JPS57203953A - Ultrasonic flaw detector - Google Patents

Ultrasonic flaw detector

Info

Publication number
JPS57203953A
JPS57203953A JP56088196A JP8819681A JPS57203953A JP S57203953 A JPS57203953 A JP S57203953A JP 56088196 A JP56088196 A JP 56088196A JP 8819681 A JP8819681 A JP 8819681A JP S57203953 A JPS57203953 A JP S57203953A
Authority
JP
Japan
Prior art keywords
probe
refraction angle
memory
inspected
coordinates
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56088196A
Other languages
Japanese (ja)
Other versions
JPH0213265B2 (en
Inventor
Shoichi Naito
Itsuo Yamamoto
Iwao Kuroda
Akisuke Naruse
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Engineering Co Ltd
Hitachi Ltd
Original Assignee
Hitachi Engineering Co Ltd
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Engineering Co Ltd, Hitachi Ltd filed Critical Hitachi Engineering Co Ltd
Priority to JP56088196A priority Critical patent/JPS57203953A/en
Publication of JPS57203953A publication Critical patent/JPS57203953A/en
Publication of JPH0213265B2 publication Critical patent/JPH0213265B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • G01N29/11Analysing solids by measuring attenuation of acoustic waves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • G01N29/24Probes
    • G01N29/2487Directing probes, e.g. angle probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/02Indexing codes associated with the analysed material
    • G01N2291/028Material parameters
    • G01N2291/02854Length, thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/04Wave modes and trajectories
    • G01N2291/044Internal reflections (echoes), e.g. on walls or defects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/04Wave modes and trajectories
    • G01N2291/056Angular incidence, angular propagation

Abstract

PURPOSE:To conduct more accurate evaluation by taking the refraction angle of a probe employed for real flaw detection from the data of compensation of an apparent refraction angle in relation to the thickness of a body to be inspected, and by calculating the coordinates of a reflecting body based on the refraction angle of the probe. CONSTITUTION:A reflection pulse train from a flaw detector 1 passes through an echo digitizing circuit 5 and is stored in a data memory 6 together with the position of a probe detected by a position detector 4. In the memory 6 are inputted from the outside the refraction angle theta of the probe 2, the thickness Hi of a body 3 to be inspected, a compensation data group TB and the range W of beam distance length wherein the coordinates of a reflecting body are found on the basis of a the nominal refraction angle theta. An operational processor 7, extracting sequentially the content of the memory 6, executes computation. In the memory 6, the position of the probe, and a value of a reflection echo and a time of propagation obtained at that time, are arranged sequentially.
JP56088196A 1981-06-10 1981-06-10 Ultrasonic flaw detector Granted JPS57203953A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56088196A JPS57203953A (en) 1981-06-10 1981-06-10 Ultrasonic flaw detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56088196A JPS57203953A (en) 1981-06-10 1981-06-10 Ultrasonic flaw detector

Publications (2)

Publication Number Publication Date
JPS57203953A true JPS57203953A (en) 1982-12-14
JPH0213265B2 JPH0213265B2 (en) 1990-04-03

Family

ID=13936139

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56088196A Granted JPS57203953A (en) 1981-06-10 1981-06-10 Ultrasonic flaw detector

Country Status (1)

Country Link
JP (1) JPS57203953A (en)

Also Published As

Publication number Publication date
JPH0213265B2 (en) 1990-04-03

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