JPS5729922A - Measuring device for refractive characteristic of optical system - Google Patents

Measuring device for refractive characteristic of optical system

Info

Publication number
JPS5729922A
JPS5729922A JP10551280A JP10551280A JPS5729922A JP S5729922 A JPS5729922 A JP S5729922A JP 10551280 A JP10551280 A JP 10551280A JP 10551280 A JP10551280 A JP 10551280A JP S5729922 A JPS5729922 A JP S5729922A
Authority
JP
Japan
Prior art keywords
linear
detected
mask
lens
port
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10551280A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0124251B2 (enrdf_load_stackoverflow
Inventor
Hiroshi Tamaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Optical Co Ltd
Original Assignee
Tokyo Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Optical Co Ltd filed Critical Tokyo Optical Co Ltd
Priority to JP10551280A priority Critical patent/JPS5729922A/ja
Publication of JPS5729922A publication Critical patent/JPS5729922A/ja
Publication of JPH0124251B2 publication Critical patent/JPH0124251B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0228—Testing optical properties by measuring refractive power

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Eyeglasses (AREA)
JP10551280A 1980-07-31 1980-07-31 Measuring device for refractive characteristic of optical system Granted JPS5729922A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10551280A JPS5729922A (en) 1980-07-31 1980-07-31 Measuring device for refractive characteristic of optical system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10551280A JPS5729922A (en) 1980-07-31 1980-07-31 Measuring device for refractive characteristic of optical system

Publications (2)

Publication Number Publication Date
JPS5729922A true JPS5729922A (en) 1982-02-18
JPH0124251B2 JPH0124251B2 (enrdf_load_stackoverflow) 1989-05-10

Family

ID=14409646

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10551280A Granted JPS5729922A (en) 1980-07-31 1980-07-31 Measuring device for refractive characteristic of optical system

Country Status (1)

Country Link
JP (1) JPS5729922A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58130440A (ja) * 1982-01-29 1983-08-03 Seiko Epson Corp 磁気デイスク
JPS5927237A (ja) * 1982-08-06 1984-02-13 Nippon Kogaku Kk <Nikon> 光学系の検査装置
JPS5928639A (ja) * 1982-08-10 1984-02-15 Tokyo Optical Co Ltd レンズメ−タ−及びレンズメ−タ−用タ−ゲツト板
JPS5928640A (ja) * 1982-08-10 1984-02-15 Tokyo Optical Co Ltd レンズメ−タ−及びそれに使用されるタ−ゲツト板
JPS6091241A (ja) * 1983-10-26 1985-05-22 Matsushita Electric Ind Co Ltd 薄膜の屈折率測定装置

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58130440A (ja) * 1982-01-29 1983-08-03 Seiko Epson Corp 磁気デイスク
JPS5927237A (ja) * 1982-08-06 1984-02-13 Nippon Kogaku Kk <Nikon> 光学系の検査装置
JPS5928639A (ja) * 1982-08-10 1984-02-15 Tokyo Optical Co Ltd レンズメ−タ−及びレンズメ−タ−用タ−ゲツト板
JPS5928640A (ja) * 1982-08-10 1984-02-15 Tokyo Optical Co Ltd レンズメ−タ−及びそれに使用されるタ−ゲツト板
JPS6091241A (ja) * 1983-10-26 1985-05-22 Matsushita Electric Ind Co Ltd 薄膜の屈折率測定装置

Also Published As

Publication number Publication date
JPH0124251B2 (enrdf_load_stackoverflow) 1989-05-10

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