘツド
JPS60149912A (ja) * 1984-01-17 1985-08-07 Kajima Corp トンネル断面測距装置
JPS61110008A (ja) * 1984-11-01 1986-05-28 ハネウェル・インコーポレーテッド リアルタイム3次元アクテイブビジヨンセンサ装置
JPS61197504U (enrdf_load_stackoverflow) * 1985-05-30 1986-12-10
JPS6228613A (ja) * 1985-07-30 1987-02-06 Agency Of Ind Science & Technol 3次元位置入力装置
JPH01311206A (ja) * 1988-03-18 1989-12-15 General Electric Co <Ge> 複数チャネル光学式飛点三角測量型距離測定装置
JP2005140510A (ja) * 2003-11-04 2005-06-02 Toyonaka Kenkyusho:Kk 遠距離対象物の変位測定方法と遠距離対象物の変位測定装置
CN104024797A (zh) * 2011-12-06 2014-09-03 赫克斯冈技术中心 用于确定对象的3d坐标的方法和装置
US9995567B2 (en) 2011-12-06 2018-06-12 Hexagon Technology Center Gmbh Method and device for determining 3D coordinates of an object

Also Published As

Publication number Publication date
JPS6341402B2 (enrdf_load_stackoverflow) 1988-08-17

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