JPS57183056A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS57183056A JPS57183056A JP6956481A JP6956481A JPS57183056A JP S57183056 A JPS57183056 A JP S57183056A JP 6956481 A JP6956481 A JP 6956481A JP 6956481 A JP6956481 A JP 6956481A JP S57183056 A JPS57183056 A JP S57183056A
- Authority
- JP
- Japan
- Prior art keywords
- wiring
- forming
- concentration
- implanted
- generated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
PURPOSE:To eliminate the whiskers generated in case of forming the wiring preventing the wirings from shortcircuiting by a method wherein, when the Al wiring with the high purity is formed on the semiconductor wafer including the device, the impurity ion such as Ar, P, As, Sb and the like is implanted immediately after forming the wiring with the concentration upon the wiring exceeding 5%. CONSTITUTION:The SiO2 film 11 is formed on the Si wafer 10 with the PN joint and said film 11 is coated with the Al metallic wiring 12 with the density of 6.02X10<22>/cm<2> by means of the sputtering. Then the impurity ion such as P<+>, As<+> and the like with the concentration exceeding 5% is implanted in said metallic wiring 12 to the whisker generated inside the wiring 12 in case of forming the wiring 12. Through these procedures, both the density of said wiring 12 and the concentration of the implanted ion are specified to remove the whiskers to be generated. Consequently the shortcircuit between the wirings may be prevented improving the yield and the reliability of the device.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6956481A JPS57183056A (en) | 1981-05-06 | 1981-05-06 | Semiconductor device |
DE19823217026 DE3217026A1 (en) | 1981-05-06 | 1982-05-06 | Semiconductor device |
US06/717,597 US4899206A (en) | 1981-05-06 | 1985-04-01 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6956481A JPS57183056A (en) | 1981-05-06 | 1981-05-06 | Semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57183056A true JPS57183056A (en) | 1982-11-11 |
Family
ID=13406381
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6956481A Pending JPS57183056A (en) | 1981-05-06 | 1981-05-06 | Semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57183056A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59188120A (en) * | 1983-03-12 | 1984-10-25 | Ricoh Co Ltd | Forming method for thin film |
US5040048A (en) * | 1988-10-25 | 1991-08-13 | Mitsubishi Denki Kabushiki Kaisha | Metal interconnection layer having reduced hillock formation |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55158649A (en) * | 1979-05-30 | 1980-12-10 | Fujitsu Ltd | Manufacture of electrode wiring |
-
1981
- 1981-05-06 JP JP6956481A patent/JPS57183056A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55158649A (en) * | 1979-05-30 | 1980-12-10 | Fujitsu Ltd | Manufacture of electrode wiring |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59188120A (en) * | 1983-03-12 | 1984-10-25 | Ricoh Co Ltd | Forming method for thin film |
US5040048A (en) * | 1988-10-25 | 1991-08-13 | Mitsubishi Denki Kabushiki Kaisha | Metal interconnection layer having reduced hillock formation |
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