JPS57211049A - Measuring method for quantity of vaporized gas in storage vessel of low temperature liquid - Google Patents
Measuring method for quantity of vaporized gas in storage vessel of low temperature liquidInfo
- Publication number
- JPS57211049A JPS57211049A JP9612181A JP9612181A JPS57211049A JP S57211049 A JPS57211049 A JP S57211049A JP 9612181 A JP9612181 A JP 9612181A JP 9612181 A JP9612181 A JP 9612181A JP S57211049 A JPS57211049 A JP S57211049A
- Authority
- JP
- Japan
- Prior art keywords
- liquid
- vaporized
- low temperature
- measuring
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
PURPOSE:To measure vaporized quantity of stored low temperature liquid simply, by keeping the inner pressure of a low temperature tank higher than saturated vapor pressure of said liquid for a controlled time and measuring a rate of temperature elevation of said liquid during that time. CONSTITUTION:The inner pressure of a tank is maintaied under the pressure Po higher than the saturated vapor pressure of stored liquid from the initial conditions of an inner pressure Ps, a temperature of a liquid layer T and the liquid face W at the normal time in a low temperature tank. Next, a term not having a loss of weight DELTAW of the liquid face of the tank is presumed as a measuring term of vaporized quantity X and a rate of a rise in temperature DELTAT of this term X is measured. An invasion quantity of heat (q) is found by an expression q=CXTXW by using this rate DELTAT, the quantity of stored liquid W and a specific heat of liquefied gas C. Further, a vaporized quantity beta is found by an expression L=qX100/WXL by using latent heat of the liquefied gas L. Hereby, the quantity of vaporized gas is measured only by measuring a portion of the rise in temperature of the stored liquid without measuring the quantity of the vaporized gas directly.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9612181A JPS57211049A (en) | 1981-06-22 | 1981-06-22 | Measuring method for quantity of vaporized gas in storage vessel of low temperature liquid |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9612181A JPS57211049A (en) | 1981-06-22 | 1981-06-22 | Measuring method for quantity of vaporized gas in storage vessel of low temperature liquid |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS57211049A true JPS57211049A (en) | 1982-12-24 |
Family
ID=14156543
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9612181A Pending JPS57211049A (en) | 1981-06-22 | 1981-06-22 | Measuring method for quantity of vaporized gas in storage vessel of low temperature liquid |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57211049A (en) |
-
1981
- 1981-06-22 JP JP9612181A patent/JPS57211049A/en active Pending
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