JPS5734403A - Inspecting device for shape and defect of linear object - Google Patents

Inspecting device for shape and defect of linear object

Info

Publication number
JPS5734403A
JPS5734403A JP10945480A JP10945480A JPS5734403A JP S5734403 A JPS5734403 A JP S5734403A JP 10945480 A JP10945480 A JP 10945480A JP 10945480 A JP10945480 A JP 10945480A JP S5734403 A JPS5734403 A JP S5734403A
Authority
JP
Japan
Prior art keywords
light
slit
mask
inspected
defects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10945480A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6312241B2 (enrdf_load_stackoverflow
Inventor
Yasuo Nakagawa
Hiroshi Makihira
Nobuyuki Akiyama
Noboru Haginome
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Cable Ltd
Original Assignee
Hitachi Cable Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Cable Ltd filed Critical Hitachi Cable Ltd
Priority to JP10945480A priority Critical patent/JPS5734403A/ja
Publication of JPS5734403A publication Critical patent/JPS5734403A/ja
Publication of JPS6312241B2 publication Critical patent/JPS6312241B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP10945480A 1980-08-09 1980-08-09 Inspecting device for shape and defect of linear object Granted JPS5734403A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10945480A JPS5734403A (en) 1980-08-09 1980-08-09 Inspecting device for shape and defect of linear object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10945480A JPS5734403A (en) 1980-08-09 1980-08-09 Inspecting device for shape and defect of linear object

Publications (2)

Publication Number Publication Date
JPS5734403A true JPS5734403A (en) 1982-02-24
JPS6312241B2 JPS6312241B2 (enrdf_load_stackoverflow) 1988-03-18

Family

ID=14510639

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10945480A Granted JPS5734403A (en) 1980-08-09 1980-08-09 Inspecting device for shape and defect of linear object

Country Status (1)

Country Link
JP (1) JPS5734403A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61110714U (enrdf_load_stackoverflow) * 1984-12-26 1986-07-14
JPS62249005A (ja) * 1986-04-22 1987-10-30 Bridgestone Corp 物体の形状異常検査装置
AU606679B2 (en) * 1987-03-09 1991-02-14 Battelle Memorial Institute Optical inspection system for cylindrical objects
CN104297439A (zh) * 2014-10-21 2015-01-21 南京农业大学 一种基于计算机视觉的双黄鸭蛋自动识别检测方法
CN105445285A (zh) * 2014-09-26 2016-03-30 宝山钢铁股份有限公司 用于无张力约束下线材视觉检测装置及方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5198298B2 (ja) * 2009-01-20 2013-05-15 三菱電線工業株式会社 突起付長尺体測定方法

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61110714U (enrdf_load_stackoverflow) * 1984-12-26 1986-07-14
JPS62249005A (ja) * 1986-04-22 1987-10-30 Bridgestone Corp 物体の形状異常検査装置
AU606679B2 (en) * 1987-03-09 1991-02-14 Battelle Memorial Institute Optical inspection system for cylindrical objects
CN105445285A (zh) * 2014-09-26 2016-03-30 宝山钢铁股份有限公司 用于无张力约束下线材视觉检测装置及方法
CN104297439A (zh) * 2014-10-21 2015-01-21 南京农业大学 一种基于计算机视觉的双黄鸭蛋自动识别检测方法
CN104297439B (zh) * 2014-10-21 2019-09-13 南京农业大学 一种基于计算机视觉的双黄鸭蛋自动识别检测方法

Also Published As

Publication number Publication date
JPS6312241B2 (enrdf_load_stackoverflow) 1988-03-18

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