JPS57206809A - Detecting method for diameter of single crystal and minute crystal - Google Patents

Detecting method for diameter of single crystal and minute crystal

Info

Publication number
JPS57206809A
JPS57206809A JP9080281A JP9080281A JPS57206809A JP S57206809 A JPS57206809 A JP S57206809A JP 9080281 A JP9080281 A JP 9080281A JP 9080281 A JP9080281 A JP 9080281A JP S57206809 A JPS57206809 A JP S57206809A
Authority
JP
Japan
Prior art keywords
crystal
pulling
length
diameter
weight
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9080281A
Other languages
English (en)
Japanese (ja)
Other versions
JPH034516B2 (OSRAM
Inventor
Hideshi Kubota
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTT Inc
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP9080281A priority Critical patent/JPS57206809A/ja
Publication of JPS57206809A publication Critical patent/JPS57206809A/ja
Publication of JPH034516B2 publication Critical patent/JPH034516B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/10—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring diameters
    • G01B21/12—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring diameters of objects while moving

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
JP9080281A 1981-06-15 1981-06-15 Detecting method for diameter of single crystal and minute crystal Granted JPS57206809A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9080281A JPS57206809A (en) 1981-06-15 1981-06-15 Detecting method for diameter of single crystal and minute crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9080281A JPS57206809A (en) 1981-06-15 1981-06-15 Detecting method for diameter of single crystal and minute crystal

Publications (2)

Publication Number Publication Date
JPS57206809A true JPS57206809A (en) 1982-12-18
JPH034516B2 JPH034516B2 (OSRAM) 1991-01-23

Family

ID=14008714

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9080281A Granted JPS57206809A (en) 1981-06-15 1981-06-15 Detecting method for diameter of single crystal and minute crystal

Country Status (1)

Country Link
JP (1) JPS57206809A (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008184362A (ja) * 2007-01-30 2008-08-14 Covalent Materials Corp 単結晶の製造方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5221471A (en) * 1975-08-11 1977-02-18 Toshiaki Inui Blind fabric by warp knitting and method of producing same
JPS52104474A (en) * 1976-02-28 1977-09-01 Fujitsu Ltd Control method for crystal growth

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5221471A (en) * 1975-08-11 1977-02-18 Toshiaki Inui Blind fabric by warp knitting and method of producing same
JPS52104474A (en) * 1976-02-28 1977-09-01 Fujitsu Ltd Control method for crystal growth

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008184362A (ja) * 2007-01-30 2008-08-14 Covalent Materials Corp 単結晶の製造方法

Also Published As

Publication number Publication date
JPH034516B2 (OSRAM) 1991-01-23

Similar Documents

Publication Publication Date Title
JPS6424089A (en) Device for adjusting initial position of melt surface
EP0315572A3 (en) Apparatus for measuring the diameter of a crystal
JPS57206809A (en) Detecting method for diameter of single crystal and minute crystal
JPS5639542A (en) Stationary developing method with automatic developing apparatus
JPS6413000A (en) Gravity compensator
JPS5556515A (en) Detecting device for supplying quantity of refuse in incinerating furnace
EP0286193A3 (en) Apparatus for measuring the heat contents of a tank filled with liquid
JPS55130895A (en) Single crystal preparing method and apparatus therefor
JPS56164098A (en) Preparation of single crystal
JPS57179095A (en) Method and apparatus for manufacturing single crystal
JPS5231782A (en) Method of measuring quantity of cold or eat accumulated
JPS5692432A (en) Method and device for detection of boundary face between liquid and sludgy precipitate
JPS57194305A (en) Method and device for controlling thickness measurement of fiber assembly
JPS5548145A (en) Inertia compensating controller
JPS5375177A (en) Detecting system of crystal melting
JPS6469591A (en) Method for measurement and control of molten liquid level in crystal producing device and apparatus therefor
JPS54130169A (en) Calibrator for flow velocity measuring device of high temperature fluid
JPS5318408A (en) Measuring method for thickness, angle and dropping velocity of burden layers in reduction smelting furnace
JPS57175794A (en) Automatic controlling method for diameter of single crystal
JPS6469590A (en) Method for measurement and control of crystal diameter in crystal producing device and apparatus therefor
JPS56125296A (en) Temperature measurment for crystal growth
JPS56145312A (en) Method of continuous measurement for radiation thickness gage
JPS6438630A (en) Apparatus controlling temperature of constant temperature bath of measuring apparatus of viscosity
JPS55145110A (en) Measuring method for raw material charging time in charging apparatus of belless blast furnace
JPS55151227A (en) Crucible for measuring metal solidifying point