JPS5739309A - Correction method for radiation thickness gage - Google Patents
Correction method for radiation thickness gageInfo
- Publication number
- JPS5739309A JPS5739309A JP11482880A JP11482880A JPS5739309A JP S5739309 A JPS5739309 A JP S5739309A JP 11482880 A JP11482880 A JP 11482880A JP 11482880 A JP11482880 A JP 11482880A JP S5739309 A JPS5739309 A JP S5739309A
- Authority
- JP
- Japan
- Prior art keywords
- thickness
- measured
- radiation
- thickness gage
- gage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE: To make the easy and simple determination of the correction amount necessary for the measured value of a radiation thickness gage by blanking a piece for correction from the central part in the width of a steel plate to be measured and measuring the thickness thereof with a micrometer and said thickness gage respectively.
CONSTITUTION: A piece for correction of a radiation thickness gage is blanked from an arbitrary position in the central part of the width of a steel plate to be measured, and the thickness thereof is measured with both of a micrometer and a radiation thickness gage. From the difference in the results of both measurements, the correction amount necessary for radiation measurement is determined. For example, in measuring the thickness of a steel plate 1 to be measured by the radiation thickness gage 2, beforehand a piece 3 for correction is blanked with blanking presses 4 and 5, and the thickness thereof is measured with a micrometer and a radiation thickness gage, and from the difference in the results of both measurement, the correction amount necessary for the measured results of the radiation thickness gage is determined, whereby the knowing of the accurate correction amount irrespectively of the kinds, thickness, etc. of the steel plate to be measured is made possible.
COPYRIGHT: (C)1982,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11482880A JPS5739309A (en) | 1980-08-22 | 1980-08-22 | Correction method for radiation thickness gage |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11482880A JPS5739309A (en) | 1980-08-22 | 1980-08-22 | Correction method for radiation thickness gage |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5739309A true JPS5739309A (en) | 1982-03-04 |
Family
ID=14647698
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11482880A Pending JPS5739309A (en) | 1980-08-22 | 1980-08-22 | Correction method for radiation thickness gage |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5739309A (en) |
-
1980
- 1980-08-22 JP JP11482880A patent/JPS5739309A/en active Pending
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