JPS5723844A - Method and apparatus for measuring light scattering removed of influence of unnecessary scattered light in solution - Google Patents

Method and apparatus for measuring light scattering removed of influence of unnecessary scattered light in solution

Info

Publication number
JPS5723844A
JPS5723844A JP9919180A JP9919180A JPS5723844A JP S5723844 A JPS5723844 A JP S5723844A JP 9919180 A JP9919180 A JP 9919180A JP 9919180 A JP9919180 A JP 9919180A JP S5723844 A JPS5723844 A JP S5723844A
Authority
JP
Japan
Prior art keywords
light
scattered light
output
detector
cpu14
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9919180A
Other languages
Japanese (ja)
Inventor
Yasuhiro Tsuji
Kiyoshige Wakabayashi
Mitsuo Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chugai Pharmaceutical Co Ltd
Original Assignee
Chugai Pharmaceutical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chugai Pharmaceutical Co Ltd filed Critical Chugai Pharmaceutical Co Ltd
Priority to JP9919180A priority Critical patent/JPS5723844A/en
Publication of JPS5723844A publication Critical patent/JPS5723844A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To eliminate scattered light due to dust and air bubble and to measure an original scattered light of the material to be inspected, by providing a detector on different places independently of the detector detecting the original scattered light of the material to be inspected. CONSTITUTION:Laser light emitted from a laser light source 1 is entered to a sample cuvette 2 and scattered light from the cuvette 2 is made incident to a light detector 6 through visual field angle determination slit boards 4, 5 and a lens 3 and then photoelectric conversion is executed. On the one hand, an output of a photodetector 7 for monitor provided on a secondary light axis Q in the direction of right angles with respect to a main light axis P of the source 1, is inputted to a comparator 12 and only when this output is smaller than a reference voltage Vref, the output of a A/D converter 11 is taken in a memory of CPU14. Further, an operational processing output of a CPU14 is supplied to a buzzar 17, a recorder 18, a cathode-ray tube 19. Hereby, measured value due to the scattered light other than the signal light from the data obtained within a photometric time can be eliminated.
JP9919180A 1980-07-19 1980-07-19 Method and apparatus for measuring light scattering removed of influence of unnecessary scattered light in solution Pending JPS5723844A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9919180A JPS5723844A (en) 1980-07-19 1980-07-19 Method and apparatus for measuring light scattering removed of influence of unnecessary scattered light in solution

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9919180A JPS5723844A (en) 1980-07-19 1980-07-19 Method and apparatus for measuring light scattering removed of influence of unnecessary scattered light in solution

Publications (1)

Publication Number Publication Date
JPS5723844A true JPS5723844A (en) 1982-02-08

Family

ID=14240749

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9919180A Pending JPS5723844A (en) 1980-07-19 1980-07-19 Method and apparatus for measuring light scattering removed of influence of unnecessary scattered light in solution

Country Status (1)

Country Link
JP (1) JPS5723844A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016136464A1 (en) * 2015-02-27 2016-09-01 株式会社 日立ハイテクノロジーズ Analysis device and analysis method using same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016136464A1 (en) * 2015-02-27 2016-09-01 株式会社 日立ハイテクノロジーズ Analysis device and analysis method using same
JPWO2016136464A1 (en) * 2015-02-27 2017-12-21 株式会社日立ハイテクノロジーズ Analysis apparatus and analysis method thereof

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