JPS57184956A - Inspecting device of surface defect - Google Patents

Inspecting device of surface defect

Info

Publication number
JPS57184956A
JPS57184956A JP6916381A JP6916381A JPS57184956A JP S57184956 A JPS57184956 A JP S57184956A JP 6916381 A JP6916381 A JP 6916381A JP 6916381 A JP6916381 A JP 6916381A JP S57184956 A JPS57184956 A JP S57184956A
Authority
JP
Japan
Prior art keywords
signal
inspected
flaws
video signal
crack
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6916381A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6349180B2 (enrdf_load_stackoverflow
Inventor
Seikichi Nishimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP6916381A priority Critical patent/JPS57184956A/ja
Publication of JPS57184956A publication Critical patent/JPS57184956A/ja
Publication of JPS6349180B2 publication Critical patent/JPS6349180B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP6916381A 1981-05-08 1981-05-08 Inspecting device of surface defect Granted JPS57184956A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6916381A JPS57184956A (en) 1981-05-08 1981-05-08 Inspecting device of surface defect

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6916381A JPS57184956A (en) 1981-05-08 1981-05-08 Inspecting device of surface defect

Publications (2)

Publication Number Publication Date
JPS57184956A true JPS57184956A (en) 1982-11-13
JPS6349180B2 JPS6349180B2 (enrdf_load_stackoverflow) 1988-10-03

Family

ID=13394757

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6916381A Granted JPS57184956A (en) 1981-05-08 1981-05-08 Inspecting device of surface defect

Country Status (1)

Country Link
JP (1) JPS57184956A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59180345A (ja) * 1983-03-31 1984-10-13 Toshiba Corp 表面検査装置
JPS61277040A (ja) * 1985-05-31 1986-12-08 Nippon Hoso Kyokai <Nhk> テ−プ状記録体の検査装置
JPH0412257A (ja) * 1990-04-27 1992-01-16 Kawasaki Steel Corp 鋼板の線状疵の検出方法及びその装置
JP2019158857A (ja) * 2018-03-09 2019-09-19 Ｊｆｅスチール株式会社 金属帯表面の幅方向線状模様欠陥の検査方法及び検査装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59180345A (ja) * 1983-03-31 1984-10-13 Toshiba Corp 表面検査装置
JPS61277040A (ja) * 1985-05-31 1986-12-08 Nippon Hoso Kyokai <Nhk> テ−プ状記録体の検査装置
JPH0412257A (ja) * 1990-04-27 1992-01-16 Kawasaki Steel Corp 鋼板の線状疵の検出方法及びその装置
JP2019158857A (ja) * 2018-03-09 2019-09-19 Ｊｆｅスチール株式会社 金属帯表面の幅方向線状模様欠陥の検査方法及び検査装置

Also Published As

Publication number Publication date
JPS6349180B2 (enrdf_load_stackoverflow) 1988-10-03

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