JPS5687810A - Preparation of reference board calibration of for radiation thickness meter - Google Patents
Preparation of reference board calibration of for radiation thickness meterInfo
- Publication number
- JPS5687810A JPS5687810A JP16478679A JP16478679A JPS5687810A JP S5687810 A JPS5687810 A JP S5687810A JP 16478679 A JP16478679 A JP 16478679A JP 16478679 A JP16478679 A JP 16478679A JP S5687810 A JPS5687810 A JP S5687810A
- Authority
- JP
- Japan
- Prior art keywords
- reference board
- calibration
- parent metal
- standard plate
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Abstract
PURPOSE: To obtain a highly accurate reference board for the calibration of a radiation thickness meter by comparing the measuring result obtained by placing a calibration standard plate at the measuring position of an object to be measured with the measuring result obtained by placing a calibration reference board at the reference board position.
CONSTITUTION: A calibration standard plate of a definite true value is placed at a measuring position A where an object 15 to be measured is to placed, and irradiated with X-rays from a generator 11 in order to measure the thickness value of the standard plate. Then, said standard plate is withdrawn from the X-ray passage. A parent metal to be a calibration reference board 14 is placed at a reference board position 13 where the calibration reference board 14 is to be placed, and irradiated with X-rays in order to measure the thickness value of the parent metal. The thickness values of said parent metal and the standard plate measured earlier are compared with each other. When there is a difference between them, a shutter 13 shuts off the X-ray passage and the parent metal is worked being placed at the reference board position as it is in order to regulate its thickness value. The reference board 14 is worked by filling cavities 21 in the parent metal 20 with a powdery filler 22 of the same quality as the parent metal.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16478679A JPS5687810A (en) | 1979-12-20 | 1979-12-20 | Preparation of reference board calibration of for radiation thickness meter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16478679A JPS5687810A (en) | 1979-12-20 | 1979-12-20 | Preparation of reference board calibration of for radiation thickness meter |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5687810A true JPS5687810A (en) | 1981-07-16 |
Family
ID=15799912
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16478679A Pending JPS5687810A (en) | 1979-12-20 | 1979-12-20 | Preparation of reference board calibration of for radiation thickness meter |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5687810A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59120416U (en) * | 1983-02-02 | 1984-08-14 | アルプス電気株式会社 | rotary encoder |
| US4704892A (en) * | 1985-01-07 | 1987-11-10 | Vasipari Kutato Es Fejleszto Vallalat | Control specimen for evaluation of non-destructive test results, artificial inclusions and process for producing control specimens |
-
1979
- 1979-12-20 JP JP16478679A patent/JPS5687810A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59120416U (en) * | 1983-02-02 | 1984-08-14 | アルプス電気株式会社 | rotary encoder |
| US4704892A (en) * | 1985-01-07 | 1987-11-10 | Vasipari Kutato Es Fejleszto Vallalat | Control specimen for evaluation of non-destructive test results, artificial inclusions and process for producing control specimens |
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