JPS57176016A - Ultrasonic microscope - Google Patents

Ultrasonic microscope

Info

Publication number
JPS57176016A
JPS57176016A JP56059664A JP5966481A JPS57176016A JP S57176016 A JPS57176016 A JP S57176016A JP 56059664 A JP56059664 A JP 56059664A JP 5966481 A JP5966481 A JP 5966481A JP S57176016 A JPS57176016 A JP S57176016A
Authority
JP
Japan
Prior art keywords
sample
microscope
revolver
optical microscope
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56059664A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0427498B2 (enrdf_load_stackoverflow
Inventor
Koji Taguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp, Olympus Optical Co Ltd filed Critical Olympus Corp
Priority to JP56059664A priority Critical patent/JPS57176016A/ja
Publication of JPS57176016A publication Critical patent/JPS57176016A/ja
Publication of JPH0427498B2 publication Critical patent/JPH0427498B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Microscoopes, Condenser (AREA)
JP56059664A 1981-04-22 1981-04-22 Ultrasonic microscope Granted JPS57176016A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56059664A JPS57176016A (en) 1981-04-22 1981-04-22 Ultrasonic microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56059664A JPS57176016A (en) 1981-04-22 1981-04-22 Ultrasonic microscope

Publications (2)

Publication Number Publication Date
JPS57176016A true JPS57176016A (en) 1982-10-29
JPH0427498B2 JPH0427498B2 (enrdf_load_stackoverflow) 1992-05-12

Family

ID=13119684

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56059664A Granted JPS57176016A (en) 1981-04-22 1981-04-22 Ultrasonic microscope

Country Status (1)

Country Link
JP (1) JPS57176016A (enrdf_load_stackoverflow)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6093411A (ja) * 1983-09-30 1985-05-25 ライカ　インドゥストリーフェルヴァルツング　ゲゼルシャフト　ミット　ベシュレンクテル　ハフツング 互に相補的な若干の顕微鏡的試験を実施するための方法および装置
US4614410A (en) * 1983-09-28 1986-09-30 Hitachi, Ltd. Ultrasonic microscope with optical microscope incorporated therein
JP2004535600A (ja) * 2001-07-19 2004-11-25 カール ツアイス マイクロエレクトロニック システムズ ゲゼルシャフト ミット ベシュレンクテル ハフツング 顕微鏡対物レンズおよびこの顕微鏡対物レンズの顕微鏡における使用
WO2012023255A1 (en) * 2010-08-18 2012-02-23 Canon Kabushiki Kaisha Microscope
JP2012123416A (ja) * 2012-03-12 2012-06-28 Canon Inc 対象物の処理方法
EP3805752A1 (en) * 2019-10-07 2021-04-14 The Boeing Company Multi-probe non-destructive inspection system

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4614410A (en) * 1983-09-28 1986-09-30 Hitachi, Ltd. Ultrasonic microscope with optical microscope incorporated therein
JPS6093411A (ja) * 1983-09-30 1985-05-25 ライカ　インドゥストリーフェルヴァルツング　ゲゼルシャフト　ミット　ベシュレンクテル　ハフツング 互に相補的な若干の顕微鏡的試験を実施するための方法および装置
JP2004535600A (ja) * 2001-07-19 2004-11-25 カール ツアイス マイクロエレクトロニック システムズ ゲゼルシャフト ミット ベシュレンクテル ハフツング 顕微鏡対物レンズおよびこの顕微鏡対物レンズの顕微鏡における使用
WO2012023255A1 (en) * 2010-08-18 2012-02-23 Canon Kabushiki Kaisha Microscope
JP2012123416A (ja) * 2012-03-12 2012-06-28 Canon Inc 対象物の処理方法
EP3805752A1 (en) * 2019-10-07 2021-04-14 The Boeing Company Multi-probe non-destructive inspection system
US11187527B2 (en) 2019-10-07 2021-11-30 The Boeing Company Multi-probe non-destructive inspection system
US11781862B2 (en) 2019-10-07 2023-10-10 The Boeing Company Multi-probe non-destructive inspection system

Also Published As

Publication number Publication date
JPH0427498B2 (enrdf_load_stackoverflow) 1992-05-12

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